公开(公告)号：US09040907B2

公开(公告)日：2015-05-26

申请号：US14354227

申请日：2012-10-30

Applicant: MKS Instruments, Inc.

Inventor： Gerardo A. Brucker ,  G. Jeffery Rathbone ,  Brian J. Horvath ,  Timothy C. Swinney ,  Stephen C. Blouch ,  Jeffrey G. McCarthy ,  Timothy R. Piwonka-Corle

IPC: H01J49/42 ,  H01J49/00 ,  H01J49/14 ,  H01J27/20

CPC classification number: H01J49/4245 ,  H01J27/205 ,  H01J49/0009 ,  H01J49/0031 ,  H01J49/147

Abstract: An apparatus includes an electrostatic ion trap and electronics configured to measure parameters of the ion trap and configured to adjust ion trap settings based on the measured parameters. A method of tuning the electrostatic ion trap includes, under automatic electronic control, measuring parameters of the ion trap and adjusting ion trap settings based on the measured parameters.

Abstract translation: 一种装置包括静电离子阱和被配置为测量离子阱的参数并被配置为基于测量的参数来调整离子阱设置的电子器件。 调整静电离子阱的方法包括在自动电子控制下，基于测量参数测量离子阱的参数和调整离子阱设置。