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    High spectral resolution Scheimpflug LIDAR
    1.
    发明授权
    High spectral resolution Scheimpflug LIDAR 有权

    公开(公告)号：US11768295B2

    公开(公告)日：2023-09-26

    申请号：US17504998

    申请日：2021-10-19

    申请人： Beamonics AB

    发明人： Mikkel Brydegaard

    IPC分类号： G01N21/47 ,  G01N21/45 ,  G01N21/53 ,  G01S17/95 ,  G01N21/39 ,  G01S7/481

    CPC分类号： G01S17/95 ,  G01N21/39 ,  G01N21/45 ,  G01N21/47 ,  G01N21/532 ,  G01S7/481 ,  G01N2021/398 ,  G01N2021/399 ,  G01N2021/4709

    摘要： A method is provided for detecting a property of a gas comprising: emitting a light, comprising a plurality of wavelengths covering a plurality of absorption lines of the gas, along a first axis, the light being scattered by particles of the gas resulting in a scattered light, generating a sensor image using a detection arrangement configured to receive the scattered light and comprising: an optical arrangement having an optical plane and being configured to direct the scattered light on to a light sensor, the light sensor having at least one pixel columns, wherein the pixel columns are aligned to an image plane and configured to output a sensor image, wherein the first axis, the optical plane, and the image plane intersect such that a Scheimpflug condition is achieved, determining, from the sensor image, properties of the gas at a plurality of positions along the first axis.

    PARTICLE CHARACTERISATION INSTRUMENT
    4.
    发明申请
    PARTICLE CHARACTERISATION INSTRUMENT 审中-公开

    公开(公告)号：US20190234852A1

    公开(公告)日：2019-08-01

    申请号：US16340881

    申请日：2017-09-22

    申请人： Malvern Panalytical Limited

    发明人： Richard SCULLION ,  Jason CORBETT

    IPC分类号： G01N15/02 ,  G01N15/14 ,  G01N21/49

    CPC分类号： G01N15/0211 ,  G01N15/1434 ,  G01N15/1456 ,  G01N21/49 ,  G01N2015/0222 ,  G01N2015/1454 ,  G01N2021/4707 ,  G01N2021/4709 ,  G01N2201/063 ,  G01N2201/0635

    摘要： A particle characterisation instrument, comprising a light source, a sample cell, an optical element between the light source and sample cell and a detector. The optical element is configured to modify light from the light source to create a modified beam, the modified beam: a) interfering with itself to create an effective beam in the sample cell along an illumination axis and b) diverging in the far field to produce a dark region along the illumination axis that is substantially not illuminated at a distance from the sample cell. The detector is at the distance from the sample cell, and is configured to detect light scattered from the effective beam by a sample in the sample cell, the detector positioned to detect forward or back scattered light along a scattering axis that is at an angle of 0° to 10° from the illumination axis.

    NON-LINEAR FREQUENCY SCAN OPTICAL FREQUENCY-DOMAIN REFLECTOMETRY
    9.
    发明申请
    NON-LINEAR FREQUENCY SCAN OPTICAL FREQUENCY-DOMAIN REFLECTOMETRY 审中-公开

    公开(公告)号：US20180031471A1

    公开(公告)日：2018-02-01

    申请号：US15549180

    申请日：2016-03-13

    申请人： DSIT SOLUTIONS LTD. ,  RAMOT AT TEL-AVIV UNIVERSITY LTD.

    发明人： Avishay Eyal ,  Eyal Leviatan ,  Meir Hahami ,  Yakov Botsev

    IPC分类号： G01N21/47

    CPC分类号： G01N21/474 ,  G01D5/3537 ,  G01M11/3127 ,  G01M11/3172 ,  G01N2021/4709 ,  G01N2021/4742 ,  H04B10/07

    摘要： A system (20) for fiber-optic reflectometry includes an optical source (28, 40), a beat detection module (44, 48, 52, 56A, 56B) and a processor (36). The optical source is configured to generate a non-linearly-scanning optical interrogation signal having an instantaneous optical frequency that is a non-linear function of time. The beat detection module is configured to transmit the optical interrogation signal into an optical fiber (24), to receive from the optical fiber an optical backscattering signal in response to the optical interrogation signal, and to mix the optical backscattering signal with a reference replica of the optical interrogation signal, so as to produce a beat signal. The processor is configured (i) to hold a predefined function that is indicative of an expected phase of the beat signal resulting from the non-linearly-scanning optical interrogation signal as a function of position along the optical fiber and time, (ii) to estimate a backscattering profile of the optical fiber by applying the predefined function to the beat signal, and (iii) to sense one or more events affecting the optical fiber by analyzing the backscattering profile.