公开(公告)号：US20210012851A1

公开(公告)日：2021-01-14

申请号：US16079737

申请日：2017-12-29

Applicant: Micron Technology, Inc.

Inventor： Jianmin Huang ,  Deping He ,  Xiangang Luo ,  Harish Reddy Singidi ,  Kulache Tanpairoj ,  John Zhang ,  Ting Luo

IPC: G11C29/42 ,  G11C29/44 ,  G11C29/20 ,  G11C29/14 ,  G11C29/00

Abstract: Disclosed in some examples are NAND devices, firmware, systems, methods, and devices that apply smart algorithms to process ECC errors by taking advantage of excess overprovisioning. In some examples, when the amount of overprovisioned blocks are above a predetermined threshold, a first ECC block error handling mode may be implemented and when the overprovisioned blocks are equal or less than the predetermined threshold, a second mode of ECC block error handling may be utilized.