公开(公告)号：US20160040980A1

公开(公告)日：2016-02-11

申请号：US14799987

申请日：2015-07-15

Applicant: MITUTOYO CORPORATION

Inventor： Yutaka MIKI

IPC: G01B11/02

CPC classification number: G01B11/02 ,  G01B11/08 ,  G01B2210/50

Abstract: An outer dimension measuring apparatus includes a light source; an optical system focusing the light emitted from the light source onto an optical axis; a reflector reflecting the focused light; a detector detecting an intensity of the reflected light; and a calculator calculating an outer dimension of a measured object using a first focus position, a second focus position, and a position of the reflector on the optical axis, the first focus position lying on the optical axis where a peak in reflected light intensity is detected by the detector for light reflected by a first surface, and the second focus position lying on the optical axis where a peak in reflected light intensity is detected by the detector for light that has been reflected by the reflector and emitted at a second surface.

Abstract translation: 外部尺寸测量装置包括光源; 将从光源发射的光聚焦到光轴上的光学系统; 反射聚焦光的反射镜; 检测器，检测反射光的强度; 以及使用第一聚焦位置，第二聚焦位置和反射器在光轴上的位置来计算被测物体的外部尺寸的计算器，所述第一聚焦位置位于反射光强度的峰值的光轴上 由检测器检测由第一表面反射的光，并且第二对焦位置位于光轴处，其中反射光强度的峰值被检测器检测到已被反射器反射并在第二表面处发射的光。

公开(公告)号：US20170167852A1

公开(公告)日：2017-06-15

申请号：US15376934

申请日：2016-12-13

Applicant: MITUTOYO CORPORATION

Inventor： Yutaka MIKI

IPC: G01B11/02

CPC classification number: G01B11/08 ,  G01B11/2433

Abstract: A light emitter and a reflector are placed such that an optical axis of a measuring light beam and an optical axis of a reflection light beam intersect, and further the measuring light beam and the reflection light beam are formed inside the same virtual measuring plane; a first measuring light beam and a second measuring light beam are defined in the measuring light beam, a first and second reflection light beam are defined in the reflection light beam, a measured object is placed in a measuring region on a measuring plane where the first and second measuring light beams overlap, an external diameter of the measured object in a first direction is measured from a shadow appearing in the first reflection light beam and an external diameter of the measured object in a second direction is measured from a shadow appearing in the second reflection light beam.

公开(公告)号：US20160018213A1

公开(公告)日：2016-01-21

申请号：US14795311

申请日：2015-07-09

Applicant: MITUTOYO CORPORATION

Inventor： Yutaka MIKI

IPC: G01B11/06

CPC classification number: G01B11/06 ,  G01B2210/50

Abstract: A thickness measurement apparatus includes a light source emitting light; an optical system focusing the light emitted from the light source onto an optical axis; a reflector reflecting light focused by the optical system; a detector detecting intensity of the reflected light according to a position on the optical axis where the light passing through the optical system is in focus; and a calculator calculating thickness of a measured object using a refractive index of the measured object and an amount of displacement between a first focus position and a second focus position.

Abstract translation: 厚度测量装置包括发射光的光源; 将从光源发射的光聚焦到光轴上的光学系统; 反射由光学系统聚焦的光的反射器; 检测器，其根据在所述光轴上通过所述光学系统的光被聚焦的位置来检测反射光的强度; 以及使用所测量的物体的折射率和第一聚焦位置和第二聚焦位置之间的位移量来计算被测物体的厚度的计算器。

公开(公告)号：US20160061953A1

公开(公告)日：2016-03-03

申请号：US14834981

申请日：2015-08-25

Applicant: MITUTOYO CORPORATION

Inventor： Yutaka MIKI

IPC: G01S17/48 ,  G01S7/481

CPC classification number: G01S17/48 ,  G01S7/4813 ,  G01S7/4818

Abstract: A position measurement apparatus includes a measurement head, a controller and a light transmission section. The measurement head includes a light projecting lens and a light receiving lens. The controller includes a light emitting section, a light emission circuit controlling the light emitting section, a light receiving section, and a pixel data processing circuit detecting a position of light received in the light receiving section, and outputting positional information to a calculation section calculating a position of an object to be measured. The light transmission section includes an optical fiber transmitting light from the light emitting section to the light projecting lens, and an image fiber with incidence and emission end faces, in which end faces of plural cores are two-dimensionally arrayed in the incidence end face and the emission end face, the image fiber transmitting light converged by the light receiving lens to the light receiving section.

Abstract translation: 位置测量装置包括测量头，控制器和光传输部。 测量头包括光投射透镜和光接收透镜。 控制器包括发光部分，控制发光部分的发光电路，光接收部分和检测在光接收部分中接收的光的位置的像素数据处理电路，并将位置信息输出到计算部分计算 待测物体的位置。 光传输部分包括将光从发光部分传输到光投射透镜的光纤，以及具有入射和发射端面的图像光纤，其中多个芯的端面被二维排列在入射端面中， 发射端面，由光接收透镜会聚的图像光纤透射光到光接收部。

公开(公告)号：US20160061724A1

公开(公告)日：2016-03-03

申请号：US14835229

申请日：2015-08-25

Applicant: MITUTOYO CORPORATION

Inventor： Yutaka MIKI

IPC: G01N21/47

CPC classification number: G01N21/474 ,  G01B11/24 ,  G01N2021/4709 ,  G01N2021/4742

Abstract: Optical observation apparatus includes: light source emitting broadband light; image fiber with first and second end faces, wherein end faces of plural cores are two-dimensionally arrayed in first and second end faces; imaging optical system provided on first end face side of image fiber, causing light from first end face to be imaged on imaging plane; and axial aberration optical system provided on second end face side of image fiber, having an axial chromatic aberration on optical axis, and causing light from second end face toward object to be observed to be converged. Image fiber takes light from light source from first end face, and transmits light to second end face, and takes light, reflected and scattered by a surface of object, converged by axial aberration optical system, and focused for each plural core on second end face, from second end face and transmits light to first end face.

Abstract translation: 光学观察装置包括：发射宽带光的光源; 具有第一和第二端面的图像光纤，其中多个芯的端面被二维排列在第一和第二端面中; 设置在图像光纤的第一端面侧的成像光学系统，使来自第一端面的光在成像面上成像; 以及设置在图像光纤的第二端面侧的轴向像差光学系统，在光轴上具有轴向色差，并且使来自第二端面的光朝向物体被观察到会聚。 图像光纤从第一端面的光源中取出光，并将光透射到第二端面，并被物体表面照射，反射和散射，由轴向像差光学系统会聚，并且聚焦在第二端面上的每个多个芯 从第二端面向第一端面透射光。