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公开(公告)号：US20180356540A1
公开(公告)日：2018-12-13
申请号：US15575144
申请日：2016-07-22
发明人： Kei GEMBA , Yoshikatsu KURODA , Daisuke MATSUURA , Tadayuki TAKAHASHI , Shin WATANABE , Shin'ichiro TAKEDA
IPC分类号： G01T1/24 , G01T1/29 , H01L27/146 , G01T1/36
CPC分类号： G01T1/243 , G01T1/16 , G01T1/29 , G01T1/2907 , G01T1/2928 , G01T1/361 , H01L27/14676
摘要： A radiation measuring apparatus includes: a plurality of detector modules; and a processing unit. Each of the detector modules includes: a plurality of detectors; a plurality of analog signal processing sections, each of which is provided for a corresponding one of the plurality of detectors to carry out analog-digital conversion to an analog signal obtained from the corresponding detector to generate digital measurement data corresponding to the analog signal; and a digital processing section configured to transmit to the processing unit, digital communication data generated from the digital measurement data received from the plurality of analog signal processing sections. Each of the plurality of detectors is a scatterer detector functioning as a scatterer or an absorber detector functioning as an absorber. The processing unit generates a radiation source distribution image showing a spatial distribution of radiation sources based on the digital communication data received from the of detector modules.
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公开(公告)号：US20170212254A1
公开(公告)日：2017-07-27
申请号：US15329770
申请日：2015-07-31
发明人： Kei GEMBA , Yoshikatsu KURODA , Hiroshi IKEBUCHI , Daisuke MATSUURA , Tadayuki TAKAHASHI , Shin WATANABE , Shin'ichiro TAKEDA
IPC分类号： G01T1/29
摘要： A detector for a Compton camera includes a first radiation scattering layer; a second radiation scattering layer; and a radiation absorption layer disposed between the first radiation scattering layer and the second radiation scattering layer. The first radiation scattering layer and the radiation absorption layer configure at least a part of a first detector, and the second radiation scattering layer and the radiation absorption layer configure at least a part of a second detector.
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公开(公告)号：US20180180747A1
公开(公告)日：2018-06-28
申请号：US15735389
申请日：2016-07-22
申请人： MITSUBISHI HEAVY INDUSTRIES, LTD. , Japan Aerospace Exploration Agency , HAMAMATSU PHOTONICS K.K.
发明人： Daisuke MATSUURA , Yoshikatsu KURODA , Kei GEMBA , Tadayuki TAKAHASHI , Shin WATANABE , Shin'ichiro TAKEDA , Hiroo YAMAMOTO , KAZUMASA KOSUGI , Kazuhisa Yamamura
摘要： A radiation measuring apparatus (20) includes a scatterer detector (10A), an absorber detector (10B) and a processing unit (12). Pixel electrodes (2) of the scatterer detector (10A) and the absorber detector (10B) are arranged such that a distance between centers of two neighbor pixel electrodes (2) is smaller than a mean free path of a recoil electron generated in the Compton scattering of an electromagnetic radiation. The processing unit (12) specifies and incidence direction of the electromagnetic radiation based on a recoiling direction to which the recoil electron recoils. In this way, an electron tracking-type Compton camera is realized which confines the incidence direction of the electromagnetic radiation by using the recoiling direction of the recoil electron in a Compton camera using a semiconductor detector.
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