Posture estimation device and posture estimation method
    1.
    发明授权
    Posture estimation device and posture estimation method 有权
    姿势估计装置和姿势估计方法

    公开(公告)号:US09355305B2

    公开(公告)日:2016-05-31

    申请号:US13878093

    申请日:2011-09-15

    IPC分类号: G06K9/00 G06T7/00

    摘要: The present invention is a posture estimation device for estimating a wide variety of 3-dimensional postures by using a skeletal model. The posture estimation device (200) has: a skeletal backbone estimation unit (230) for estimating the position of a feature location of a person within an acquired image; a location extraction unit (240) which generates a likelihood map indicating the certainty that a location other than the feature location of the person exists in the acquired image based on the position of the feature location of the person; and a skeletal model evaluation unit (250) for evaluating, based on the likelihood map, a candidate group which includes a plurality of 2-dimensional skeletal models as candidates and such that each 2-dimensional skeletal model is configured from a line group representing each location and a point group representing coupling between each location and corresponds to one posture of the person.

    摘要翻译: 本发明是一种通过使用骨架模型来估计各种各样的3维姿势的姿势估计装置。 姿势估计装置(200)具有:骨骼骨干估计部(230),用于估计所获取的图像内的人物的特征位置的位置; 位置提取单元(240),其基于人的特征位置的位置生成表示确定性的可靠性图,所述确定性指示所述人物的特征位置以外的位置存在于所获取的图像中; 以及骨骼模型评价单元(250),用于基于所述似然图来评估包括多个二维骨架模型作为候选的候选组,并且使得每个二维骨骼模型由表示每个 位置和点组,表示每个位置之间的耦合并且对应于该人的一个姿势。

    POSTURE ESTIMATION DEVICE AND POSTURE ESTIMATION METHOD
    2.
    发明申请
    POSTURE ESTIMATION DEVICE AND POSTURE ESTIMATION METHOD 有权
    姿态估计装置和姿势估计方法

    公开(公告)号:US20130230211A1

    公开(公告)日:2013-09-05

    申请号:US13878093

    申请日:2011-09-15

    IPC分类号: G06K9/00

    摘要: The present invention is a posture estimation device for estimating a wide variety of 3-dimensional postures by using a skeletal model. The posture estimation device (200) has: a skeletal backbone estimation unit (230) for estimating the position of a feature location of a person within an acquired image; a location extraction unit (240) which generates a likelihood map indicating the certainty that a location other than the feature location of the person exists in the acquired image based on the position of the feature location of the person; and a skeletal model evaluation unit (250) for evaluating, based on the likelihood map, a candidate group which includes a plurality of 2-dimensional skeletal models as candidates and such that each 2-dimensional skeletal model is configured from a line group representing each location and a point group representing coupling between each location and corresponds to one posture of the person.

    摘要翻译: 本发明是一种通过使用骨架模型来估计各种各样的3维姿势的姿势估计装置。 姿势估计装置(200)具有:骨骼骨干估计部(230),用于估计所获取的图像内的人物的特征位置的位置; 位置提取单元(240),其基于人的特征位置的位置生成表示确定性的可靠性图,所述确定性指示所述人物的特征位置以外的位置存在于所获取的图像中; 以及骨骼模型评价单元(250),用于基于所述似然图来评估包括多个二维骨架模型作为候选的候选组,并且使得每个二维骨骼模型由表示每个 位置和点组,表示每个位置之间的耦合并且对应于该人的一个姿势。

    SEMICONDUCTOR INSPECTION DEVICE AND INSPECTION METHOD
    3.
    发明申请
    SEMICONDUCTOR INSPECTION DEVICE AND INSPECTION METHOD 审中-公开
    半导体检测装置和检测方法

    公开(公告)号:US20110216312A1

    公开(公告)日:2011-09-08

    申请号:US13061363

    申请日:2009-08-27

    IPC分类号: G01N21/00

    摘要: For a semiconductor device S, an inspection is performed in a zero-bias state by use of electromagnetic waves generated by irradiation of pulsed laser light, and an inspection range is set with reference to layout information of the semiconductor device S to perform two-dimensional scanning by inspection light L1 of the pulsed laser light within the range. Moreover, with the inspection range of the semiconductor device S arranged at a predetermined position with respect to an optical axis of an optical system, and with a solid immersion lens 36 disposed for the semiconductor device S, by a galvanometer scanner 30 being scanning means, the inspection range of the semiconductor device S is two-dimensionally scanned by the inspection light L1 via the solid immersion lens 36, and an electromagnetic wave emitted from the semiconductor device S is detected by a photoconductive element 40. Accordingly, a semiconductor inspection apparatus and inspection method capable of preferably performing an inspection in a zero-bias state for a semiconductor device is realized.

    摘要翻译: 对于半导体器件S,通过使用由脉冲激光的照射产生的电磁波在零偏置状态下进行检查,并且参考半导体器件S的布局信息设置检查范围,以执行二维 通过脉冲激光的检查光L1扫描该范围内。 此外,由于半导体器件S的检查范围相对于光学系统的光轴布置在预定位置,并且对于半导体器件S设置的固体浸没透镜36,作为扫描装置的电流计扫描器30, 半导体器件S的检查范围通过固体浸没透镜36被检查光L1二维扫描,并且由光电导元件40检测从半导体器件S发射的电磁波。因此,半导体检查设备和 实现了能够优选在半偏置状态下对半导体器件进行检查的检查方法。

    Method of arc welding with a ferrite stainless steel welding rod
    4.
    发明授权
    Method of arc welding with a ferrite stainless steel welding rod 失效
    用铁素体不锈钢焊条进行电弧焊接的方法

    公开(公告)号:US5254836A

    公开(公告)日:1993-10-19

    申请号:US383265

    申请日:1989-07-20

    IPC分类号: B23K35/30 C22C38/20 C22C38/42

    CPC分类号: B23K35/308

    摘要: The ferrite stainless steel welding rod of this invention comprises the following: 0.03% by weight or less of carbon, 1.00% by weight or less of silicon, 1.00% by weight or less of manganese, from 16.0 to 21.0% by weight of chromium, from 0.30 to 0.80% by weight of niobium, from 0.30 to 0.80% by weight of copper, 0.025% by weight or less of nitrogen, and the balance of iron. The ferrite stainless steel welding rod of this invention offers a good weldability not only in welding stainless steels of the same type but also in welding stainless steels of different types. Further, the welding steel of this invention has a good oxidation resistance, and a good workability and mechanical property.

    摘要翻译: 本发明的铁素体不锈钢焊条包括:0.03重量%以下的碳,1.00重量%以下的硅,1.00重量%以下的锰,16.0〜21.0重量%的铬, 0.30〜0.80重量%的铌,0.30〜0.80重量%的铜,0.025重量%以下的氮及余量的铁。 本发明的铁素体不锈钢焊条不仅可焊接相同类型的不锈钢,而且可焊接不同类型的不锈钢。 此外,本发明的焊接钢具有良好的抗氧化性,良好的加工性和机械特性。

    Cut wire for electrical discharge machining
    5.
    发明授权
    Cut wire for electrical discharge machining 失效
    切割线用于放电加工

    公开(公告)号:US4837416A

    公开(公告)日:1989-06-06

    申请号:US943943

    申请日:1986-12-09

    IPC分类号: H01B5/02 B23H7/08

    CPC分类号: B23H7/08

    摘要: An improved cut wire used as an electrode in electrical discharge machining which has higher tensile strength at high temperatures. It is a composite wire having a core of stainless steel and a covering layer of copper or copper alloy provided around the core. The diameter and the tensile strength of the cut wire and the percentage of the sectional area of the core to that of the entire cut wire are important parameters in the composite wire.

    摘要翻译: 在放电加工中用作电极的改进的切割线在高温下具有较高的拉伸强度。 它是具有不锈钢芯和在芯周围设置的铜或铜合金覆盖层的复合线。 切割线的直径和拉伸强度以及芯部截面积与整个切割线的截面积的百分比是复合线材中的重要参数。