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    Method and apparatus for manufacturing data indexing
    1.
    发明申请
    Method and apparatus for manufacturing data indexing 有权
    用于制造数据索引的方法和装置

    公开(公告)号：US20070179663A1

    公开(公告)日：2007-08-02

    申请号：US11341701

    申请日：2006-01-27

    申请人： Michael McIntyre ,  Alex Bierwag ,  Charlie Reading ,  Alfredo Herrera

    发明人： Michael McIntyre ,  Alex Bierwag ,  Charlie Reading ,  Alfredo Herrera

    IPC分类号： G06F19/00

    CPC分类号： G05B23/0229 ,  G05B23/0264 ,  Y10S707/99936 ,  Y10S707/99937 ,  Y10S707/99942

    摘要： A method, apparatus, and a system for generating an index for storing data. A pattern associated with a first set of data is determined. The first set of data is stored. A determination is made as to whether the pattern associated with a second set of data corresponds to the pattern associated with the first set of data. An index associated with the first set of data is correlated to the second set of data in response to determining that the pattern associated with the second set of data corresponds to the pattern associated with the first set of data.

    摘要翻译： 一种用于生成用于存储数据的索引的方法，装置和系统。 确定与第一组数据相关联的模式。 第一组数据被存储。 确定与第二组数据相关联的模式是否对应于与第一组数据相关联的模式。 响应于确定与第二组数据相关联的模式对应于与第一组数据相关联的模式，与第一组数据相关联的索引与第二组数据相关。

    Device level identification methodology
    3.
    发明授权
    Device level identification methodology 有权
    设备级识别方法

    公开(公告)号：US6063685A

    公开(公告)日：2000-05-16

    申请号：US131284

    申请日：1998-08-07

    申请人： Paul J. Steffan ,  Michael McIntyre ,  Charlie Reading

    发明人： Paul J. Steffan ,  Michael McIntyre ,  Charlie Reading

    IPC分类号： H01L23/544 ,  H01L21/76

    CPC分类号： H01L23/544 ,  H01L2223/54406 ,  H01L2223/54433 ,  H01L2223/54473 ,  H01L2223/5448 ,  H01L2924/0002

    摘要： A method of identifying individual semiconductor devices with a unique inscription during the manufacturing process for the semiconductor devices. Each individual semiconductor device is marked during a final lithographic stepping exposure with a direct write laser mounted either in the stepper in the lithographic system working concurrently with the stepping fields during the final metal layer lithographic stepping exposure or during a post stepping pre-development treatment. The marking on the devices includes device identification, lot number and die number.

    摘要翻译： 一种在半导体器件的制造过程中识别具有独特铭文的各个半导体器件的方法。 每个单独的半导体器件在最终光刻步进曝光期间被标记，其中直接写入激光器安装在光刻系统中的步进器中，与最终金属层光刻步进曝光期间或在后期步进预处理中的步进场同时工作。 设备上的标记包括设备识别，批号和裸号。