公开(公告)号：US20110178752A1

公开(公告)日：2011-07-21

申请号：US13046171

申请日：2011-03-11

Applicant: Leonard Hayden

Inventor： Leonard Hayden

IPC: G06F19/00

CPC classification number: G01R27/32 ,  G01D18/00 ,  G01R35/005

Abstract: A method of compensating a calibration for a vector network analyzer includes performing calibrations on at least a pair of ports to determine error terms associated with each port wherein at least one of the error terms is based upon selecting the reactance of the load standard from a set of potential values in a manner such that the reference reactance errors are reduced.

Abstract translation: 补偿矢量网络分析仪的校准的方法包括在至少一对端口上执行校准以确定与每个端口相关联的误差项，其中至少一个误差项基于从一组中选择负载标准的电抗 的电位值，使得参考电抗误差减小。

公开(公告)号：US07908107B2

公开(公告)日：2011-03-15

申请号：US11879865

申请日：2007-07-18

Applicant: Leonard Hayden

Inventor： Leonard Hayden

IPC: G01R35/00

CPC classification number: G01R27/32 ,  G01D18/00 ,  G01R35/005

Abstract: A method of compensating a calibration for a vector network analyzer includes performing calibrations on at least a pair of ports to determine error terms associated with each port wherein at least one of the error terms is based upon selecting the reactance of the load standard from a set of potential values in a manner such that the reference reactance errors are reduced.

Abstract translation: 补偿矢量网络分析仪的校准的方法包括在至少一对端口上执行校准以确定与每个端口相关联的误差项，其中至少一个误差项基于从一组中选择负载标准的电抗 的电位值，使得参考电抗误差减小。

公开(公告)号：US07489149B2

公开(公告)日：2009-02-10

申请号：US11977280

申请日：2007-10-24

Applicant: K. Reed Gleason ,  Tim Lesher ,  Eric W. Strid ,  Mike Andrews ,  John Martin ,  John Dunklee ,  Leonard Hayden ,  Amr M. E. Safwat

Inventor： K. Reed Gleason ,  Tim Lesher ,  Eric W. Strid ,  Mike Andrews ,  John Martin ,  John Dunklee ,  Leonard Hayden ,  Amr M. E. Safwat

IPC: G01R11/67

CPC classification number: G01R1/06772 ,  G01R1/06711 ,  G01R1/06755 ,  G01R1/06777

Abstract: A probe for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies may include a dielectric substrate that supports a signal path interconnecting test instrumentation and a probe tip and a ground path that shields both the signal oath and the probe tip.

Abstract translation: 用于测量高频下的集成电路或其他微电子器件的电特性的探针可以包括支持互连测试仪器的信号路径的电介质基底，以及屏蔽信号誓言和探针尖端的探针尖端和接地路径。

公开(公告)号：US20080042673A1

公开(公告)日：2008-02-21

申请号：US11975937

申请日：2007-10-22

Applicant: Leonard Hayden ,  Scott Rumbaugh ,  Mike Andrews

Inventor： Leonard Hayden ,  Scott Rumbaugh ,  Mike Andrews

IPC: G01R31/02

CPC classification number: G01R1/06766 ,  G01R1/06738 ,  G01R1/06772

Abstract: A direct current and a modulation signal are simultaneously applied to contact pads on a device under test, such as a laser diode, with a probe that reduces signal distortion and power dissipation by transmitting a modulated signal through an impedance matching resistor and transmitting of a direct current over a second signal path that avoids the impedance matching resistor.

公开(公告)号：US20070200580A1

公开(公告)日：2007-08-30

申请号：US11796237

申请日：2007-04-26

Applicant: Leonard Hayden ,  John Martin ,  Mike Andrews

Inventor： Leonard Hayden ,  John Martin ,  Mike Andrews

IPC: G01R31/00

CPC classification number: G01R1/06772 ,  G01R1/07342 ,  Y10T29/49121 ,  Y10T29/49147 ,  Y10T29/49204 ,  Y10T29/49208

Abstract: The present invention relates to a probe for testing of integrated circuits or other microelectronic devices.

Abstract translation: 本发明涉及一种用于集成电路或其他微电子器件测试的探针。

公开(公告)号：US20070159196A1

公开(公告)日：2007-07-12

申请号：US11714003

申请日：2007-03-05

Applicant: Leonard Hayden ,  Scott Rumbaugh ,  Mike Andrews

Inventor： Leonard Hayden ,  Scott Rumbaugh ,  Mike Andrews

IPC: G01R31/02

CPC classification number: G01R1/06766 ,  G01R1/06738 ,  G01R1/06772

Abstract: A direct current and a modulation signal are simultaneously applied to contact pads on a device under test, such as a laser diode, with a probe that reduces signal distortion and power dissipation by transmitting a modulated signal through an impedance matching resistor and transmitting of a direct current over a second signal path that avoids the impedance matching resistor.

公开(公告)号：US07518387B2

公开(公告)日：2009-04-14

申请号：US11906055

申请日：2007-09-27

Applicant: K. Reed Gleason ,  Tim Lesher ,  Eric W. Strid ,  Mike Andrews ,  John Martin ,  John Dunklee ,  Leonard Hayden ,  Amr M. E. Safwat

Inventor： K. Reed Gleason ,  Tim Lesher ,  Eric W. Strid ,  Mike Andrews ,  John Martin ,  John Dunklee ,  Leonard Hayden ,  Amr M. E. Safwat

IPC: G01R31/02

CPC classification number: G01R1/06772 ,  G01R1/06711 ,  G01R1/06755 ,  G01R1/06777

Abstract: A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.

Abstract translation: 用于测量高频集成电路或其他微电子器件的电气特性的探针测量系统。

公开(公告)号：US07436194B2

公开(公告)日：2008-10-14

申请号：US11977324

申请日：2007-10-24

Applicant: K. Reed Gleason ,  Tim Lesher ,  Eric W. Strid ,  Mike Andrews ,  John Martin ,  John Dunklee ,  Leonard Hayden ,  Amr M. E. Safwat

Inventor： K. Reed Gleason ,  Tim Lesher ,  Eric W. Strid ,  Mike Andrews ,  John Martin ,  John Dunklee ,  Leonard Hayden ,  Amr M. E. Safwat

IPC: G01R31/00

CPC classification number: G01R1/06772 ,  G01R1/06711 ,  G01R1/06755 ,  G01R1/06777

Abstract: A probe measurement system having low, stable contact resistance for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.

Abstract translation: 探针测量系统具有低稳定的接触电阻，用于测量集成电路或其他微电子器件在高频下的电气特性。

公开(公告)号：US20080042678A1

公开(公告)日：2008-02-21

申请号：US11975176

申请日：2007-10-18

Applicant: Leonard Hayden ,  John Martin ,  Mike Andrews

Inventor： Leonard Hayden ,  John Martin ,  Mike Andrews

IPC: G01R31/26

CPC classification number: G01R1/06772 ,  G01R1/07342 ,  Y10T29/49121 ,  Y10T29/49147 ,  Y10T29/49204 ,  Y10T29/49208

Abstract: The present invention relates to a probe for testing of integrated circuits or other microelectronic devices.

公开(公告)号：US20080024149A1

公开(公告)日：2008-01-31

申请号：US11906055

申请日：2007-09-27

Applicant: K. Gleason ,  Tim Lesher ,  Eric Strid ,  Mike Andrews ,  John Martin ,  John Dunklee ,  Leonard Hayden ,  Amr Safwat

Inventor： K. Gleason ,  Tim Lesher ,  Eric Strid ,  Mike Andrews ,  John Martin ,  John Dunklee ,  Leonard Hayden ,  Amr Safwat

IPC: G01R1/067

CPC classification number: G01R1/06772 ,  G01R1/06711 ,  G01R1/06755 ,  G01R1/06777

Abstract: A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.