PROTON SCATTERING ANALYSIS SYSTEM
    1.
    发明申请
    PROTON SCATTERING ANALYSIS SYSTEM 有权
    原子散射分析系统

    公开(公告)号:US20160016010A1

    公开(公告)日:2016-01-21

    申请号:US14802879

    申请日:2015-07-17

    IPC分类号: A61N5/10

    摘要: Disclosed are systems and methods for characterizing interactions or proton beams in tissues. In certain embodiments, charged particles emitted during passage of protons, such as those used for therapeutic and/or imaging purposes, can be detected at relatively large angles. In situations where beam intensity is relatively low, such as in certain imaging applications, characterization of the proton beam with charged particles can provide sufficient statistics for meaningful results while avoiding the beam itself. In situations where beam intensity is relatively high, such as in certain therapeutic applications, characterization of the proton beam with scattered primary protons and secondary protons can provide information such as differences in densities encountered by the beam as it traverses the tissue and dose deposited along the beam path. In certain situations, such beam characterizations can facilitate more accurate planning and monitoring of proton-based therapy.

    摘要翻译: 公开了用于表征组织中的相互作用或质子束的系统和方法。 在某些实施方案中,可以以较大的角度检测在质子通过期间发射的带电粒子,例如用于治疗和/或成像目的的那些。 在光束强度相对较低的情况下,例如在某些成像应用中,具有带电粒子的质子束的表征可以提供足够的统计量来有意义的结果,同时避免光束本身。 在光束强度相对较高的情况下,例如在某些治疗应用中,具有散射的一级质子和二级质子的质子束的表征可以提供信息,例如当光束穿过组织时所遇到的密度差异以及沿着 光束路径。 在某些情况下,这种光束表征可以促进更准确地规划和监测基于质子的治疗。

    PROTON SCATTERING ANALYSIS SYSTEM
    2.
    发明申请
    PROTON SCATTERING ANALYSIS SYSTEM 有权
    原子散射分析系统

    公开(公告)号:US20140200448A1

    公开(公告)日:2014-07-17

    申请号:US14159259

    申请日:2014-01-20

    IPC分类号: A61N5/10 A61B6/00 G01N23/02

    摘要: Disclosed are systems and methods for characterizing interactions or proton beams in tissues. In certain embodiments, charged particles emitted during passage of protons, such as those used for therapeutic and/or imaging purposes, can be detected at relatively large angles. In situations where beam intensity is relatively low, such as in certain imaging applications, characterization of the proton beam with charged particles can provide sufficient statistics for meaningful results while avoiding the beam itself. In situations where beam intensity is relatively high, such as in certain therapeutic applications, characterization of the proton beam with scattered primary protons and secondary protons can provide information such as differences in densities encountered by the beam as it traverses the tissue and dose deposited along the beam path. In certain situations, such beam characterizations can facilitate more accurate planning and monitoring of proton-based therapy.

    摘要翻译: 公开了用于表征组织中的相互作用或质子束的系统和方法。 在某些实施方案中,可以以较大的角度检测在质子通过期间发射的带电粒子,例如用于治疗和/或成像目的的那些。 在光束强度相对较低的情况下,例如在某些成像应用中,具有带电粒子的质子束的表征可以提供足够的统计量来有意义的结果,同时避免光束本身。 在光束强度相对较高的情况下,例如在某些治疗应用中,具有散射的一级质子和二级质子的质子束的表征可以提供信息,例如当光束穿过组织时所遇到的密度差异以及沿着 光束路径。 在某些情况下,这种光束表征可以促进更准确地规划和监测基于质子的治疗。

    Proton scattering analysis system

    公开(公告)号:US09878180B2

    公开(公告)日:2018-01-30

    申请号:US14802879

    申请日:2015-07-17

    IPC分类号: A61N5/10 A61B6/00 G01N23/02

    摘要: Disclosed are systems and methods for characterizing interactions or proton beams in tissues. In certain embodiments, charged particles emitted during passage of protons, such as those used for therapeutic and/or imaging purposes, can be detected at relatively large angles. In situations where beam intensity is relatively low, such as in certain imaging applications, characterization of the proton beam with charged particles can provide sufficient statistics for meaningful results while avoiding the beam itself. In situations where beam intensity is relatively high, such as in certain therapeutic applications, characterization of the proton beam with scattered primary protons and secondary protons can provide information such as differences in densities encountered by the beam as it traverses the tissue and dose deposited along the beam path. In certain situations, such beam characterizations can facilitate more accurate planning and monitoring of proton-based therapy.

    Proton scattering analysis system
    5.
    发明授权
    Proton scattering analysis system 有权
    质子散射分析系统

    公开(公告)号:US09084887B2

    公开(公告)日:2015-07-21

    申请号:US14159259

    申请日:2014-01-20

    IPC分类号: A61N5/10 A61B6/00 G01N23/02

    摘要: Disclosed are systems and methods for characterizing interactions or proton beams in tissues. In certain embodiments, charged particles emitted during passage of protons, such as those used for therapeutic and/or imaging purposes, can be detected at relatively large angles. In situations where beam intensity is relatively low, such as in certain imaging applications, characterization of the proton beam with charged particles can provide sufficient statistics for meaningful results while avoiding the beam itself. In situations where beam intensity is relatively high, such as in certain therapeutic applications, characterization of the proton beam with scattered primary protons and secondary protons can provide information such as differences in densities encountered by the beam as it traverses the tissue and dose deposited along the beam path. In certain situations, such beam characterizations can facilitate more accurate planning and monitoring of proton-based therapy.

    摘要翻译: 公开了用于表征组织中的相互作用或质子束的系统和方法。 在某些实施方案中,可以以较大的角度检测在质子通过期间发射的带电粒子,例如用于治疗和/或成像目的的那些。 在光束强度相对较低的情况下,例如在某些成像应用中,具有带电粒子的质子束的表征可以提供足够的统计量来有意义的结果,同时避免光束本身。 在光束强度相对较高的情况下,例如在某些治疗应用中,具有散射的一级质子和二级质子的质子束的表征可以提供信息,例如当光束穿过组织时所遇到的密度差异以及沿着 光束路径。 在某些情况下,这种光束表征可以促进更准确地规划和监测基于质子的治疗。