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公开(公告)号:US12004351B2
公开(公告)日:2024-06-04
申请号:US17869732
申请日:2022-07-20
发明人: S. M. Istiaque Hossain , Prakash Rau Mokhna Rau , Arun Kumar Dhayalan , Damir Fazil , Joel D. Peterson , Anilkumar Chandolu , Albert Fayrushin , George Matamis , Christopher Larsen , Rokibul Islam
IPC分类号: H10B43/27 , G11C5/02 , G11C5/06 , G11C16/04 , H01L21/768
CPC分类号: H10B43/27 , G11C5/025 , G11C5/06 , G11C16/0466 , H01L21/76802 , H01L21/76877
摘要: Some embodiments include an integrated assembly having a first deck. The first deck has first memory cell levels alternating with first insulative levels. A second deck is over the first deck. The second deck has second memory cell levels alternating with second insulative levels. A cell-material-pillar passes through the first and second decks. Memory cells are along the first and second memory cell levels and include regions of the cell-material-pillar. An intermediate level is between the first and second decks. The intermediate level includes a buffer region adjacent the cell-material-pillar. The buffer region includes a composition different from the first and second insulative materials, and different from the first and second conductive regions. Some embodiments include methods of forming integrated assemblies.
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公开(公告)号:US20240324223A1
公开(公告)日:2024-09-26
申请号:US18731940
申请日:2024-06-03
发明人: S. M. Istiaque Hossain , Prakash Rau Mokhna Rau , Arun Kumar Dhayalan , Damir Fazil , Joel D. Peterson , Anilkumar Chandolu , Albert Fayrushin , George Matamis , Christopher Larsen , Rokibul Islam
IPC分类号: H10B43/27 , G11C5/02 , G11C5/06 , G11C16/04 , H01L21/768
CPC分类号: H10B43/27 , G11C5/025 , G11C5/06 , G11C16/0466 , H01L21/76802 , H01L21/76877
摘要: Some embodiments include an integrated assembly having a first deck. The first deck has first memory cell levels alternating with first insulative levels. A second deck is over the first deck. The second deck has second memory cell levels alternating with second insulative levels. A cell-material-pillar passes through the first and second decks. Memory cells are along the first and second memory cell levels and include regions of the cell-material-pillar. An intermediate level is between the first and second decks. The intermediate level includes a buffer region adjacent the cell-material-pillar. The buffer region includes a composition different from the first and second insulative materials, and different from the first and second conductive regions. Some embodiments include methods of forming integrated assemblies.
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