公开(公告)号：US07372743B2

公开(公告)日：2008-05-13

申请号：US11639128

申请日：2006-12-13

申请人： Masaru Yano ,  Hideki Arakawa ,  Mototada Sakashita ,  Akira Ogawa ,  Yoshiaki Shinmura ,  Hajime Aoki

发明人： Masaru Yano ,  Hideki Arakawa ,  Mototada Sakashita ,  Akira Ogawa ,  Yoshiaki Shinmura ,  Hajime Aoki

IPC分类号： G11C16/04

CPC分类号： G11C16/0475

摘要： A control method for a nonvolatile storage device having a storage mode in which in a memory cell provided with a trapping dielectric layer 1-bit data is stored depending on the presence or absence of charge in a first trapping region. In a dynamic reference cell initialization operation, a charge accumulation operation is performed, as a preset operation in the initialization operation, on second trapping regions of first and second dynamic reference cells to a charge accumulation operation on a second trapping region of the memory cell. In addition, at the time of data rewrite, preprogram verification and preprogramming are performed on the first trapping regions. This makes it possible to shorten the time taken for initialization and data rewrite.

摘要翻译： 一种具有存储模式的非易失性存储装置的控制方法，其中根据在第一捕获区域中是否存在电荷而存储具有捕获电介质层1位数据的存储单元。 在动态参考单元初始化操作中，作为初始化操作中的预设操作，在第一和第二动态参考单元的第二陷印区域上执行电荷累积操作，以对存储单元的第二陷印区域进行电荷累积操作。 此外，在数据重写时，对第一捕获区域执行预编程验证和预编程。 这使得可以缩短初始化和数据重写所花费的时间。

公开(公告)号：US20070183193A1

公开(公告)日：2007-08-09

申请号：US11639128

申请日：2006-12-13

申请人： Masaru Yano ,  Hideki Arakawa ,  Mototada Sakashita ,  Akira Ogawa ,  Yoshiaki Shinmura ,  Hajime Aoki

发明人： Masaru Yano ,  Hideki Arakawa ,  Mototada Sakashita ,  Akira Ogawa ,  Yoshiaki Shinmura ,  Hajime Aoki

IPC分类号： G11C16/06 ,  G11C11/34

CPC分类号： G11C16/0475

摘要： A control method for a nonvolatile storage device having a storage mode in which in a memory cell provided with a trapping dielectric layer 1-bit data is stored depending on the presence or absence of charge in a first trapping region. In a dynamic reference cell initialization operation, a charge accumulation operation is performed, as a preset operation in the initialization operation, on second trapping regions of first and second dynamic reference cells to a charge accumulation operation on a second trapping region of the memory cell. In addition, at the time of data rewrite, preprogram verification and preprogramming are performed on the first trapping regions. This makes it possible to shorten the time taken for initialization and data rewrite.

摘要翻译： 一种具有存储模式的非易失性存储装置的控制方法，其中根据在第一捕获区域中是否存在电荷而存储具有捕获电介质层1位数据的存储单元。 在动态参考单元初始化操作中，作为初始化操作中的预设操作，在第一和第二动态参考单元的第二陷印区域上执行电荷累积操作，以对存储单元的第二陷印区域进行电荷累积操作。 此外，在数据重写时，对第一捕获区域执行预编程验证和预编程。 这使得可以缩短初始化和数据重写所花费的时间。

公开(公告)号：US07385844B2

公开(公告)日：2008-06-10

申请号：US11494872

申请日：2006-07-27

申请人： Masaru Yano ,  Hideki Arakawa ,  Mototada Sakashita

发明人： Masaru Yano ,  Hideki Arakawa ,  Mototada Sakashita

IPC分类号： G11C16/04

CPC分类号： G11C16/10 ,  G11C16/0475 ,  G11C16/0491 ,  G11C2216/14

摘要： A semiconductor device includes: a memory cell array that has a plurality of non-volatile memory cells each having a first bit and a second bit in different regions in a charge storing layer; an SRAM array (first memory unit) that stores data to be written into the memory cell array; a WR sense amplifier block (second memory unit) that stores first divided data to be written into the first bit and second divided data to be written into the second bit, the first divided data being formed by dividing the data into predetermined units, the second divided data being formed by dividing the data into predetermined units; and a control circuit that writes the second divided data into the first bit of the memory cells of the memory cell array (step S28) after writing the first divided data into the second bit of the memory cells of the memory cell array (step S22).

摘要翻译： 半导体器件包括：存储单元阵列，其具有多个非易失性存储单元，每个非易失性存储单元在电荷存储层中的不同区域中具有第一位和第二位; 存储要写入存储单元阵列的数据的SRAM阵列（第一存储器单元）; WR读出放大器块（第二存储器单元），其将要写入第一位的第一划分数据和要写入第二位的第二划分数据存储，第一划分数据通过将数据划分为预定单位形成，第二划分数据 通过将数据划分为预定单位形成分割数据; 以及将第一划分数据写入存储单元阵列的存储单元的第二位之后，将第二划分数据写入存储单元阵列的存储单元的第一位（步骤S28）的控制电路（步骤S 22）。

公开(公告)号：US07362620B2

公开(公告)日：2008-04-22

申请号：US11394491

申请日：2006-03-31

申请人： Masaru Yano ,  Hideki Arakawa ,  Mototada Sakashita

发明人： Masaru Yano ,  Hideki Arakawa ,  Mototada Sakashita

IPC分类号： G11C7/00

CPC分类号： G11C16/10

摘要： A semiconductor device (1) includes a non-volatile memory cell array (2), a write/read circuit (30) writing data into and reading data from the non-volatile memory cell array (2), a data input/output circuit (80), and a volatile memory cell array (40) including a first latch circuit (41) that is connected to the write/read circuit (30) and latches first data, and a second latch circuit (42) that is connected to the data input/output circuit (80) and latches second data. The device (1) may further include an inverter circuit (310) that inverts the first data in accordance with the number of bits to be actually written among the first data, and a control circuit (3) that causes the second data to be latched in the second latch circuit (42) while the first data is being written into the non-volatile memory cell array (2). This semiconductor device (1) has a shorter writing time and a smaller circuit area.

摘要翻译： 半导体器件（1）包括非易失性存储单元阵列（2），将数据写入非易失性存储单元阵列（2）中并从其读取数据的写/读电路（30），数据输入/输出电路 （80）和包括连接到写入/读取电路（30）并锁存第一数据的第一锁存电路（41）的易失性存储单元阵列（40）和第二锁存电路（42），其连接到 数据输入/输出电路（80）并锁存第二数据。 装置（1）还可以包括根据在第一数据中实际写入的比特数来反转第一数据的逆变器电路（310）和使第二数据被锁存的控制电路（3） 在第二锁存电路（42）中，第一数据被写入非易失性存储单元阵列（2）中。 该半导体器件（1）具有较短的写入时间和较小的电路面积。

公开(公告)号：US20070025154A1

公开(公告)日：2007-02-01

申请号：US11494872

申请日：2006-07-27

申请人： Masaru Yano ,  Hideki Arakawa ,  Mototada Sakashita

发明人： Masaru Yano ,  Hideki Arakawa ,  Mototada Sakashita

IPC分类号： G11C16/04

CPC分类号： G11C16/10 ,  G11C16/0475 ,  G11C16/0491 ,  G11C2216/14

摘要： A semiconductor device includes: a memory cell array that has a plurality of non-volatile memory cells each having a first bit and a second bit in different regions in a charge storing layer; an SRAM array (first memory unit) that stores data to be written into the memory cell array; a WR sense amplifier block (second memory unit) that stores first divided data to be written into the first bit and second divided data to be written into the second bit, the first divided data being formed by dividing the data into predetermined units, the second divided data being formed by dividing the data into predetermined units; and a control circuit that writes the second divided data into the first bit of the memory cells of the memory cell array (step S28) after writing the first divided data into the second bit of the memory cells of the memory cell array (step S22).

摘要翻译： 半导体器件包括：存储单元阵列，其具有多个非易失性存储单元，每个非易失性存储单元在电荷存储层中的不同区域中具有第一位和第二位; 存储要写入存储单元阵列的数据的SRAM阵列（第一存储器单元）; WR读出放大器块（第二存储单元），存储要写入第一位的第一划分数据和要写入第二位的第二划分数据，第一划分数据通过将数据划分为预定单位形成，第二划分数据 通过将数据划分为预定单位形成分割数据; 以及将第一划分数据写入存储单元阵列的存储单元的第二位之后，将第二划分数据写入存储单元阵列的存储单元的第一位（步骤S28）的控制电路（步骤S 22）。

公开(公告)号：US20060245247A1

公开(公告)日：2006-11-02

申请号：US11394491

申请日：2006-03-31

申请人： Masaru Yano ,  Hideki Arakawa ,  Mototada Sakashita

发明人： Masaru Yano ,  Hideki Arakawa ,  Mototada Sakashita

IPC分类号： G11C14/00

CPC分类号： G11C16/10

摘要： A semiconductor device (1) includes a non-volatile memory cell array (2), a write/read circuit (30) writing data into and reading data from the non-volatile memory cell array (2), a data input/output circuit (80), and a volatile memory cell array (40) including a first latch circuit (41) that is connected to the write/read circuit (30) and latches first data, and a second latch circuit (42) that is connected to the data input/output circuit (80) and latches second data. The device (1) may further include an inverter circuit (310) that inverts the first data in accordance with the number of bits to be actually written among the first data, and a control circuit (3) that causes the second data to be latched in the second latch circuit (42) while the first data is being written into the non-volatile memory cell array (2). This semiconductor device (1) has a shorter writing time and a smaller circuit area.

摘要翻译： 半导体器件（1）包括非易失性存储单元阵列（2），将数据写入非易失性存储单元阵列（2）中并从其读取数据的写/读电路（30），数据输入/输出电路 （80）和包括连接到写入/读取电路（30）并锁存第一数据的第一锁存电路（41）的易失性存储单元阵列（40）和第二锁存电路（42），其连接到 数据输入/输出电路（80）并锁存第二数据。 装置（1）还可以包括根据在第一数据中实际写入的比特数来反转第一数据的逆变器电路（310）和使第二数据被锁存的控制电路（3） 在第二锁存电路（42）中，第一数据被写入非易失性存储单元阵列（2）中。 该半导体器件（1）具有较短的写入时间和较小的电路面积。

公开(公告)号：US20060256617A1

公开(公告)日：2006-11-16

申请号：US11316800

申请日：2005-12-22

申请人： Masaru Yano ,  Hideki Arakawa ,  Hidehiko Shiraiwa

发明人： Masaru Yano ,  Hideki Arakawa ,  Hidehiko Shiraiwa

IPC分类号： G11C16/04

CPC分类号： H01L27/11568 ,  G11C16/0491 ,  H01L27/115 ,  H01L29/792

摘要： A semiconductor device includes a semiconductor substrate, word lines, global bit lines, and inversion gates that form inversion layers serving as local bit lines in the semiconductor substrate. The inversion layers are electrically connected to the global bit lines and a memory cell uses the inversion layers as a source and a drain.

摘要翻译： 半导体器件包括在半导体衬底中形成用作局部位线的反型层的半导体衬底，字线，全局位线和反向栅极。 反转层电连接到全局位线，并且存储单元使用反转层作为源极和漏极。

公开(公告)号：US07321511B2

公开(公告)日：2008-01-22

申请号：US11316800

申请日：2005-12-22

申请人： Masaru Yano ,  Hideki Arakawa ,  Hidehiko Shiraiwa

发明人： Masaru Yano ,  Hideki Arakawa ,  Hidehiko Shiraiwa

IPC分类号： G11C16/04 ,  H01L29/788

CPC分类号： H01L27/11568 ,  G11C16/0491 ,  H01L27/115 ,  H01L29/792

摘要： A semiconductor device includes a semiconductor substrate, word lines, global bit lines, and inversion gates that form inversion layers serving as local bit lines in the semiconductor substrate. The inversion layers are electrically connected to the global bit lines and a memory cell uses the inversion layers as a source and a drain.

摘要翻译： 半导体器件包括在半导体衬底中形成用作局部位线的反型层的半导体衬底，字线，全局位线和反向栅极。 反转层电连接到全局位线，并且存储单元使用反转层作为源极和漏极。

公开(公告)号：US07501677B2

公开(公告)日：2009-03-10

申请号：US11595639

申请日：2006-11-10

申请人： Hidehiko Shiraiwa ,  Jaeyong Park ,  Satoshi Torii ,  Hideki Arakawa ,  Masaru Yano

发明人： Hidehiko Shiraiwa ,  Jaeyong Park ,  Satoshi Torii ,  Hideki Arakawa ,  Masaru Yano

IPC分类号： H01L29/72

CPC分类号： H01L29/792 ,  G11C16/0475 ,  H01L27/115 ,  H01L27/11568 ,  H01L29/66833

摘要： A SONOS memory cell, formed within a semiconductor substrate, includes a bottom dielectric disposed on the semiconductor substrate, a charge trapping material disposed on the bottom dielectric, and a top dielectric disposed on the charge trapping material. Furthermore, the SONOS memory cell includes a word-line gate structure disposed on the top dielectric and at least one bit-line gate for inducing at least one inversion bit-line within the semiconductor substrate.

摘要翻译： 形成在半导体衬底内的SONOS存储单元包括设置在半导体衬底上的底部电介质，设置在底部电介质上的电荷捕获材料和设置在电荷俘获材料上的顶部电介质。 此外，SONOS存储单元包括设置在顶部电介质上的字线栅极结构和用于在半导体衬底内引入至少一个反转位线的至少一个位线栅极。

公开(公告)号：US20070058442A1

公开(公告)日：2007-03-15

申请号：US11595639

申请日：2006-11-10

申请人： Hidehiko Shiraiwa ,  Jaeyong Park ,  Satoshi Torii ,  Hideki Arakawa ,  Masaru Yano

发明人： Hidehiko Shiraiwa ,  Jaeyong Park ,  Satoshi Torii ,  Hideki Arakawa ,  Masaru Yano

IPC分类号： G11C16/04

CPC分类号： H01L29/792 ,  G11C16/0475 ,  H01L27/115 ,  H01L27/11568 ,  H01L29/66833

摘要： A SONOS memory cell, formed within a semiconductor substrate, includes a bottom dielectric disposed on the semiconductor substrate, a charge trapping material disposed on the bottom dielectric, and a top dielectric disposed on the charge trapping material. Furthermore, the SONOS memory cell includes a word-line gate structure disposed on the top dielectric and at least one bit-line gate for inducing at least one inversion bit-line within the semiconductor substrate.

摘要翻译： 形成在半导体衬底内的SONOS存储单元包括设置在半导体衬底上的底部电介质，设置在底部电介质上的电荷捕获材料和设置在电荷俘获材料上的顶部电介质。 此外，SONOS存储单元包括设置在顶部电介质上的字线栅极结构和用于在半导体衬底内引入至少一个反转位线的至少一个位线栅极。