公开(公告)号：US20250158628A1

公开(公告)日：2025-05-15

申请号：US18736681

申请日：2024-06-07

Applicant: MACRONIX INTERNATIONAL CO., LTD.

Inventor： Han-Wen HU ,  Yung-Chun LI ,  Chih-Chang HSIEH ,  BO-RONG LIN ,  Huai-Mu WANG ,  Chih-Huai SHIH

IPC: H03M1/12 ,  H03M1/38 ,  H03M1/50

Abstract: An analog-to-digital conversion device, includes the following elements. A sensing circuit, coupled to a bit line of a memory array, and used to sense a current in the bit line to generate a bit-sequence, the bit-sequence has a form of a thermometer code to represent an analog value. A latch logic circuit, including a plurality of latches and a plurality of logic circuits to form a page buffer of the memory array, and used to generate a bit-set according to the bit-sequence, the bit-set has a form of a binary code to represent a digital value. The latches and the logic circuits are used to perform a conversion process to convert the bit-sequence into the bit-set, and the conversion process has a bit width.