HIGH-STRENGTH STEEL SHEET FOR CANS AND METHOD FOR MANUFACTURING THE SAME
    1.
    发明申请
    HIGH-STRENGTH STEEL SHEET FOR CANS AND METHOD FOR MANUFACTURING THE SAME 审中-公开
    CAN高强度钢板及其制造方法

    公开(公告)号:US20110076177A1

    公开(公告)日:2011-03-31

    申请号:US12935564

    申请日:2009-04-01

    摘要: A steel sheet for cans that has a yield stress of at least 500 Mpa after coating and baking and a method for manufacturing the steel sheet for cans are provided. The steel sheet for cans contains, on the basis of mass percent, C: more than 0.02% but 0.10% or less, Si: 0.10% or less, Mn: 1.5% or less, P: 0.20% or less, S: 0.20% or less, Al: 0.10% or less, N: 0.0120% to 0.0250%, dissolved N being 0.0100% or more, and a remainder of Fe and incidental impurities. A high-strength material can be obtained by maintaining the absolute quantity of dissolved N at a certain value or more and performing hardening by quench aging and strain aging, for example, in a printing process, a film lamination process, or a drying and baking process performed before can manufacturing. In the manufacture, hot rolling is performed at a slab extraction temperature of 1200° C. or more and a finish rolling temperature of (Ar3 transformation temperature—30)° C. or more, and coiling is performed at 650° C. or less.

    摘要翻译: 提供了涂布烘烤后屈服应力为500MPa以上的罐用钢板和罐用钢板的制造方法。 罐头用钢板以质量%计含有C:0.02%以上且0.10%以下,Si:0.10%以下,Mn:1.5%以下,P:0.20%以下,S:0.20 %以下,Al:0.10%以下,N:0.0120%〜0.0250%,N为0.0100%以上,余量为Fe及杂质。 通过将溶解的N的绝对量保持在一定值以上,通过淬火时效和应变时效进行硬化,例如在印刷工序,薄膜层压工序,干燥烘烤中,可以得到高强度材料 可以制造之前执行的过程。 在制造中,以1200℃以上的板坯提取温度和(Ar 3相变温度-30℃)以上的精轧温度进行热轧,并且在650℃以下进行卷取 。

    FILM FORMATION METHOD, CLEANING METHOD AND FILM FORMATION APPARATUS
    2.
    发明申请
    FILM FORMATION METHOD, CLEANING METHOD AND FILM FORMATION APPARATUS 失效
    薄膜形成方法,清洗方法和薄膜形成装置

    公开(公告)号:US20090142513A1

    公开(公告)日:2009-06-04

    申请号:US12352197

    申请日:2009-01-12

    CPC分类号: C23C16/08 C23C16/4405

    摘要: A treatment gas is supplied to form a Ti-based film on a predetermined number of wafers W while setting a temperature of a susceptor 2 in a chamber 1 to a predetermined temperature. After this, the interior of the chamber 1 containing no wafers W is cleaned by discharging Cl2 gas as a cleaning gas from a shower head 10 into the chamber 1. During this cleaning, the temperature of each of the susceptor 2, the shower head 10, and the wall portion of the chamber 1 is independently controlled so that the temperature of the susceptor 2 is not lower than the decomposition start temperature of Cl2 gas and the temperature of the shower head 10 and the wall portion of the chamber 1 is not higher than the decomposition start temperature.

    摘要翻译: 供给处理气体以在预定数量的晶片W上形成Ti基膜,同时将室1中的基座2的温度设定到预定温度。 之后,通过将作为清洗气体的Cl 2气体从淋浴喷头10排出到室1中来清洁不含晶片W的室1的内部。在该清洁期间,基座2,淋浴头10 ,并且独立地控制室1的壁部,使得基座2的温度不低于Cl 2气体的分解开始温度,并且喷淋头10的温度和室1的壁部分的温度不高 比分解开始温度高。

    Film formation method, cleaning method and film formation apparatus
    3.
    发明授权
    Film formation method, cleaning method and film formation apparatus 失效
    成膜方法,清洗方法和成膜装置

    公开(公告)号:US08021717B2

    公开(公告)日:2011-09-20

    申请号:US12352197

    申请日:2009-01-12

    IPC分类号: C23C16/08

    CPC分类号: C23C16/08 C23C16/4405

    摘要: A treatment gas is supplied to form a Ti-based film on a predetermined number of wafers W while setting a temperature of a susceptor 2 in a chamber 1 to a predetermined temperature. After this, the interior of the chamber 1 containing no wafers W is cleaned by discharging Cl2 gas as a cleaning gas from a shower head 10 into the chamber 1. During this cleaning, the temperature of each of the susceptor 2, the shower head 10, and the wall portion of the chamber 1 is independently controlled so that the temperature of the susceptor 2 is not lower than the decomposition start temperature of Cl2 gas and the temperature of the shower head 10 and the wall portion of the chamber 1 is not higher than the decomposition start temperature.

    摘要翻译: 供给处理气体以在预定数量的晶片W上形成Ti基膜,同时将室1中的基座2的温度设定到预定温度。 之后,通过将作为清洗气体的Cl 2气体从淋浴喷头10排出到室1中来清洁不含晶片W的室1的内部。在该清洁期间,基座2,淋浴头10 ,并且独立地控制室1的壁部,使得基座2的温度不低于Cl 2气体的分解开始温度,并且喷淋头10的温度和室1的壁部分的温度不高 比分解开始温度高。