Abstract:
A test pattern is encoded using a run length limited line encoding to produce an encoded block of data. The encoded block of data is sent via a channel. A plurality of bits in the received block of data that are subsequent to a maximum length run in the sent data is compared to an expected plurality of bits. A type of bit error is classified based on a mismatch between the expected plurality of bits and the plurality of bits in the received block of data.
Abstract:
A test pattern is encoded using a run length limited line encoding to produce an encoded block of data. The encoded block of data is sent via a channel. A plurality of bits in the received block of data that are subsequent to a maximum length run in the sent data is compared to an expected plurality of bits. A type of bit error is classified based on a mismatch between the expected plurality of bits and the plurality of bits in the received block of data.