公开(公告)号：US20150055408A1

公开(公告)日：2015-02-26

申请号：US14528976

申请日：2014-10-30

Applicant: Micron Technology, Inc.

Inventor： Hernan Castro ,  Timothy C. Langtry ,  Richard Dodge ,  IIya Karpov

IPC: G11C13/00

CPC classification number: G11C13/004 ,  G11C13/0004 ,  G11C13/0061 ,  G11C13/0064 ,  G11C2013/0052

Abstract: Embodiments disclosed herein may relate to applying verify or read pulses for phase change memory and switch (PCMS) devices. The read pulses may be applied at a first voltage for a first period of time. A threshold event for the phase change memory cell may be detected during a sense window. The sense window may close after the expiration of the first period of time for which the read pulses are applied.

Abstract translation: 本文公开的实施例可以涉及为相变存储器和开关（PCMS）装置应用验证或读取脉冲。 读取脉冲可以以第一电压施加第一时间段。 可以在感测窗口期间检测相变存储器单元的阈值事件。 感应窗口可以在施加读取脉冲的第一时间段期满之后关闭。