公开(公告)号：US20060049900A1

公开(公告)日：2006-03-09

申请号：US11084864

申请日：2005-03-21

申请人： Meichun Ruan ,  Cheng Wei ,  Jun Shen

发明人： Meichun Ruan ,  Cheng Wei ,  Jun Shen

IPC分类号： H01H51/22

CPC分类号： H01F7/14 ,  H01F17/0006 ,  H01F2007/068 ,  H01H1/20 ,  H01H50/005 ,  H01H51/22 ,  H01H51/2236 ,  H01H2001/0042 ,  H01P1/127

摘要： A micro-machined magnetic latching switch is described. A moveable micro-machined cantilever has a magnetic material and a longitudinal axis. The cantilever has a conducting layer. A permanent magnet produces a first magnetic field, which induces a magnetization in the magnetic material. The magnetization is characterized by a magnetization vector pointing in a direction along the longitudinal axis of the cantilever. The first magnetic field is approximately perpendicular to longitudinal axis. A three-dimensional solenoid coil produces a second magnetic field to switch the cantilever between a first stable state and a second stable state. The temporary current is input to the three-dimensional solenoid coil, producing the second magnetic field such that a component of the second magnetic field parallel to the longitudinal axis changes direction of the magnetization vector. The cantilever is thereby caused to switch between the first stable state and the second stable state.

摘要翻译： 描述了一种微加工的磁性闭锁开关。 可移动的微加工悬臂具有磁性材料和纵向轴线。 悬臂具有导电层。 永磁体产生第一磁场，其引起磁性材料中的磁化。 磁化的特征在于沿着悬臂的纵向轴线的方向指向的磁化矢量。 第一磁场大致垂直于纵轴。 三维电磁线圈产生第二磁场以在第一稳定状态和第二稳定状态之间切换悬臂。 临时电流被输入到三维螺线管线圈，产生第二磁场，使得与纵轴平行的第二磁场的分量改变磁化矢量的方向。 从而使悬臂在第一稳定状态和第二稳定状态之间切换。

公开(公告)号：US20060284629A1

公开(公告)日：2006-12-21

申请号：US11362281

申请日：2006-02-27

申请人： Cheng Wei ,  Jun Shen

发明人： Cheng Wei ,  Jun Shen

IPC分类号： G01R31/02

CPC分类号： H01H50/005 ,  B81C99/005 ,  H01H11/0062 ,  H01H2050/007

摘要： A method, system, and apparatus for testing one or more micro-magnetic switches on a wafer is described. A magnet is positioned adjacent to a first switch on the wafer. A probe card is positioned adjacent to the first switch. The probe card mounts a first set of probes and a second set of probes. The first set of probes interface with contact areas of a coil associated with the first switch. The second set of probes interface with conductors on the wafer associated with the cantilever of the first switch. A current source is electrically coupled to the first set of probes. The current source activates the coil of the first switch using the first set of probes to switch the cantilever from a first state to a second state. A switch state monitor is electrically coupled to the second set of probes. The switch state monitor determines whether the cantilever of the first switch is in the first state prior to the current source activating the coil of the first switch. The switch state monitor also determines whether the cantilever is in the second state after the current source activates the coil of the first switch. A stepper motor moves the wafer relative to the magnet and probe card to test further switches on the wafer. An inker marks a switch on the wafer that has been determined by the switch state monitor to be defective.

摘要翻译： 描述了用于测试晶片上的一个或多个微型磁性开关的方法，系统和装置。 磁体定位成与晶片上的第一开关相邻。 探针卡位于与第一开关相邻的位置。 探针卡安装第一组探头和第二组探头。 第一组探头与与第一开关相关联的线圈的接触区域接合。 第二组探头与与第一开关的悬臂相关联的晶片上的导体接合。 电流源电耦合到第一组探针。 电流源使用第一组探针激活第一开关的线圈，以将悬臂从第一状态切换到第二状态。 开关状态监视器电耦合到第二组探头。 开关状态监视器确定在当前源激活第一开关的线圈之前，第一开关的悬臂是否处于第一状态。 开关状态监视器还确定在电流源激活第一开关的线圈之后悬臂是否处于第二状态。 步进电机使晶片相对于磁体和探针卡移动，以测试晶片上的其它开关。 打印机将由开关状态监视器确定的晶片上的开关标记为有缺陷。

公开(公告)号：US20060082427A1

公开(公告)日：2006-04-20

申请号：US11100637

申请日：2005-04-07

申请人： Junho Joung ,  Jun Shen ,  Cheng Wei

发明人： Junho Joung ,  Jun Shen ,  Cheng Wei

IPC分类号： H01H51/22

CPC分类号： H01H50/005 ,  H01H2050/007

摘要： Methods, systems, and apparatuses are disclosed for magnetically-actuated relays/switches that suppress cantilever and/or hinge deformation. A permanent magnet produces a first magnetic field. A movable element is held between a pair of axially-aligned, rotationally flexible hinges. A space is present between the permanent magnet and the movable element. The space allows at least one end portion of the movable element to move toward the permanent magnet. A bar member is positioned in the space. A coil produces a second magnetic field to switch the moveable element between first and second stable states. At least the central portion of the movable element is magnetically attracted toward the permanent magnet. The bar member physically prevents the central portion of the movable element from flexing toward the permanent magnet due to the magnetic attraction.

摘要翻译： 公开了用于抑制悬臂和/或铰链变形的磁致动继电器/开关的方法，系统和装置。 永磁体产生第一磁场。 可移动元件保持在一对轴向对齐的旋转柔性铰链之间。 在永磁体和可动元件之间存在空间。 该空间允许可移动元件的至少一个端部向永磁体移动。 酒吧会员位于空间。 线圈产生第二磁场以在第一和第二稳定状态之间切换可移动元件。 至少可移动元件的中心部分被磁性吸引到永磁体。 由于磁吸引力，杆件物理地防止可移动元件的中心部分朝向永久磁铁弯曲。

公开(公告)号：US20050012576A1

公开(公告)日：2005-01-20

申请号：US10823786

申请日：2004-04-14

申请人： Cheng Wei ,  Jun Shen

发明人： Cheng Wei ,  Jun Shen

IPC分类号： H01H11/00 ,  H01H50/00 ,  H01H51/22

CPC分类号： H01H50/005 ,  B81C99/005 ,  H01H11/0062 ,  H01H2050/007

摘要： A method, system, and apparatus for testing one or more micro-magnetic switches on a wafer is described. A magnet is positioned adjacent to a first switch on the wafer. A probe card is positioned adjacent to the first switch. The probe card mounts a first set of probes and a second set of probes. The first set of probes interface with contact areas of a coil associated with the first switch. The second set of probes interface with conductors on the wafer associated with the cantilever of the first switch. A current source is electrically coupled to the first set of probes. The current source activates the coil of the first switch using the first set of probes to switch the cantilever from a first state to a second state. A switch state monitor is electrically coupled to the second set of probes. The switch state monitor determines whether the cantilever of the first switch is in the first state prior to the current source activating the coil of the first switch. The switch state monitor also determines whether the cantilever is in the second state after the current source activates the coil of the first switch. A stepper motor moves the wafer relative to the magnet and probe card to test further switches on the wafer. An inker marks a switch on the wafer that has been determined by the switch state monitor to be defective.

摘要翻译： 描述了用于测试晶片上的一个或多个微型磁性开关的方法，系统和装置。 磁体定位成与晶片上的第一开关相邻。 探针卡位于第一开关附近。 探针卡安装第一组探头和第二组探头。 第一组探头与与第一开关相关联的线圈的接触区域接合。 第二组探头与与第一开关的悬臂相关联的晶片上的导体接合。 电流源电耦合到第一组探针。 电流源使用第一组探针激活第一开关的线圈，以将悬臂从第一状态切换到第二状态。 开关状态监视器电耦合到第二组探头。 开关状态监视器确定在当前源激活第一开关的线圈之前，第一开关的悬臂是否处于第一状态。 开关状态监视器还确定在电流源激活第一开关的线圈之后悬臂是否处于第二状态。 步进电机使晶片相对于磁体和探针卡移动，以测试晶片上的其它开关。 打印机将由开关状态监视器确定的晶片上的开关标记为有缺陷。

公开(公告)号：US20060146470A1

公开(公告)日：2006-07-06

申请号：US11179809

申请日：2005-07-13

申请人： Jun Shen ,  Cheng Wei

发明人： Jun Shen ,  Cheng Wei

IPC分类号： H01H47/00

CPC分类号： H01H50/005 ,  H01H67/22 ,  H01H2050/007

摘要： Systems and methods for actuating micro-magnetic latching switches in an array of micro-magnetic latching switches are described. The array of switches is defined by Y rows aligned with a first axis and X columns aligned with a second axis. Each switch in the array of switches is capable of being actuated by a coil. In an aspect, a row of coils is moved along the second axis to be positioned adjacent to a selected one of the Y rows of switches. A sufficient driving current is proved to a selected coil in the row of coils to actuate a selected switch in the selected one of the Y rows of switches. In another aspect, a plurality of first axis drive signals and a plurality of second axis drive signals are generated. These signals drive an array of coils, wherein each coil in the array of coils is positioned adjacent to a corresponding switch in the array of switches. Each first axis drive signal is coupled to coils in a corresponding column of coils in the array of coils. Each second axis drive signal is coupled to coils in a corresponding row of coils in the array of coils. In another aspect, a three-dimensional array of switches is actuated by drive signals that drive a three-dimensional array of coils.

公开(公告)号：US20050057329A1

公开(公告)日：2005-03-17

申请号：US10740837

申请日：2003-12-22

申请人： Jun Shen ,  Cheng Wei

发明人： Jun Shen ,  Cheng Wei

IPC分类号： H01H59/00 ,  H01H51/22

CPC分类号： H01H59/0009 ,  H01H50/005

摘要： Methods and systems of assembling and making laminated electro-mechanical system (LEMS) switches are described. A plurality of structural layers are formed that include at least two structural layers that each include a flexible member. The plurality of structural layers are stacked and aligned into a stack, to form at least one switch. Each structural layer in the stack is attached to an adjacent structural layer of the stack. When the formed switch is in an “on” state, the first flexible member is in contact with the second flexible member. When making contact with the second flexible member, the second flexible member flexes in response. In a further aspect, three flexible members may be present. When the switch is in an “on” state, the first flexible member is in contact with the second and third flexible members. When making contact with the second and third flexible members, the second and third flexible members flex in response.

摘要翻译： 描述了组装和制造层压机电系统（LEMS）开关的方法和系统。 形成多个结构层，其包括至少两个各自包括柔性构件的结构层。 多个结构层被堆叠并对准成堆叠，以形成至少一个开关。 堆叠中的每个结构层连接到堆叠的相邻结构层。 当所形成的开关处于“接通”状态时，第一柔性构件与第二柔性构件接触。 当与第二柔性构件接触时，第二柔性构件作为响应而弯曲。 在另一方面，可以存在三个柔性构件。 当开关处于“开”状态时，第一柔性构件与第二和第三柔性构件接触。 当与第二和第三柔性构件接触时，第二和第三柔性构件作为响应弯曲。

公开(公告)号：US20060111803A1

公开(公告)日：2006-05-25

申请号：US10994078

申请日：2004-11-19

申请人： Yen-Pu Hsu ,  Cheng Wei ,  Mei-Jen Wu

发明人： Yen-Pu Hsu ,  Cheng Wei ,  Mei-Jen Wu

IPC分类号： G06F19/00

CPC分类号： G06Q10/06

摘要： A computer implemented method for estimating manufacturing target bias for products in manufacturing tools. The method first establishes a first data set according to manufacturing target bias history based on a correlation with tools used. The manufacturing tools comprise a first manufacturing tool and other manufacturing tools. Next, a testing operation is executed for a predicted product in the first manufacturing tool to obtain a first predicted manufacturing target bias. Finally, manufacturing target bias of the predicted product in the other manufacturing tools is calculated according to the first data set and the first predicted manufacturing target bias.

摘要翻译： 一种用于估计制造工具中产品的制造目标偏差的计算机实现方法。 该方法首先基于与使用的工具的相关性，根据制造目标偏差历史来建立第一数据集。 制造工具包括第一制造工具和其他制造工具。 接下来，对第一制造工具中的预测产品执行测试操作，以获得第一预测制造目标偏差。 最后，根据第一数据集和第一预测制造目标偏差来计算其他制造工具中的预测产品的制造目标偏差。

公开(公告)号：US5232003A

公开(公告)日：1993-08-03

申请号：US924804

申请日：1992-08-04

申请人： Hsu C. Wei ,  Cheng Wei

发明人： Hsu C. Wei ,  Cheng Wei

IPC分类号： G02C13/00

CPC分类号： A45C11/005 ,  G02C13/008 ,  Y10S134/901

摘要： A soft contact lens cleaner for cleaning soft contact lenses by stirring a soft contact lens cleaning solution. The cleaner includes a container which contains a soft contact lens cleaning solution, a container cap covered on the container, a rotary cap covered on the container cap to rotate a rotary plug cap, a lens holder assembly suspended from the rotary plug cap by a suspension frame inside the container. Soft cushions and gloves with raised grains are received in chambers inside the lens holder assembly and rotated by the rotary plug cap to stir the soft contact lens cleaning solution in washing and sterilizing the soft contact lenses in the lens holder assembly.

摘要翻译： 一种柔软的隐形眼镜清洁剂，用于通过搅拌软性隐形眼镜清洁溶液清洁软性隐形眼镜。 该清洁器包括一个容纳有一个软的隐形眼镜清洁溶液的容器，一个盖在容器上的容器盖，一个覆盖在容器帽上以旋转旋转塞帽的旋转帽，一个通过悬挂悬挂在旋转塞帽上的透镜架组件 框架内容器。 柔软的垫子和具有凸起的颗粒的手套被容纳在透镜保持器组件内的腔室中并且被旋转塞帽旋转，以便在透镜保持器组件中对软性隐形眼镜进行清洗和消毒时搅动软性隐形眼镜清洁溶液。