公开(公告)号：US20230007997A1

公开(公告)日：2023-01-12

申请号：US17858424

申请日：2022-07-06

Applicant: MPI CORPORATION

Inventor： CHIN-TIEN YANG ,  YANG-HUNG CHENG ,  YU-HAO CHEN ,  CHIN-YI TSAI ,  HUI-PIN YANG ,  HORNG-CHUAN SUN

IPC: G01R1/073

Abstract: A vertical probe head includes upper and lower die units having upper and lower through holes, and probes each including a body portion between the die units, tail and head portion installation parts in the upper and lower through holes respectively, and a head portion contact part for electrically contacting a device under test. The probes include a pair of signal probes including at least one distinctive probe, for which, the body portion is smaller in width than the head portion installation part, and a body portion center line is deviated from a head portion installation part center line toward the probe paired thereto. For the paired probes, a head portion contact part pitch is larger than a body portion pitch for matching a large-pitch high-speed differential pair of the device under test, great impedance matching effect, and consistent contact force and stable elasticity of the probes in operation.

公开(公告)号：US20240393367A1

公开(公告)日：2024-11-28

申请号：US18645592

申请日：2024-04-25

Applicant: MPI CORPORATION

Inventor： CHIN-TIEN YANG ,  YU-HAO CHEN ,  HUI-PIN YANG ,  CHI-HSIEN LI

IPC: G01R1/067 ,  G01R1/073

Abstract: A probe head includes multiple probes and guide plates. Each probe includes a first end, a second end, and a probe body. The first end abuts a contact pad of a device under test. The second end abuts a contact pad of a board of a probe system. The probe body extends between the first end and the second end according to a longitudinal development axis. The guide plate includes a guide-hole pair for a probe pair of the probe head to respectively pass through, and the guide-hole pair slidably accommodate the pair of probes. The guide plate further includes an extension hole extending from one guide hole of the guide-hole pair to another guide hole to provide compensating impedance between the guide-hole pair, improve impedance matching when probing the device under test with the probe pair, and reduce return loss between the probe head and the device under test.

公开(公告)号：US20240402218A1

公开(公告)日：2024-12-05

申请号：US18806888

申请日：2024-08-16

Applicant: MPI CORPORATION

Inventor： CHIN-TIEN YANG ,  YU-HAO CHEN ,  HUI-PIN YANG ,  CHI-HSIEN LI

IPC: G01R1/073 ,  G01R31/28

Abstract: A probe head includes multiple probes and guide plates. Each probe includes a first end, a second end, and a probe body. The first end abuts a contact pad of a device under test. The second end abuts a contact pad of a board of a probe system. The probe body extends between the first end and the second end according to a longitudinal development axis. The guide plate includes a guide-hole pair for a probe pair of the probe head to respectively pass through, and the guide-hole pair slidably accommodate the pair of probes. The guide plate further includes an extension hole extending from one guide hole of the guide-hole pair to another guide hole. The extension hole intersects with at least one of the first guide holes and is located substantially between the probe pair on the first guide plate.

公开(公告)号：US20240393368A1

公开(公告)日：2024-11-28

申请号：US18645531

申请日：2024-04-25

Applicant: MPI CORPORATION

Inventor： CHIN-TIEN YANG ,  YU-HAO CHEN ,  HUI-PIN YANG ,  CHI-HSIEN LI

IPC: G01R1/067 ,  G01R1/073

Abstract: A probe system and a probe card, a probe head and a guide plate structure thereof are described herein. The probe head includes a plurality of probes and guide plates. Each probe includes a first end, a second end, and a probe body. The first end is configured to abut a contact pad of the device under test. The second end is configured to abut a contact pad of a board of the probe system. The probe body extends between the first end and the second end according to a longitudinal development axis. The guide plate includes a pair of first guide holes for a pair of probes to pass through, and the pair of first guide holes are configured to slidably accommodate the pair of probes. The material between the pair of first guide holes in the guide plate has a relative dielectric constant not greater than 6, so as to reduce the return loss between the probe head and the device under test.