摘要:
An adaptive equalizer and operating method thereof are disclosed. The adaptive equalizer is oversampling-based. The adaptive equalizer includes a searching module, a compensation module, and an operating module. The searching module searches the equalizer setting from a lower compensation to a higher compensation to obtain a first equalizer setup value according a first monitored result of a monitor and then searches the equalizer setting from a higher compensation to a lower compensation to obtain a second equalizer setup value according to a second monitored result of the monitor. The operating module performs an operation on the first equalizer setup value and the second equalizer setup value to obtain an optimized equalizer setup value.
摘要:
A multifunctional output driver capable of transmitting signals of different interfaces in different modes is provided, in which first and second current sources are provided, and first to fourth switching devices are coupled between the first and second current sources, and the first and second current source and the first to the fourth switching devices act as a current steering circuit. In a first transmission mode, the first and second switching devices are turned off, and the third and fourth switching devices and the first current source act as a current mode logic circuit to provide an output signal compatible with a first transmission interface according to an input signal from a pre-driver. In a second transmission mode, the current steering circuit outputs an output signal compatible with a second transmission interface according to the input signal from the pre-driver.
摘要:
A transmitter circuit, a receiver circuit and an interface switching module for SATA or SAS interface are provided. The invention uses transistors as elements with different impedance and also provides impedance modulating method in coordination with the exterior circuit and the layout design so as to develop an auto-switching mechanism between SATA and SAS interfaces, thereby integrating two transmission interfaces in a single system.
摘要:
A delay circuit has: an inverting receiver with a resistive element, the inverting receiver having an input node for receiving an input signal and an output node coupled to the resistive element; a capacitive element, coupled to the output node of the inverting receiver and the resistive element; a first transistor, having lower turned ON voltage at higher temperature; a second transistor, used for generating a rail to rail signals on a terminal of the first transistor; and an output inverter, having an input node coupled to the first transistor and an output node for outputting an output signal of the delay circuit. Further, a third transistor is used for enhancing pulling low of the output signal of the delay circuit.
摘要:
A LVDS (Low Voltage Differential Signal) driver with a high PSRR (Power Supply Rejection Ration) includes a first current source for providing a working current, a switch unit for receiving the working current and determining the current directions of an output current at first and second signal nodes according to first and second input signals, a second current source connected between the switch unit and a low working power voltage, a common mode feedback unit for generating a common mode control signal according to voltages on the first and second signal nodes of the switch unit, a common mode resistance unit connected in parallel with the second current source and having a resistance value controlled by the common mode control signal, and a compensation unit connected in parallel with the second current source for compensating the current variation of the first current source caused by power noise.
摘要:
A memory device and a method for burn in test are characterized by a plurality of sub-array word line leak-current limited units and a plurality of single word line leak-current limited units. They are used to limit the current in each word line to a predetermined word line current value. In burn-in test mode, the output of a word line driver is kept in a high impedance state. The bit line stress voltage is applied to the row of memory cells through a normal read-write path. A voltage generator for generating a substantially stable voltage is also provided. In burn-in test mode, the even word lines and the odd word lines are grouped separately and the word line stress voltage is applied to the even word lines and to the odd word lines alternately.
摘要:
A memory device and a method for burn-in test. The memory device has a plurality of sub-array word line leak-current limited units and a plurality of single word line leak-current limited units. They are used to limit the current in each word line to a predetermined word line current value. In burn-in test mode, the output of a word line driver is kept in a high impedance state. The bit line stress voltage is applied to the row of memory cells through a normal read-write path. A voltage generator for generating a substantially stable voltage is also provided. In burn-in test mode, the even word lines and the odd word lines are grouped separately and the word line stress voltage is applied to the even word lines and to the odd word lines alternately.
摘要:
A laser signature circuit in a memory device comprises input pins for input signal into the memory device; internal circuits of the memory device connected to the input pins; a laser signature circuit connected between the internal circuits, wherein the laser signature circuit comprises a fuse to identify the memory device, the fuse is tested by input a signal into a first input pin of the input pins and the signal is measured on a second input pin of the input pins which is not necessary adjacent to the first input pin.
摘要:
An adaptive equalizer and operating method thereof are disclosed. The adaptive equalizer is oversampling-based. The adaptive equalizer includes a searching module, a compensation module, and an operating module. The searching module searches the equalizer setting from a lower compensation to a higher compensation to obtain a first equalizer setup value according a first monitored result of a monitor and then searches the equalizer setting from a higher compensation to a lower compensation to obtain a second equalizer setup value according to a second monitored result of the monitor. The operating module performs an operation on the first equalizer setup value and the second equalizer setup value to obtain an optimized equalizer setup value.
摘要:
A dynamic random-access memory (DRAM) and a method for testing the DRAM are provided. The DRAM includes a memory cell, a bit line associated with the memory cell, a local buffer, and a bit line sense amplifier (BLSA). The local buffer receives a first power voltage as power supply. The local buffer provides a ground voltage to the bit line when a data signal is de-asserted and provides the first power voltage to the bit line when the data signal is asserted. The BLSA receives a second power voltage as power supply. The BLSA provides the second power voltage to the bit line when the data signal and a wafer level burn-in test signal are both asserted. The second power voltage may be higher than the first power voltage. The wafer level burn-in test signal is asserted when the DRAM is in a wafer level burn-in test mode.