公开(公告)号：US20210041927A1

公开(公告)日：2021-02-11

申请号：US16535093

申请日：2019-08-08

Applicant: MELLANOX TECHNOLOGIES TLV LTD.

Inventor： George Elias ,  Ido Bourstein ,  Lior Abramovsky ,  Lavi Koch

IPC: G06F1/20 ,  G05B13/04

Abstract: A method includes obtaining (i) an operating-temperature profile of a hardware processing sub-unit (HPSU) of a network element as a function of time, and (ii) a dependence of an Equivalent Reliability Time (ERT) of the HPSU on operating temperature. The operating-temperature profile is weighted using the dependence of the ERT on operating temperature, to estimate an effective ERT of the HPSU. An operating condition of the HPSU in the network element is modified, depending on the effective ERT.

公开(公告)号：US10915154B1

公开(公告)日：2021-02-09

申请号：US16535093

申请日：2019-08-08

Applicant: MELLANOX TECHNOLOGIES TLV LTD.

Inventor： George Elias ,  Ido Bourstein ,  Lior Abramovsky ,  Lavi Koch

IPC: G05B13/04 ,  G06F1/20

Abstract: A method includes obtaining (i) an operating-temperature profile of a hardware processing sub-unit (HPSU) of a network element as a function of time, and (ii) a dependence of an Equivalent Reliability Time (ERT) of the HPSU on operating temperature. The operating-temperature profile is weighted using the dependence of the ERT on operating temperature, to estimate an effective ERT of the HPSU. An operating condition of the HPSU in the network element is modified, depending on the effective ERT.