Process for eliminating neck dislocations during czochralski crystal growth
    1.
    发明申请
    Process for eliminating neck dislocations during czochralski crystal growth 审中-公开
    在切克拉斯基晶体生长过程中消除颈部位错的方法

    公开(公告)号:US20030047130A1

    公开(公告)日:2003-03-13

    申请号:US10230609

    申请日:2002-08-29

    CPC分类号: C30B29/06 C30B15/22

    摘要: A process for eliminating dislocations in a neck of a large-diameter single crystal silicon ingot is provided. The process comprises controlling heat transfer at the melt/solid interface to eliminate dislocations over a reduced axial length in the neck portion of a large-diameter single crystal silicon ingot grown in accordance with the Czochralski method, thereby increasing overall process throughput and yield.

    摘要翻译: 提供一种消除大直径单晶硅锭颈部脱位的方法。 该方法包括控制在熔体/固体界面处的热传递,以消除根据切克劳斯基法生长的大直径单晶硅锭的颈部中减小的轴向长度上的位错,从而提高整体工艺生产量和产率。