Optical system, in particular illumination system, of a microlithographic projection exposure apparatus
    1.
    发明申请
    Optical system, in particular illumination system, of a microlithographic projection exposure apparatus 有权
    光学系统,特别是照明系统,微光刻投影曝光装置

    公开(公告)号:US20050152046A1

    公开(公告)日:2005-07-14

    申请号:US11014199

    申请日:2004-12-16

    摘要: An optical system, particularly an illumination system, of a microlithographic projection exposure apparatus contains at least one plane reflecting surface for folding the beam path. The at least one reflecting surface is arranged with respect to an optical axis of the optical system such that the intensity ratio between two mutually perpendicular polarization directions is at least substantially preserved for an axially parallel light ray deviated by the at least one reflecting surface. In accordance with a second aspect, the at least one reflecting surface is arranged such that a maximum effect on the polarization of the projection light is achieved, so as to be able to compensate for polarization dependencies which occur in other components of the illumination system.

    摘要翻译: 微光刻投影曝光装置的光学系统,特别是照明系统包含用于折叠光束路径的至少一个平面反射表面。 所述至少一个反射表面相对于所述光学系统的光轴布置,使得对于由所述至少一个反射表面偏离的轴向平行的光线,至少基本上保留了两个相互垂直的偏振方向之间的强度比。 根据第二方面,至少一个反射表面被布置成使得能够实现对投射光的极化的最大影响,以便能够补偿在照明系统的其它部件中发生的偏振依赖性。

    Optical system of a microlithographic projection exposure apparatus
    5.
    发明授权
    Optical system of a microlithographic projection exposure apparatus 有权
    微光刻投影曝光装置的光学系统

    公开(公告)号:US08237918B2

    公开(公告)日:2012-08-07

    申请号:US12498475

    申请日:2009-07-07

    IPC分类号: G03B27/72

    CPC分类号: G03F7/70566

    摘要: An optical system, such as an illumination device or a projection objective of a microlithographic projection exposure apparatus, is disclosed. The optical system can include a polarization compensator which has at least one polarization-modifying partial element. The optical system can also include a manipulator by which the position of the at least one partial element can be altered. At least one operating mode of the optical system can be set in which the intensity, over a region which belongs to a plane perpendicular to the optical axis and which can be illuminated with light from the light source, does not exceed 20% of the maximum intensity in the plane, and the manipulator is arranged in the region.

    摘要翻译: 公开了一种光学系统,例如微光刻投影曝光装置的照明装置或投影物镜。 光学系统可以包括具有至少一个偏振修正部分元件的偏振补偿器。 光学系统还可以包括操纵器,通过该操纵器可以改变至少一个部分元件的位置。 可以设置光学系统的至少一种操作模式,其中在属于垂直于光轴并且可以用来自光源的光照射的平面的区域上的强度不超过最大值的20% 平面内的强度,机械手配置在该区域。

    OPTICAL SYSTEM OF A MICROLITHOGRAPHIC PROJECTION EXPOSURE APPARATUS
    7.
    发明申请
    OPTICAL SYSTEM OF A MICROLITHOGRAPHIC PROJECTION EXPOSURE APPARATUS 有权
    微波投影曝光装置的光学系统

    公开(公告)号:US20090323042A1

    公开(公告)日:2009-12-31

    申请号:US12498475

    申请日:2009-07-07

    IPC分类号: G03F7/20 G03B27/72 G02B27/28

    CPC分类号: G03F7/70566

    摘要: An optical system, such as an illumination device or a projection objective of a microlithographic projection exposure apparatus, is disclosed. The optical system can include a polarization compensator which has at least one polarization-modifying partial element. The optical system can also include a manipulator by which the position of the at least one partial element can be altered. At least one operating mode of the optical system can be set in which the intensity, over a region which belongs to a plane perpendicular to the optical axis and which can be illuminated with light from the light source, does not exceed 20% of the maximum intensity in the plane, and the manipulator is arranged in the region.

    摘要翻译: 公开了一种光学系统,例如微光刻投影曝光装置的照明装置或投影物镜。 光学系统可以包括具有至少一个偏振修正部分元件的偏振补偿器。 光学系统还可以包括操纵器,通过该操纵器可以改变至少一个部分元件的位置。 可以设置光学系统的至少一种操作模式,其中在属于垂直于光轴并且可以用来自光源的光照射的平面的区域上的强度不超过最大值的20% 平面内的强度,机械手配置在该区域。

    Optical system, in particular illumination system, of a microlithographic projection exposure apparatus
    8.
    发明授权
    Optical system, in particular illumination system, of a microlithographic projection exposure apparatus 有权
    光学系统,特别是照明系统,微光刻投影曝光装置

    公开(公告)号:US07405808B2

    公开(公告)日:2008-07-29

    申请号:US11014199

    申请日:2004-12-16

    IPC分类号: G03B27/54 G03B27/42 G02B5/08

    摘要: An optical system, particularly an illumination system, of a microlithographic projection exposure apparatus contains at least one plane reflecting surface for folding the beam path. The at least one reflecting surface is arranged with respect to an optical axis of the optical system such that the intensity ratio between two mutually perpendicular polarization directions is at least substantially preserved for an axially parallel light ray deviated by the at least one reflecting surface. In accordance with a second aspect, the at least one reflecting surface is arranged such that a maximum effect on the polarization of the projection light is achieved, so as to be able to compensate for polarization dependencies which occur in other components of the illumination system.

    摘要翻译: 微光刻投影曝光装置的光学系统,特别是照明系统包含用于折叠光束路径的至少一个平面反射表面。 所述至少一个反射表面相对于所述光学系统的光轴布置,使得对于由所述至少一个反射表面偏离的轴向平行的光线,至少基本上保留了两个相互垂直的偏振方向之间的强度比。 根据第二方面,至少一个反射表面被布置成使得能够实现对投射光的极化的最大影响,以便能够补偿在照明系统的其它部件中发生的偏振依赖性。