公开(公告)号：US20240248129A1

公开(公告)日：2024-07-25

申请号：US18406668

申请日：2024-01-08

Applicant: MPI Corporation

Inventor： Wen-Wei Lin ,  Wen-Chung Lin ,  Chia-Nan Chou ,  Huang-Huang Yang ,  Yu-Tse Wang ,  Wei-Heng Hung ,  Ya-Hung Lo ,  Shou-Jen Tsai ,  Fuh-Chyun Tang

IPC: G01R31/28 ,  G01R1/04 ,  G01R1/067

CPC classification number: G01R31/2808 ,  G01R1/04 ,  G01R1/06705

Abstract: A circuit board detection device includes a base, a stage assembly, a first gantry support, and a first probe assembly. The stage assembly is arranged on the base and includes a linear drive module, a rotary motor, and a platform. The platform is configured to carry a circuit board and can be driven by the linear drive module to move along a first axial direction. The platform can also be driven by the rotary motor to rotate relative to a first rotation axis. The first gantry support is fixed on the base and includes a first beam. The first beam extends along a second axial direction perpendicular to the first axial direction to span over the linear drive module, and includes a first probe guide rail. The first probe assembly is arranged on the first probe guide rail to be movable along the second axial direction.

公开(公告)号：US09880252B2

公开(公告)日：2018-01-30

申请号：US15401987

申请日：2017-01-09

Applicant: MPI CORPORATION

Inventor： Wei-Cheng Ku ,  Shao-Wei Lu ,  Hao Wei ,  Yu-Tse Wang

IPC: G01R31/00 ,  G01R35/00 ,  G01R1/073

CPC classification number: G01R35/005 ,  G01R1/073 ,  G01R31/2808 ,  G01R31/2894

Abstract: A method of calibrating and debugging a testing system is provided. First, values of different electrical path segments are calibrated, and parameters of the electrical path segments while being calibrated are saved. After calibration, electrical tests can be processed on a DUT. If the testing system malfunctions, the values of the electrical path segments are calibrated again to compare the current parameters to the previously saved parameters. The component which goes wrong can be found out quickly in this way.

公开(公告)号：US09581676B2

公开(公告)日：2017-02-28

申请号：US14553153

申请日：2014-11-25

Applicant: MPI CORPORATION

Inventor： Wei-Cheng Ku ,  Shao-Wei Lu ,  Hao Wei ,  Yu-Tse Wang

IPC: G01R31/00 ,  G01R35/00 ,  G01R31/28

CPC classification number: G01R35/005 ,  G01R31/2808 ,  G01R31/2894

Abstract: A method of calibrating and debugging a testing system is provided. First, values of different electrical path segments are calibrated, and parameters of the electrical path segments while being calibrated are saved. After calibration, electrical tests can be processed on a DUT. If the testing system malfunctions, the values of the electrical path segments are calibrated again to compare the current parameters to the previously saved parameters. The component which goes wrong can be found out quickly in this way.

Abstract translation: 提供了一种校准和调试测试系统的方法。 首先，校准不同电路段的值，并保存校准时电路段的参数。 校准后，可以在DUT上对电气测试进行处理。 如果测试系统发生故障，则再次校准电气路径段的值，以将当前参数与先前保存的参数进行比较。 出现错误的组件可以通过这种方式迅速找到。

公开(公告)号：US09759743B2

公开(公告)日：2017-09-12

申请号：US14552957

申请日：2014-11-25

Applicant: MPI CORPORATION

Inventor： Wei-Cheng Ku ,  Shao-Wei Lu ,  Hao Wei ,  Yu-Tse Wang

IPC: G01R31/00 ,  G01R1/073 ,  G01R1/02 ,  G01R1/04 ,  G01R31/28 ,  G01R35/00

CPC classification number: G01R1/07314 ,  G01R1/025 ,  G01R1/04 ,  G01R1/07392 ,  G01R31/2812 ,  G01R35/005

Abstract: A testing system includes a test machine, a plurality of probe sets, a data input device, a controller, a memory, and a data output device. The test machine has a platform for a DUT to be placed thereon, and a test arm which is movable relative to the platform. The probe sets are provided on the test machine with at least one probe set provided on the test arm to contact the DUT. The data input device is used to input information about the DUT. The controller is electrically connected to the test arm, the probe set on the test arm, and the data input device to move the test arm to a predetermined position according to the inputted information, and to make the probe set contact the DUT for electrical test. The memory saves electrical test result, which is outputted by the data output device.

公开(公告)号：US09645197B2

公开(公告)日：2017-05-09

申请号：US14557181

申请日：2014-12-01

Applicant: MPI CORPORATION

Inventor： Wei-Cheng Ku ,  Shao-Wei Lu ,  Hao Wei ,  Yu-Tse Wang

IPC: G01R31/00 ,  G01R31/28 ,  G01R35/00

CPC classification number: G01R31/2891 ,  G01R35/005

Abstract: A method of operating a testing system is provided, wherein the testing system has a test machine and a probe module, which has a first probe set and a second probe set. One of the first probe set and the second probe set can be connected to the test machine. The method includes the following steps: connect the test machine and the first probe set; calibrate the testing system; abut the first probe set against a DUT to do electrical tests; disconnect the first probe set and the DUT; disconnect the test machine and the first probe set; connect the test machine and the second probe set; calibrate the testing system again; abut the second probe set against the DUT to do electrical tests.