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1.
公开(公告)号:US20240248647A1
公开(公告)日:2024-07-25
申请号:US18628060
申请日:2024-04-05
Applicant: Micron Technology, Inc.
Inventor: Shakeel Isamohiuddin BUKHARI , Mark ISH
CPC classification number: G06F3/0659 , G06F12/0253 , G06F3/0604 , G06F3/0679
Abstract: A memory device may include logical units configured to store data, wherein the logical units are identified by corresponding logical unit numbers (LUNs) and are associated with corresponding LUN queue groups. Each LUN queue group may include LUN queues that are each associated with a respective intra-LUN priority level that indicates a priority of a LUN queue within a LUN queue group. The LUN queues are each associated with a respective execution priority level that indicates a priority for execution of commands in a LUN queue across LUN queue groups. A quantity of intra-LUN priority levels may be greater than a quantity of execution priority levels. A LUN scheduler may be configured to select and transfer commands from LUN queue groups to the execution queue group based on intra-LUN priority levels. A command executor may be configured to execute commands from the execution queue group based on execution priority levels.
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公开(公告)号:US20240069997A1
公开(公告)日:2024-02-29
申请号:US17931937
申请日:2022-09-14
Applicant: Micron Technology, Inc.
Inventor: Shakeel Isamohiuddin BUKHARI , Mark ISH
CPC classification number: G06F11/004 , G06F12/12 , G06F2212/251
Abstract: In some implementations, a memory device may cache a subset of one or more block family error avoidance (BFEA) lookup tables associated with a block family associated with host data in a first memory location. The block family may be based on at least one of a time window during which the host data was written or a temperature window at which the host data was written. The memory device may receive a read command associated with host data and determine, based on the block family and the subset of the one or more BFEA tables, a threshold voltage offset associated with the host data. The memory device may compute a modified threshold voltage by applying the threshold voltage offset to a base read level voltage associated with the host data. The memory device may read, using the modified threshold voltage, the host data from the first memory location.
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公开(公告)号:US20210182199A1
公开(公告)日:2021-06-17
申请号:US17185059
申请日:2021-02-25
Applicant: Micron Technology, Inc.
Inventor: Horia C. SIMIONESCU , Lyle E. ADAMS , Yongcai XU , Mark ISH
IPC: G06F12/0855
Abstract: A request to read data from a location associated with a memory component is received. The request is assigned a first tag, the first tag having a first identifier of a first buffer to store data read from the location. The request to read data is determined to collide with an earlier request to write data to the location. The earlier request is assigned a second tag, the second tag having a second identifier of a second buffer to store data to write to the location. An attempt to lock the second tag and the second buffer for the request to read data is made. The request to read data is fulfilled from the second buffer in response to a successful attempt to lock the second tag and the second buffer.
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4.
公开(公告)号:US20240069808A1
公开(公告)日:2024-02-29
申请号:US17931934
申请日:2022-09-14
Applicant: Micron Technology, Inc.
Inventor: Shakeel Isamohiuddin BUKHARI , Mark ISH
CPC classification number: G06F3/0659 , G06F12/0253 , G06F3/0604 , G06F3/0679
Abstract: A memory device may include logical units configured to store data, wherein the logical units are identified by corresponding logical unit numbers (LUNs) and are associated with corresponding LUN queue groups. Each LUN queue group may include LUN queues that are each associated with a respective intra-LUN priority level that indicates a priority of a LUN queue within a LUN queue group. The LUN queues are each associated with a respective execution priority level that indicates a priority for execution of commands in a LUN queue across LUN queue groups. A quantity of intra-LUN priority levels may be greater than a quantity of execution priority levels. A LUN scheduler may be configured to select and transfer commands from LUN queue groups to the execution queue group based on intra-LUN priority levels. A command executor may be configured to execute commands from the execution queue group based on execution priority levels.
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公开(公告)号:US20240419523A1
公开(公告)日:2024-12-19
申请号:US18821283
申请日:2024-08-30
Applicant: Micron Technology, Inc.
Inventor: Shakeel Isamohiuddin BUKHARI , Mark ISH
Abstract: In some implementations, a memory device may cache a subset of one or more block family error avoidance (BFEA) lookup tables associated with a block family associated with host data in a first memory location. The block family may be based on at least one of a time window during which the host data was written or a temperature window at which the host data was written. The memory device may receive a read command associated with host data and determine, based on the block family and the subset of the one or more BFEA tables, a threshold voltage offset associated with the host data. The memory device may compute a modified threshold voltage by applying the threshold voltage offset to a base read level voltage associated with the host data. The memory device may read, using the modified threshold voltage, the host data from the first memory location.
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公开(公告)号:US20240071520A1
公开(公告)日:2024-02-29
申请号:US17931935
申请日:2022-09-14
Applicant: Micron Technology, Inc.
Inventor: Shakeel Isamohiuddin BUKHARI , Mark ISH
Abstract: Implementations described herein relate to suspending memory erase operations to perform high priority memory commands. In some implementations, a memory device may detect, while an active stage of an erase operation is being performed by the memory device, a pending memory command with a higher priority than the erase operation. The memory device may selectively suspend the active stage of the erase operation, to allow the pending memory command to be executed, based on the active stage of the erase operation that is being performed and/or a value of a suspend determination timer associated with suspending the active stage of the erase operation.
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