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1.发明申请公开(公告)号：US20200041254A1
公开(公告)日：2020-02-06
申请号：US16606047
申请日：2018-04-24
摘要： A clearance measurement device is a device for measuring a clearance between an inner peripheral surface of a casing and an outer peripheral surface of a rotary body. This device: emits light having a first wavelength and a second wavelength, respectively, towards the outer peripheral surface of the rotary body; receives the light reflected from the outer peripheral surface via a first filter having a transmission band corresponding to the first wavelength and via a second filter having a transmission band corresponding to the second wavelength; and measures the clearance based on a time difference of the moment to detect the rotary body.
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公开(公告)号：US20210305493A1
公开(公告)日：2021-09-30
申请号：US17146841
申请日：2021-01-12
发明人： Yasuhiko TSURU , Yuko YAMAMOTO , Takashi NAKANO , Kentaro JINNO , Misaki FUKUYAMA , Yuki ASAI
IPC分类号： H01L41/314 , G01B17/02 , H01L41/08
摘要： A method of manufacturing a dielectric film includes the steps of: adjusting a particle size distribution of particles of a dielectric substance to fall within a specified range; kneading the particles having the adjusted particle size distribution and a dispersion medium to obtain a slurry; and forming the slurry into a film shape to obtain a film-like compact.
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公开(公告)号：US20230135790A1
公开(公告)日：2023-05-04
申请号：US17802615
申请日：2021-02-16
摘要： A defect detection method includes: a step of irradiating an object with a pulsed laser beam to continuously generate ultrasonic waves in the object; and a step of detecting the presence or absence of an internal defect of the object on the basis of the presence or absence of resonance of the ultrasonic waves occurring between a surface of the object and the internal defect. In this method, the internal defect is detected on the basis of the presence or absence of resonance of the ultrasonic waves occurring between the surface of the object and the internal defect. The internal defect can be thus detected even when the internal defect is in a surface layer of the object. The detected internal defect is crack or void.
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公开(公告)号：US20220198103A1
公开(公告)日：2022-06-23
申请号：US17557856
申请日：2021-12-21
发明人： Hiroki MORI , Akihiro TANAKA , Takahiro TACHIBANA , Yasutaka BANNO , Hidenori TAKEDA , Misaki FUKUYAMA
摘要： A modeling system (control device) includes a control unit that controls a modeling means to form each of stacked modeling layers, based on modeling data representing a three-dimensional model object that is a modeling target by use of a plurality of modeling layers, a determination unit that measures and determines whether or not a measured value of a stacked height of the formed modeling layer is within a predetermined range set beforehand and including a stacked height of the modeling layer in the modeling data, and in a case where the formed modeling layer has a lacking part in which the stacked height is not within the predetermined range, a correction unit that performs correction modeling by forming a correction member in the lacking part such that the stacked height is within the predetermined range.
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公开(公告)号：US20200182609A1
公开(公告)日：2020-06-11
申请号：US16313289
申请日：2017-08-30
摘要： A clearance measurement device is for measuring a clearance between an inner peripheral surface of a cylindrical casing and an outer peripheral surface of a rotating member configured to rotate in the casing. The clearance measurement device includes a marker provided to the outer peripheral surface; an optical sensor attached to the casing, and configured to emit light toward the outer peripheral surface, receive light reflected from the rotating member, and detect the marker based on a change in amount of the received reflected light; and a measurement control unit configured to perform signal processing on signals from the sensor. The sensor includes light reception fibers disposed such that optical axes intersect and having a measurement region on the outer peripheral surface, and planar light sources provided in a row along a rotating direction and each configured to emit light in a manner overlapping with the measurement region.
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