PHASE PLATE AND FABRICATION METHOD FOR COLOR-SEPARATED LASER BACKLIGHT IN DISPLAY SYSTEMS

    公开(公告)号:US20230244185A1

    公开(公告)日:2023-08-03

    申请号:US18100698

    申请日:2023-01-24

    CPC classification number: G03H1/0402 G03F7/70408 G03H2260/12 G03H2223/13

    Abstract: According to examples, a method for phase plate fabrication may be described herein. The method may include providing an interferometer configuration to generate a hologram of a plurality of pinholes. In some examples, the interferometer configuration includes a substrate for photopolymer attachment, a photopolymer having a predetermined thickness, and an exposure mask with a plurality of pinholes. The method may also include exposing the photopolymer with collimated light, via a laser source, through the exposure mask with a plurality of pinholes, wherein the collimated light passes through the exposure mask itself to create a collimated beam, and the plurality of pinholes of the exposure mask to create a spherical wavefront. The collimated beam and the spherical wavefront may help generate the hologram on the photopolymer for use as a phase plate for improved light transmissivity in display systems.

    WAVEGUIDE COMBINER WITH IN-PLANE RELAY AND WAVEGUIDE DISPLAY SYSTEM INCLUDING THE SAME

    公开(公告)号:US20250060522A1

    公开(公告)日:2025-02-20

    申请号:US18781931

    申请日:2024-07-23

    Inventor: Jian XU Joshua COBB

    Abstract: A system includes a waveguide configured to guide an in-coupled image light to propagate inside the waveguide via total internal reflection. The system also includes an in-coupling element configured to couple an input image light into the waveguide as the in-coupled image light. The system also includes a plurality of partial reflectors at least partially embedded inside the waveguide. The system further includes an in-plane relay at least partially embedded inside the waveguide and disposed between the in-coupling element and the partial reflectors. The in-plane relay includes a plurality of cylindrical reflectors. The in-plane relay is configured to convert the in-coupled image light received from the in-coupling element into a relayed image light.

    IMAGE-SENSOR-BASED SCATTERING MEASUREMENT SYSTEM AND METHOD

    公开(公告)号:US20250137927A1

    公开(公告)日:2025-05-01

    申请号:US17979226

    申请日:2022-11-02

    Inventor: Jian XU

    Abstract: A system is provided. The system includes a light source configured to emit a probing beam to illuminate an optical element. The system also includes an image sensor configured to be rotatable around the optical element within a predetermined rotation range. The system also includes a controller configured to control the image senor to move to a plurality of angular sub-ranges of the predetermined rotation range to receive a plurality of scattered beams output from the optical element. The image sensor is configured to generate a plurality of sets of speckle pattern image data based on the received scattered beams. The sets of speckle pattern image data provide two-dimensional (“2D”) spatial information of speckles.

    SYSTEM AND METHOD FOR SEPARATING VOLUMETRIC AND SURFACE SCATTERING OF OPTICAL COMPONENT

    公开(公告)号:US20230296510A1

    公开(公告)日:2023-09-21

    申请号:US17733985

    申请日:2022-04-29

    Inventor: Jian XU

    Abstract: A system includes a light source configured to emit a probing beam to illuminate an optical element, and a rotating structure to which the optical element is mounted. The system also includes a controller configured to control the rotating structure to rotate to change a tilt angle of the optical element with respect to a propagation direction of the probing beam. The system also includes an image sensor configured to receive one or more scattered beams output from the optical element illuminated by the probing beam, and generate a plurality of sets of speckle pattern image data when the optical element is arranged at a plurality of tilt angles within a predetermined tilting range. The controller is configured to process the plurality of sets of speckle pattern image data to determine respective weights of volumetric scattering and surface scattering in an overall scattering of the optical element.

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