摘要:
Disclosed are a diimmonium salt and a near infrared ray absorption film including the same which is used for blocking the near infrared ray. The diimmonium salt for a near infrared ray absorption film is represented by Formula 1 of the specification, wherein, n is an integer of 1 or 2, R1 to R8 are independently a substituted or unsubstituted linear or branched C1-C10 alkyl group, the substituent for the alkyl group is selected from the group consisting of a cyano group, a nitro group, a carboxyl group, a sulfone group, a halogen atom, a hydroxyl group, a C1 -C8 alkoxy, alkoxyalkoxy, acyloxy, or alkylamino group, and C6-C18 aryl or aryloxy group, and X is a substituted fluoro alkyl phosphate anion represented by Formula 2 of the specification, wherein, x is an integer of 0 or 1, y is an integer of 1, 2 or 3, z is an integer of 6-y, and R9 to R13 are independently a hydrogen atom (H) or a fluorine atom (F).
摘要:
Disclosed are a diimmonium salt and a near infrared ray absorption film including the same which is used for blocking the near infrared ray. The diimmonium salt for a near infrared ray absorption film is represented by Formula 1 of the specification, wherein, n is an integer of 1 or 2, R1 to R8 are independently a substituted or unsubstituted linear or branched C1-C10 alkyl group, the substituent for the alkyl group is selected from the group consisting of a cyano group, a nitro group, a carboxyl group, a sulfone group, a halogen atom, a hydroxyl group, a C1 -C8 alkoxy, alkoxyalkoxy, acyloxy, or alkylamino group, and C6-C18 aryl or aryloxy group, and X is a substituted fluoro alkyl phosphate anion represented by Formula 2 of the specification, wherein, x is an integer of 0 or 1, y is an integer of 1, 2 or 3, z is an integer of 6-y, and R9 to R13 are independently a hydrogen atom (H) or a fluorine atom (F).
摘要:
A ferroelectric memory device has a lower electrode, ferroelectric layer and a first portion of an upper electrode that are formed as a stack over a semiconductor substrate. Sidewalls of the stack are covered with a second portion of the upper electrode. An insulating spacer is disposed between the lower electrode and the second portion of the upper electrode. The second portion of the upper electrode is electrically connected to the first portion of the upper electrode yet electrically insulated by the insulating spacer from the lower electrode. At least one of the first and second portions of the upper electrode is formed of a hydrogen barrier layer to protect the ferroelectric layer of the stack from hydrogen ions.
摘要:
A semiconductor device having MIM capacitors is configured so that the bottom surface of the lower electrode and a top surface area of an oxidation barrier pattern are substantially equal. Related methods for forming the device are also described.