公开(公告)号：US20130271168A1

公开(公告)日：2013-10-17

申请号：US13578438

申请日：2012-05-28

申请人： Yizhuang Zhuang ,  Jungmao Tsai ,  Shiue-shih Liao ,  Songxian Wen ,  Mingfeng Deng ,  JunJie Huang

发明人： Yizhuang Zhuang ,  Jungmao Tsai ,  Shiue-shih Liao ,  Songxian Wen ,  Mingfeng Deng ,  JunJie Huang

IPC分类号： G01R31/3187 ,  G01R31/26

CPC分类号： G09G3/006 ,  G02F2001/136254

摘要： A wiring structure of a wiring area on a liquid crystal displaying panel includes a number of wiring lines connected to one end of a corresponding data line and corresponding scan line on the wiring area, at least one signal testing point, a number of first testing lines connected between the wiring lines and the signal testing point, a number of second testing lines connected between the signal testing point and the other end of the corresponding data line and the corresponding scan line, and a switch controlling circuit connected to the second testing lines. After the testing lines are disconnected from the wiring lines in the previous process, the testing signal still can be transmitted through the other end of the corresponding data line or the scan line, to implement the image test of the liquid crystal displaying panel.

摘要翻译： 液晶显示面板上的布线区域的布线结构包括：多个布线，其连接到相应数据线的一端和布线区域上的对应扫描线，至少一个信号测试点，多个第一测试线 连接在接线和信号测试点之间，连接在信号测试点和相应数据线的另一端和相应的扫描线之间的多条第二测试线以及连接到第二测试线的开关控制电路。 在先前的处理中，测试线与布线断开之后，测试信号仍然可以通过相应的数据线或扫描线的另一端传输，以实现液晶显示面板的图像测试。

公开(公告)号：US20140070835A1

公开(公告)日：2014-03-13

申请号：US13697360

申请日：2012-09-26

申请人： Songxian Wen ,  Jungmao Tsai ,  Shiue-shih Liao ,  Yizhuang Zhuang ,  Mingfeng Deng

发明人： Songxian Wen ,  Jungmao Tsai ,  Shiue-shih Liao ,  Yizhuang Zhuang ,  Mingfeng Deng

IPC分类号： G01R31/28 ,  H01L23/58

CPC分类号： G01R31/2851 ,  G02F1/136259 ,  G09G3/36 ,  G09G3/3648 ,  G09G2300/0426 ,  H01L23/58 ,  H01L2924/0002 ,  H01L2924/00

摘要： The present invention discloses a TFT-LCD array substrate comprising a display area comprising a plurality of data lines and a plurality of gate lines; a peripheral area located at a periphery of the display area and provided with a first test short bar provided with a plurality of data test lines for transmitting a test signal for the data lines in the display area, and a second test short bar provided with a gate test line for transmitting a test signal for the gate lines in the display area; and a connecting device comprising a first connection layer and a second connection and provided at a connection location between one of the data test lines in the first test short bar and one of the data lines in the display area, or provided at a connection location between the gate test line in the second test short bar and one of the gate lines in the display area. The present invention also provides a corresponding test method. The present invention can achieve testing the TFT-LCD array substrate twice.

摘要翻译： 本发明公开了一种TFT-LCD阵列基板，其包括包括多条数据线和多条栅极线的显示区域; 外围区域，位于显示区域的周围，并且设置有第一测试短条，第一测试短条设置有用于发送显示区域中的数据线的测试信号的多条数据测试线，以及设置有显示区域的第二测试短条 门测试线，用于发送用于显示区域中的栅极线的测试信号; 以及连接装置，包括第一连接层和第二连接，并且设置在第一测试短条中的数据测试线之一和显示区域中的一条数据线之间的连接位置处，或者设置在第二连接层之间的连接位置处 第二测试短条中的栅极测试线和显示区域中的一条栅极线。 本发明还提供了相应的测试方法。 本发明可以实现TFT-LCD阵列基板的两次测试。

公开(公告)号：US20130265069A1

公开(公告)日：2013-10-10

申请号：US13512885

申请日：2012-04-16

申请人： Mingfeng Deng ,  Jungmao Tsai ,  Shiue-shih Liao ,  Yizhuang Zhuang ,  Songxian Wen

发明人： Mingfeng Deng ,  Jungmao Tsai ,  Shiue-shih Liao ,  Yizhuang Zhuang ,  Songxian Wen

IPC分类号： G01R31/3187

CPC分类号： G09G3/006 ,  G09G3/3648 ,  G09G2300/0426

摘要： The present invention discloses a liquid crystal panel, which, in shorting bar area, connects scan signal line to scan signal test point through a first switch, connects data signal line to data signal test point through a first unidirectional circuit or a second switch, and connects common electrode to common electrode test point through conductive wire. The present invention also discloses a liquid crystal module and a method of determining reason behind bad display for liquid crystal module. With the method, the liquid crystal panel of the present invention can realize to spare the cutting of test leads of shorting bar area and cutting facility used in cell process.

摘要翻译： 本发明公开了一种液晶面板，其在短路区域中通过第一开关将扫描信号线连接到扫描信号测试点，通过第一单向电路或第二开关将数据信号线连接到数据信号测试点，以及 通过导线将公共电极连接到公共电极测试点。 本发明还公开了一种液晶模块和确定液晶模块不良显示原因的方法。 通过该方法，本发明的液晶面板可以实现对电池处理中使用的短路面积的切断和切割设备的切割。

公开(公告)号：US09536459B2

公开(公告)日：2017-01-03

申请号：US13703356

申请日：2012-08-28

申请人： Songxian Wen ,  Jungmao Tsai ,  Shiue-shih Liao ,  Yizhuang Zhuang ,  Mingfeng Deng

发明人： Songxian Wen ,  Jungmao Tsai ,  Shiue-shih Liao ,  Yizhuang Zhuang ,  Mingfeng Deng

IPC分类号： G09G3/00 ,  G02F1/13 ,  G02F1/133 ,  G02F1/1345

CPC分类号： G09G3/006 ,  G02F1/1309 ,  G02F1/13306 ,  G02F1/13452

摘要： The present invention provides a testing device and a testing method. The testing method comprises: providing a testing device; bonding at least one connecting terminal of the testing device to signal lines of the display panel; and inputting test signals to the signal lines of the display panel through at least one test contact of the testing device. In the present invention, it is not required to arrange shorting bars on the display panel.

摘要翻译： 本发明提供一种测试装置和测试方法。 测试方法包括：提供测试设备; 将所述测试装置的至少一个连接端子连接到所述显示面板的信号线; 以及通过所述测试装置的至少一个测试接点将测试信号输入到所述显示面板的信号线。 在本发明中，不需要在显示面板上设置短路棒。

公开(公告)号：US09324252B2

公开(公告)日：2016-04-26

申请号：US13578438

申请日：2012-05-28

申请人： Yizhuang Zhuang ,  Jungmao Tsai ,  Shiue-shih Liao ,  Songxian Wen ,  Mingfeng Deng ,  JunJie Huang

发明人： Yizhuang Zhuang ,  Jungmao Tsai ,  Shiue-shih Liao ,  Songxian Wen ,  Mingfeng Deng ,  JunJie Huang

IPC分类号： G09G3/00 ,  G02F1/1362

CPC分类号： G09G3/006 ,  G02F2001/136254

摘要： A wiring structure of a wiring area on a liquid crystal displaying panel includes a number of wiring lines connected to one end of a corresponding data line and corresponding scan line on the wiring area, at least one signal testing point, a number of first testing lines connected between the wiring lines and the signal testing point, a number of second testing lines connected between the signal testing point and the other end of the corresponding data line and the corresponding scan line, and a switch controlling circuit connected to the second testing lines. After the testing lines are disconnected from the wiring lines in the previous process, the testing signal still can be transmitted through the other end of the corresponding data line or the scan line, to implement the image test of the liquid crystal displaying panel.

摘要翻译： 液晶显示面板上的布线区域的布线结构包括：多个布线，其连接到相应数据线的一端和布线区域上的对应扫描线，至少一个信号测试点，多个第一测试线 连接在接线和信号测试点之间，连接在信号测试点和相应数据线的另一端和相应的扫描线之间的多条第二测试线以及连接到第二测试线的开关控制电路。 在先前的处理中，测试线与布线断开之后，测试信号仍然可以通过相应的数据线或扫描线的另一端传输，以实现液晶显示面板的图像测试。

公开(公告)号：US20130135549A1

公开(公告)日：2013-05-30

申请号：US13380051

申请日：2011-12-05

申请人： Songxian Wen ,  Jung-mao Tsai ,  Shiue-shih Liao ,  Yizhuang Zhuang ,  Mingfeng Deng ,  Xiaoxin Zhang

发明人： Songxian Wen ,  Jung-mao Tsai ,  Shiue-shih Liao ,  Yizhuang Zhuang ,  Mingfeng Deng ,  Xiaoxin Zhang

IPC分类号： G02F1/136 ,  H01L33/08

CPC分类号： G02F1/1339 ,  G02F1/1362 ,  H01L27/1266

摘要： The present invention discloses a thin film transistor (TFT) array substrate, a liquid crystal display (LCD) and a method for manufacturing the same. The method comprises: forming coating layers on a display region and a non-display region of a first substrate; forming a stacked layer on the non-display region; forming at least one channel on the stacked layer by exposure and developing; filling the channel with a sealant; and bonding the first substrate to a second substrate by using the sealant. The present invention can precisely control the shape of the sealant for preventing the leakage of the sealant and an uneven cell thickness.

摘要翻译： 本发明公开了一种薄膜晶体管（TFT）阵列基板，液晶显示器（LCD）及其制造方法。 该方法包括：在第一基板的显示区域和非显示区域上形成涂层; 在非显示区域上形成堆叠层; 通过曝光和显影在堆叠层上形成至少一个通道; 用密封剂填充通道; 以及通过使用所述密封剂将所述第一基板接合到第二基板。 本发明可以精确地控制密封剂的形状，以防止密封剂的泄漏和不均匀的电池厚度。

公开(公告)号：US20140043036A1

公开(公告)日：2014-02-13

申请号：US13582423

申请日：2012-08-16

申请人： Yizhuang Zhuang ,  Mingfeng Deng ,  Jungmao Tsai ,  Shiueshih Liao ,  Songxian Wen

发明人： Yizhuang Zhuang ,  Mingfeng Deng ,  Jungmao Tsai ,  Shiueshih Liao ,  Songxian Wen

IPC分类号： G01R31/28

CPC分类号： G01R31/2813 ,  G01R31/002 ,  H02H9/046

摘要： The present disclosure provides a detection circuit and a detection method. The detection circuit used for detecting an electrostatic discharge (ESD) protective device that is inversely soldered, the ESD protective device includes a first diode, a second diode, and a third diode; the cathodes of the first diode, the second diode and the third diode are mutually connected, and an anode of the third diode is coupled to a ground terminal of the circuit by a divider resistor. The detection circuit includes a comparator. The comparator is configured with a first input end connected to the reference voltage and a second input end coupled to the anode of the third diode, and an output end of the comparator is coupled to a warning device.

摘要翻译： 本公开提供了一种检测电路和检测方法。 用于检测反向焊接的静电放电（ESD）保护装置的检测电路，所述ESD保护装置包括第一二极管，第二二极管和第三二极管; 第一二极管，第二二极管和第三二极管的阴极相互连接，并且第三二极管的阳极通过分压电阻器耦合到电路的接地端子。 检测电路包括比较器。 比较器配置有连接到参考电压的第一输入端和耦合到第三二极管的阳极的第二输入端，并且比较器的输出端耦合到警告装置。

公开(公告)号：US20140043040A1

公开(公告)日：2014-02-13

申请号：US13697358

申请日：2012-09-04

申请人： Mingfeng Deng ,  Jungmao Tsai ,  Songxian Wen ,  Yizhuang Zhuang

发明人： Mingfeng Deng ,  Jungmao Tsai ,  Songxian Wen ,  Yizhuang Zhuang

IPC分类号： G01R31/04

CPC分类号： G01R31/048 ,  G01R31/046

摘要： The present invention provides an apparatus for detecting the abnormal soldering of an electrostatic discharge protection chip, comprising a connector, which is used for pluggable connection with a signal input terminal connector of an application specific integrated circuit chip (ASIC) of a liquid crystal display; a detecting circuit, which is set on the connector, used to detect if the electrostatic discharge protection chip is properly soldered on the ASIC and prompt when the abnormal soldering of the electrostatic discharge protection chip is detected. Accordingly, the present invention also provides a method for detecting the abnormal soldering of an electrostatic discharge protection chip. According to the present invention, the abnormal soldering of an electrostatic discharge protection chip can be detected quickly with high accuracy, which can save the cost of manpower and resources, as well as to reduce the loss resulted from the defective rate of the finished product assembly.

摘要翻译： 本发明提供了一种用于检测静电放电保护芯片的异常焊接的装置，包括用于与液晶显示器的专用集成电路芯片（ASIC）的信号输入端子连接器可插拔连接的连接器; 设置在连接器上的检测电路，用于检测静电放电保护芯片是否在ASIC上正确焊接，并且当检测到静电放电保护芯片的异常焊接时提示。 因此，本发明还提供一种用于检测静电放电保护芯片的异常焊接的方法。 根据本发明，可以高精度地快速检测静电放电保护芯片的异常焊接，从而可以节省人力和资源的成本，并且减少成品组件的缺陷率导致的损耗 。

公开(公告)号：US20130135559A1

公开(公告)日：2013-05-30

申请号：US13376657

申请日：2011-12-04

申请人： Mingfeng Deng ,  Jungmao Tsai ,  Songxian Wen ,  Yizhuang Zhuang ,  Hui Zhou ,  Jingming Wu

发明人： Mingfeng Deng ,  Jungmao Tsai ,  Songxian Wen ,  Yizhuang Zhuang ,  Hui Zhou ,  Jingming Wu

IPC分类号： F21V8/00 ,  G02F1/13357

CPC分类号： G02F1/133608 ,  G02B6/0088

摘要： The present invention discloses a backlight module and an LCD device, comprising: a backplane and an LGP; the edge(s) of the LGP is provided with lug boss(es), each lug boss is provided with a positioning hole, and the backplane is provided with rivet(s) for matching with the positioning hole; a buffer structure is arranged between the rivet and the wall of the positioning hole. In the present invention, because the edge(s) of the LGP is provided with lug boss(es), each lug boss is provided with a positioning hole, the arrangement of the positioning hole does not influence the light guide area of the LGP; meanwhile, because a layer of buffer structure is arranged between the positioning hole and the rivet, the rupture of the part with concentrated stress in the positioning hole during collision is avoided. In addition, when the LGP is expanded with heat, the buffer structure can also avoid the extrusion damage caused by direct extrusion between the LGP and the rivet; when the LGP is contracted with cold, the gap between the LGP and the rivet is increased so that shake is easily caused. The gap between the LGP and the rivet is automatically filled by a buffer part through the elastic regulation of the buffer part. Thus, the shake collision of the LGP is avoided.

摘要翻译： 本发明公开了一种背光模块和LCD装置，包括：背板和LGP; LGP的边缘设置有凸耳凸台，每个凸耳凸台设置有定位孔，并且背板设置有用于与定位孔匹配的铆钉; 在铆钉和定位孔的壁之间布置缓冲结构。 在本发明中，由于LGP的边缘设置有凸耳凸台，每个凸耳凸台设置有定位孔，定位孔的布置不影响LGP的导光面积; 同时，由于在定位孔和铆钉之间布置了一层缓冲结构，因此避免了碰撞时定位孔内集中应力部分的破裂。 此外，当LGP通过热膨胀时，缓冲结构也可以避免LGP和铆钉之间的直接挤压引起的挤压损伤; 当LGP收缩时，LGP和铆钉之间的间隙增加，容易引起晃动。 LGP和铆钉之间的间隙通过缓冲部分的弹性调节由缓冲部分自动填充。 因此，避免了LGP的晃动碰撞。

公开(公告)号：US09312281B2

公开(公告)日：2016-04-12

申请号：US13375230

申请日：2011-09-29

申请人： Yizhuang Zhuang ,  Jungmao Tsai ,  Songxian Wen ,  Mingfeng Deng ,  Xiaoxin Zhang

发明人： Yizhuang Zhuang ,  Jungmao Tsai ,  Songxian Wen ,  Mingfeng Deng ,  Xiaoxin Zhang

IPC分类号： G02F1/1362 ,  H01L27/12 ,  G02F1/13 ,  G02F1/1345

CPC分类号： H01L27/124 ,  G02F1/1309 ,  G02F1/1345

摘要： A TFT array substrate includes a pixel region and a wiring region disposed outside the pixel region. The wiring region has a wiring layer including scan or data wirings. A repair wiring layer including repair wiring is disposed insulatedly below or above the wiring layer. A scan or data wiring has a first intersection and a second intersection with a repair wiring section of the repair wiring. When the scan or data wiring is broken, a repair wiring section is cut off the repair wiring by a first cut-off point and a second cut-off point, and the broken scan or data wiring is electrically connected to the repair wiring section through soldering the first intersection and the second intersection. Thus, products that would otherwise be rejected in the manufacturing process of LCD panels can be repaired, which decreases the reject ratio, increases the yield and saves the production cost.

摘要翻译： TFT阵列基板包括像素区域和布置在像素区域外部的布线区域。 布线区域具有包括扫描或数据布线的布线层。 包括修复布线的修复布线层绝缘地布置在布线层的下方或上方。 扫描或数据布线具有与修理布线的修复布线部分的第一交叉点和第二交点。 当扫描或数据接线断裂时，修理接线部分通过第一切断点和第二切断点切断修理布线，并且断线扫描或数据布线通过 焊接第一个十字路口和第二个十字路口。 因此，可以修复在LCD面板的制造过程中被拒绝的产品，这样可以减少废品率，提高产量并节省生产成本。