摘要:
An optical wavelength converting apparatus comprises a semiconductor laser, which is capable of oscillating in a multiple longitudinal mode, and an external resonator for resonating a laser beam, which has been radiated out of the semiconductor laser and which serves as a fundamental wave. An optical wavelength converting device is located in an optical path of the fundamental wave, which has been resonated by the external resonator. A device feeds part of the fundamental wave, which has been resonated by the external resonator, back to the semiconductor laser. A wavelength-converted wave in a single longitudinal mode is thereby obtained, which wave has a high intensity and is stable.
摘要:
There is disclosed an optical frequency converter of a bulk resonator structure comprising a ring resonator or V-shaped resonator made of a nonlinear optical crystal. The converter is equipped with a means for returning a laser light emitted by a semiconductor laser resonating inside the resonator to the semiconductor laser. The ring resonator or V-shaped resonator is made small in size and compact. The converter is insusceptible to vibration and needs no adjustment. Returning laser light is produced at less locations. The loss of the output light inside the resonator is reduced. The second harmonic is generated at a high efficiency. Multiple reflection is produced inside the resonator to further enhance the efficiency of the generation of the second harmonic of the laser radiation. Also, the phase of the radiation can be made uniform. The optical density can be increased.
摘要:
A mass spectroscope includes a mass analysis device having a surface provided with metallic members capable of exciting plasmons when irradiated by laser light, the mass analysis device allowing an analyte to be attached to the surface, a light radiation unit for irradiating the surface of the mass analysis device with laser light to ionize the analyte attached to the surface and desorb the analyte from the surface, and a detection unit for detecting a mass of the analyte ionized and desorbed from the surface of the mass analysis device from a time of flight of the analyte. The light radiation unit includes a polarization adjusting mechanism for adjusting a polarization direction of the laser light.
摘要:
A measurement apparatus includes a dielectric block, a thin film layer formed on the dielectric block and brought into contact with a sample, a light source for generating a light beam, an optical incident system for causing the light beam to enter the dielectric block so that the light beam is totally reflected at the interface between the dielectric block and the thin film, and a two-dimensional light detection means for detecting the intensity of the light beam totally reflected at the interface. A predetermined pattern is formed within a region irradiated with the light beam on the dielectric block. The measurement apparatus includes a correction means for correcting an output from the two-dimensional light detection means, based on the pattern, so that an object on the face of the dielectric block is similar to the object detected by the two-dimensional detection means.
摘要:
A Raman spectrum detecting method includes a liquid sample contacting step of placing a liquid sample containing a reference substance and a specimen in contact with a detection surface, the reference substance generating a known Raman spectrum having at least one peak therein that is different from peaks in a Raman spectrum generated by the specimen; a scattered light detecting step of irradiating the detection surface in contact with the liquid sample with an excitation light and detecting Raman scattered light occurring from the liquid sample; and a normalizing step of extracting a Raman spectrum signal of the reference substance and a Raman spectrum signal of the specimen from the signal detected in the scattered light detecting step and normalizing a signal intensity of the Raman spectrum signal of the specimen according to an intensity of the Raman spectrum signal of the reference substance.
摘要:
A near-field light-emitting element includes a transparent medium having a plane of incidence into which a laser beam enters, and a light-condensing plane on which the laser beam having entered the plane of incidence is concentrated, and a metal body provided on the light-condensing plane of the transparent medium having a first surface contacting the light-condensing plane, a second surface opposing the first surface, and an aperture which is formed to penetrate through the first and second surfaces at a position where the laser beam is concentrated and which emits a near-field light obtained from the laser beam. The metal body is arranged apart from a center of the aperture by a predetermined distance to connect together the first and second surfaces, and has a plasmon reflection plane that reflects toward the aperture a surface plasmon excited on the first and second surfaces by the laser beam concentrated at the aperture.
摘要:
A recording medium comprises a substrate and a recording layer overlaid on the substrate. The recording layer comprises a material, which has properties such that, when recording light having a predetermined wavelength λ1 is irradiated to the material, the material is capable of being caused to change into a fluorescent material and such that, when excitation light having a wavelength λ2 is then irradiated to the thus formed fluorescent material, the fluorescent material is capable of being caused to produce fluorescence. The wavelength λ1 of the recording light and the wavelength λ2 of the excitation light may be identical or different. The substrate may be constituted of a material having properties such that, when the excitation light is irradiated to the material, the material does not produce fluorescence having a wavelength identical with the wavelength of the fluorescence produced by the fluorescent material.
摘要:
A recording medium comprises a substrate and a recording layer overlaid on the substrate. The recording layer comprises a material, which has properties such that, when recording light having a predetermined wavelength λ1 is irradiated to the material, the material is capable of being caused to change into a fluorescent material and such that, when excitation light having a wavelength λ2 is then irradiated to the thus formed fluorescent material, the fluorescent material is capable of being caused to produce fluorescence. The wavelength λ1 of the recording light and the wavelength λ2 of the excitation light may be identical or different. The substrate may be constituted of a material having properties such that, when the excitation light is irradiated to the material, the material does not produce fluorescence having a wavelength identical with the wavelength of the fluorescence produced by the fluorescent material.
摘要:
A small-sized measuring apparatus having a stray light suppressing capability for detecting the distribution of optical intensities on the cross section of a light beam having a predetermined wavelength contained in a light beam reflected from a measuring surface by entering a collimated light beam having a large cross sectional area into the measuring surface. A collimated light beam having a sufficient cross sectional area is entered into the interface between a dielectric block and a thin metal film formed on the dielectric block at an angle that satisfies the conditions of total reflection. A light beam having a predetermined wavelength is selected from the light beam totally reflected at the interface to detect the distribution of optical intensities for the selected light beam by the wavelength selecting section capable of eliminating stray light.
摘要:
A sensor utilizing an evanescent wave and comprising a light source for emitting a light beam and a measuring chip formed into the shape of a well. The measuring chip has a dielectric block and a thin film layer formed on one surface of the dielectric block. The sensor also includes an optical system for making the light beam enter the dielectric block at angles of incidence so that a total internal reflection condition is satisfied at an interface between the dielectric block and the thin film layer. The sensor further includes a sample supply-discharge unit which is detachably installed within the measuring chip. The sample supply-discharge unit is used for continuously supplying the sample onto the surface of the thin film layer and continuously discharging the supplied sample from the surface of the thin film layer.