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公开(公告)号：US20140164859A1
公开(公告)日：2014-06-12
申请号：US14063166
申请日：2013-10-25
发明人： Yu Huang , Huaxing Tang , Wu-Tung Cheng , Robert Brady Benware , Manish Sharma , Xiaoxin Fan
IPC分类号： G01R31/3177
CPC分类号： G01R31/318536 , G01R31/318541
摘要： Aspects of the invention relate to techniques for chain fault diagnosis based on dynamic circuit design partitioning. Fan-out cones for scan cells of one or more faulty scan chains of a circuit design are determined and combined to derive a forward-tracing cone. Fan-in cones for scan cells of the one or more faulty scan chains and for failing observation points of the circuit design are determined and combined to derive a backward-tracing cone. By determining intersection of the forward-tracing cone and the backward-tracing cone, a chain diagnosis sub-circuit for the test failure file is generated. Using the process, a plurality of chain diagnosis sub-circuits may be generated for a plurality of test failure files. Scan chain fault diagnosis may then be performed on the plurality of chain diagnosis sub-circuits with a plurality of computers.
摘要翻译： 本发明的方面涉及基于动态电路设计划分的链路故障诊断技术。 确定并组合电路设计的一个或多个故障扫描链的扫描单元的扇出锥，以导出前向跟踪锥。 确定并组合一个或多个故障扫描链的扫描单元和电路设计的故障观察点的扇形锥，以导出后向跟踪锥。 通过确定前向跟踪锥和向后跟踪锥的交点，产生用于测试失败文件的链诊断子电路。 使用该过程，可以为多个测试失败文件生成多个链诊断子电路。 然后可以利用多台计算机在多条链诊断子电路上执行扫描链故障诊断。
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公开(公告)号：US20140101506A1
公开(公告)日：2014-04-10
申请号：US14100774
申请日：2013-12-09
IPC分类号： G01R31/3177
CPC分类号： G01R31/3177 , G01R31/318563 , G06F11/2242
摘要： Disclosed are representative embodiments of methods, apparatus, and systems for partitioning-based Test Access Mechanisms (TAM). Test response data are captured by scan cells of a plurality scan chains in a circuit under test and are compared with test response data expected for a good CUT to generate check values. Based on the check values, partition pass/fail signals are generated by partitioning scheme generators. Each of the partitioning scheme generators is configured to generate one of the partition pass/fail signals for one of partitioning schemes. A partitioning scheme divides the scan cells into a set of non-overlapping partitions. Based on the partition pass/fail signals, a failure diagnosis process may be performed.
摘要翻译： 公开了用于基于分区的测试访问机制（TAM）的方法，装置和系统的代表性实施例。 测试响应数据由被测电路中的多个扫描链的扫描单元捕获，并与预期的良好CUT的测试响应数据进行比较以产生检查值。 基于检查值，分区通过/失败信号由分区方案生成器生成。 每个分区方案生成器被配置为为分区方案之一生成分区通过/失败信号之一。 分区方案将扫描单元划分为一组非重叠分区。 基于分区通过/失败信号，可以执行故障诊断处理。
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公开(公告)号：US20130145213A1
公开(公告)日：2013-06-06
申请号：US13680447
申请日：2012-11-19
发明人： Huaxing Tang , Yu Huang , We-Tung Cheng , Robert Brady Benware , Xiaoxin Fan
IPC分类号： G06F11/26
CPC分类号： G01R31/31703 , G01R31/3177 , G06F11/26
摘要： Aspects of the invention relate to techniques for fault diagnosis based on dynamic circuit design partitioning. According to various implementations of the invention, a sub-circuit is extracted from a circuit design based on failure information of one or more integrated circuit devices. The extraction process may comprise combining fan-in cones of failing observation points included in the failure information. The extraction process may further comprise adding fan-in cones of one or more passing observation points to the combined fan-in cones of the failing observation points. Clock information of test patterns and/or layout information of the circuit design may be extracted and used in the sub-circuit extraction process. The extracted sub-circuit may then be used for diagnosing the one or more integrated circuit devices.
摘要翻译： 本发明的方面涉及基于动态电路设计划分的故障诊断技术。 根据本发明的各种实施方式，基于一个或多个集成电路装置的故障信息从电路设计中提取子电路。 提取过程可以包括组合包括在故障信息中的故障观察点的扇入锥。 提取过程还可以包括将一个或多个通过观察点的扇入锥体添加到故障观察点的组合扇入锥体中。 可以在子电路提取处理中提取并使用电路设计的测试图案和/或布局信息的时钟信息。 所提取的子电路然后可以用于诊断一个或多个集成电路器件。
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公开(公告)号：US20170103158A1
公开(公告)日：2017-04-13
申请号：US15263014
申请日：2016-09-12
发明人： Robert Brady Benware , Wu-Tung Cheng , Christopher Schuermyer , Jonathan J. Muirhead , Chen-Yi Chang
IPC分类号： G06F17/50
摘要： Aspects of the invention relate to yield analysis techniques for generating root cause candidates for yield analysis. With various implementations of the invention, points of interest are first identified in a layout design. Next, regions of interest are determined for the identified points of interest. Next, one or more properties are extracted from the regions of interest. Based at least on the one or more properties, diagnosis reports of failing devices fabricated according to the layout design are analyzed to identify probable root causes.
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公开(公告)号：US09378327B2
公开(公告)日：2016-06-28
申请号：US14537504
申请日：2014-11-10
CPC分类号： G06F17/5081 , G06F2217/12 , Y02P90/265
摘要： Aspects of the disclosed technology relate to techniques for determining canonical forms of layout patterns. Coordinates of vertices of geometric elements in a window of a layout design are first transformed into new coordinates of the vertices, wherein the coordinates of vertices do not comprise clipped coordinates and the transforming comprises: performing a translation on the coordinates of vertices based on differences between maximum and minimum X/Y coordinate values of the vertices. Based on sums of X/Y coordinate values of the new coordinates of the vertices, a canonical form of the geometric elements is determined. The canonical form coordinates of the vertices may then be determined and sorted. The sorted canonical form coordinates may be employed for pattern matching.
摘要翻译： 所公开技术的方面涉及用于确定规范形式的布局模式的技术。 首先将布局设计的窗口中的几何元素的顶点的坐标变换为顶点的新坐标，其中顶点的坐标不包括剪切坐标，并且变换包括：基于顶点的坐标 顶点的最大和最小X / Y坐标值。 基于顶点的新坐标的X / Y坐标值的和，确定几何元素的规范形式。 然后可以确定和排序顶点的规范形式坐标。 排序的规范形式坐标可以用于模式匹配。
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公开(公告)号：US09336107B2
公开(公告)日：2016-05-10
申请号：US13680447
申请日：2012-11-19
发明人： Huaxing Tang , Yu Huang , Wu-Tung Cheng , Robert Brady Benware , Xiaoxin Fan
CPC分类号： G01R31/31703 , G01R31/3177 , G06F11/26
摘要： Aspects of the invention relate to techniques for fault diagnosis based on dynamic circuit design partitioning. According to various implementations of the invention, a sub-circuit is extracted from a circuit design based on failure information of one or more integrated circuit devices. The extraction process may comprise combining fan-in cones of failing observation points included in the failure information. The extraction process may further comprise adding fan-in cones of one or more passing observation points to the combined fan-in cones of the failing observation points. Clock information of test patterns and/or layout information of the circuit design may be extracted and used in the sub-circuit extraction process. The extracted sub-circuit may then be used for diagnosing the one or more integrated circuit devices.
摘要翻译： 本发明的方面涉及基于动态电路设计划分的故障诊断技术。 根据本发明的各种实施方式，基于一个或多个集成电路装置的故障信息从电路设计中提取子电路。 提取过程可以包括组合包括在故障信息中的故障观察点的扇入锥。 提取过程还可以包括将一个或多个通过观察点的扇入锥体添加到故障观察点的组合扇入锥体中。 可以在子电路提取处理中提取并使用电路设计的测试图案和/或布局信息的时钟信息。 所提取的子电路然后可以用于诊断一个或多个集成电路器件。
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公开(公告)号：US20140059511A1
公开(公告)日：2014-02-27
申请号：US13973998
申请日：2013-08-22
发明人： Robert Brady Benware , Wu-Tung Cheng , Christopher Schuermyer , Jonathan J. Muirhead , Leo Chang
IPC分类号： G06F17/50
CPC分类号： G06F17/5081 , G06F17/5068 , G06F2217/12
摘要： Aspects of the invention relate to yield analysis techniques for generating root cause candidates for yield analysis. With various implementations of the invention, points of interest are first identified in a layout design. Next, regions of interest are determined for the identified points of interest. Next, one or more properties are extracted from the regions of interest. Based at least on the one or more properties, diagnosis reports of failing devices fabricated according to the layout design are analyzed to identify probable root causes.
摘要翻译： 本发明的方面涉及用于产生产量分析的根本原因的产量分析技术。 通过本发明的各种实现，首先在布局设计中识别兴趣点。 接下来，确定感兴趣的兴趣点。 接下来，从感兴趣的区域提取一个或多个属性。 至少基于一个或多个属性，分析根据布局设计制造的故障设备的诊断报告，以识别可能的根本原因。
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公开(公告)号：US10234502B1
公开(公告)日：2019-03-19
申请号：US15454909
申请日：2017-03-09
IPC分类号： G01R31/28 , G01R31/317 , G01R31/3177
摘要： Various aspects of the disclosed technology relate to circuit defect diagnosis based on sink cell fault models. Defect candidates are determined based on path-tracing from failing bits into the circuit design. Based on the defect candidates and one or more conventional fault models, failing test pattern simulations are performed to determine initial defect suspects. Initial defective sink cell suspects are then determined by comparing driving strengths for fan-out cells of the initial defect suspects with driving strengths for corresponding driver cells. Defective sink cell suspects may be identified in the initial defective sink cell suspects based on fault effect propagations and passing test pattern simulations.
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公开(公告)号：US09244125B2
公开(公告)日：2016-01-26
申请号：US14063166
申请日：2013-10-25
发明人： Yu Huang , Huaxing Tang , Wu-Tung Cheng , Robert Brady Benware , Manish Sharma , Xiaoxin Fan
IPC分类号： G01R31/3177 , G01R31/3185 , G01R31/40
CPC分类号： G01R31/318536 , G01R31/318541
摘要： Aspects of the invention relate to techniques for chain fault diagnosis based on dynamic circuit design partitioning. Fan-out cones for scan cells of one or more faulty scan chains of a circuit design are determined and combined to derive a forward-tracing cone. Fan-in cones for scan cells of the one or more faulty scan chains and for failing observation points of the circuit design are determined and combined to derive a backward-tracing cone. By determining intersection of the forward-tracing cone and the backward-tracing cone, a chain diagnosis sub-circuit for the test failure file is generated. Using the process, a plurality of chain diagnosis sub-circuits may be generated for a plurality of test failure files. Scan chain fault diagnosis may then be performed on the plurality of chain diagnosis sub-circuits with a plurality of computers.
摘要翻译： 本发明的方面涉及基于动态电路设计划分的链路故障诊断技术。 确定并组合电路设计的一个或多个故障扫描链的扫描单元的扇出锥，以导出前向跟踪锥。 确定并组合一个或多个故障扫描链的扫描单元和电路设计的故障观察点的扇形锥，以导出后向跟踪锥。 通过确定前向跟踪锥和向后跟踪锥的交点，产生用于测试失败文件的链诊断子电路。 使用该过程，可以为多个测试失败文件生成多个链诊断子电路。 然后可以利用多台计算机在多条链诊断子电路上执行扫描链故障诊断。
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公开(公告)号：US09443051B2
公开(公告)日：2016-09-13
申请号：US13973998
申请日：2013-08-22
发明人： Robert Brady Benware , Wu-Tung Cheng , Christopher Schuermyer , Jonathan J Muirhead , Chen-Yi Chang
CPC分类号： G06F17/5081 , G06F17/5068 , G06F2217/12
摘要： Aspects of the invention relate to yield analysis techniques for generating root cause candidates for yield analysis. With various implementations of the invention, points of interest are first identified in a layout design. Next, regions of interest are determined for the identified points of interest. Next, one or more properties are extracted from the regions of interest. Based at least on the one or more properties, diagnosis reports of failing devices fabricated according to the layout design are analyzed to identify probable root causes.
摘要翻译： 本发明的方面涉及用于产生产量分析的根本原因的产量分析技术。 通过本发明的各种实现，首先在布局设计中识别兴趣点。 接下来，确定感兴趣的兴趣点。 接下来，从感兴趣的区域提取一个或多个属性。 至少基于一个或多个属性，分析根据布局设计制造的故障设备的诊断报告，以识别可能的根本原因。
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