公开(公告)号：US09312281B2

公开(公告)日：2016-04-12

申请号：US13375230

申请日：2011-09-29

申请人： Yizhuang Zhuang ,  Jungmao Tsai ,  Songxian Wen ,  Mingfeng Deng ,  Xiaoxin Zhang

发明人： Yizhuang Zhuang ,  Jungmao Tsai ,  Songxian Wen ,  Mingfeng Deng ,  Xiaoxin Zhang

IPC分类号： G02F1/1362 ,  H01L27/12 ,  G02F1/13 ,  G02F1/1345

CPC分类号： H01L27/124 ,  G02F1/1309 ,  G02F1/1345

摘要： A TFT array substrate includes a pixel region and a wiring region disposed outside the pixel region. The wiring region has a wiring layer including scan or data wirings. A repair wiring layer including repair wiring is disposed insulatedly below or above the wiring layer. A scan or data wiring has a first intersection and a second intersection with a repair wiring section of the repair wiring. When the scan or data wiring is broken, a repair wiring section is cut off the repair wiring by a first cut-off point and a second cut-off point, and the broken scan or data wiring is electrically connected to the repair wiring section through soldering the first intersection and the second intersection. Thus, products that would otherwise be rejected in the manufacturing process of LCD panels can be repaired, which decreases the reject ratio, increases the yield and saves the production cost.

摘要翻译： TFT阵列基板包括像素区域和布置在像素区域外部的布线区域。 布线区域具有包括扫描或数据布线的布线层。 包括修复布线的修复布线层绝缘地布置在布线层的下方或上方。 扫描或数据布线具有与修理布线的修复布线部分的第一交叉点和第二交点。 当扫描或数据接线断裂时，修理接线部分通过第一切断点和第二切断点切断修理布线，并且断线扫描或数据布线通过 焊接第一个十字路口和第二个十字路口。 因此，可以修复在LCD面板的制造过程中被拒绝的产品，这样可以减少废品率，提高产量并节省生产成本。

公开(公告)号：US20130265069A1

公开(公告)日：2013-10-10

申请号：US13512885

申请日：2012-04-16

申请人： Mingfeng Deng ,  Jungmao Tsai ,  Shiue-shih Liao ,  Yizhuang Zhuang ,  Songxian Wen

发明人： Mingfeng Deng ,  Jungmao Tsai ,  Shiue-shih Liao ,  Yizhuang Zhuang ,  Songxian Wen

IPC分类号： G01R31/3187

CPC分类号： G09G3/006 ,  G09G3/3648 ,  G09G2300/0426

摘要： The present invention discloses a liquid crystal panel, which, in shorting bar area, connects scan signal line to scan signal test point through a first switch, connects data signal line to data signal test point through a first unidirectional circuit or a second switch, and connects common electrode to common electrode test point through conductive wire. The present invention also discloses a liquid crystal module and a method of determining reason behind bad display for liquid crystal module. With the method, the liquid crystal panel of the present invention can realize to spare the cutting of test leads of shorting bar area and cutting facility used in cell process.

摘要翻译： 本发明公开了一种液晶面板，其在短路区域中通过第一开关将扫描信号线连接到扫描信号测试点，通过第一单向电路或第二开关将数据信号线连接到数据信号测试点，以及 通过导线将公共电极连接到公共电极测试点。 本发明还公开了一种液晶模块和确定液晶模块不良显示原因的方法。 通过该方法，本发明的液晶面板可以实现对电池处理中使用的短路面积的切断和切割设备的切割。

公开(公告)号：US20130045390A1

公开(公告)日：2013-02-21

申请号：US13377537

申请日：2011-10-09

申请人： Rui Xu ,  Weiwei Zhang ,  Hongqing Huang ,  Junjie Huang ,  Quan Liu ,  Jungmao Tsai ,  Hui Fang Duan

发明人： Rui Xu ,  Weiwei Zhang ,  Hongqing Huang ,  Junjie Huang ,  Quan Liu ,  Jungmao Tsai ,  Hui Fang Duan

IPC分类号： B32B9/04 ,  C09D129/04 ,  C08K5/5415 ,  B82Y30/00

CPC分类号： C08J5/18 ,  B05D3/007 ,  B05D5/06 ,  B82Y30/00 ,  C01P2004/64 ,  C08J2329/04 ,  C08K9/06 ,  C09C1/3081 ,  C09D129/04 ,  G02B1/08 ,  G02B1/14 ,  G02B5/305 ,  Y10T428/31663

摘要： The present invention provides a base film of modified polyvinyl alcohol as well as a method for preparing the base film of modified polyvinyl alcohol and a polarizer made from the base film. The method includes steps of: (1) executing surface graft modification of nano-silicon dioxides with fluorinated silane to obtain modified nano-silicon dioxide powders; (2) adding the modified nano-silicon dioxide powders obtained from the step (1) to an aqueous solution of polyvinyl alcohol polymers, in order to prepare a composite solution of polyvinyl alcohol polymers; and (3) pouring the composite solution of polyvinyl alcohol polymers prepared from the step (2) onto a surface of a casting substrate to obtain a base film of modified polyvinyl alcohol (PVA). The present invention enhances the heat and humidity resistances and the stability of the PVA base film, and improves its mechanical performance and sticking-resistance.

摘要翻译： 本发明提供改性聚乙烯醇的基膜以及改性聚乙烯醇的基膜的制备方法和由该基膜制成的偏光片。 该方法包括以下步骤：（1）用氟化硅烷进行纳米二氧化硅的表面接枝改性，得到改性纳米二氧化硅粉末; （2）将由步骤（1）获得的改性纳米二氧化硅粉末加入到聚乙烯醇聚合物的水溶液中，以制备聚乙烯醇聚合物的复合溶液; 和（3）将由步骤（2）制备的聚乙烯醇聚合物的复合溶液倒入流延基材的表面，得到改性聚乙烯醇（PVA）的基膜。 本发明提高了耐热耐湿性和PVA基膜的稳定性，提高了其机械性能和耐粘附性。

公开(公告)号：US20140145738A1

公开(公告)日：2014-05-29

申请号：US13807066

申请日：2012-12-01

申请人： Xiaoyu Huang ,  Mingfeng Deng ,  Jungmao Tsai

发明人： Xiaoyu Huang ,  Mingfeng Deng ,  Jungmao Tsai

IPC分类号： G01R31/28

CPC分类号： G01R31/2856 ,  G09G3/006 ,  G09G2300/0426 ,  G09G2330/04

摘要： The present invention provides a digitally displaying inspection system for ESD protection chip, which includes an LVDS connector, a display system, first, second, and the third data lines, a power supply, and a resistor. The first, second, and third data lines each have an end electrically connected to the LVDS connector and an opposite end electrically connected to the display system. The display system includes a logic operation module and a digital display module electrically connected to the logic operation module. The logic operation module is electrically connected to the first, second, and third data lines. When an ESD protection chip is electrically connected to the LVDS connector, the logic operation module samples signals on the first, second, and third data lines and drive, after carrying out logic operations, the digital display module to display character signs, which can identify if the ESD protection chip is incorrectly connected.

摘要翻译： 本发明提供了一种用于ESD保护芯片的数字显示检测系统，其包括LVDS连接器，显示系统，第一，第二和第三数据线，电源和电阻器。 第一，第二和第三数据线各自具有电连接到LVDS连接器的端部和电连接到显示系统的相对端。 显示系统包括逻辑操作模块和电连接到逻辑操作模块的数字显示模块。 逻辑运算模块电连接到第一，第二和第三数据线。 当ESD保护芯片电连接到LVDS连接器时，逻辑操作模块在第一，第二和第三数据线上采样信号，并且在执行逻辑操作之后驱动数字显示模块以显示字符符号，其可以识别 如果ESD保护芯片连接不正确。

公开(公告)号：US20140043036A1

公开(公告)日：2014-02-13

申请号：US13582423

申请日：2012-08-16

申请人： Yizhuang Zhuang ,  Mingfeng Deng ,  Jungmao Tsai ,  Shiueshih Liao ,  Songxian Wen

发明人： Yizhuang Zhuang ,  Mingfeng Deng ,  Jungmao Tsai ,  Shiueshih Liao ,  Songxian Wen

IPC分类号： G01R31/28

CPC分类号： G01R31/2813 ,  G01R31/002 ,  H02H9/046

摘要： The present disclosure provides a detection circuit and a detection method. The detection circuit used for detecting an electrostatic discharge (ESD) protective device that is inversely soldered, the ESD protective device includes a first diode, a second diode, and a third diode; the cathodes of the first diode, the second diode and the third diode are mutually connected, and an anode of the third diode is coupled to a ground terminal of the circuit by a divider resistor. The detection circuit includes a comparator. The comparator is configured with a first input end connected to the reference voltage and a second input end coupled to the anode of the third diode, and an output end of the comparator is coupled to a warning device.

摘要翻译： 本公开提供了一种检测电路和检测方法。 用于检测反向焊接的静电放电（ESD）保护装置的检测电路，所述ESD保护装置包括第一二极管，第二二极管和第三二极管; 第一二极管，第二二极管和第三二极管的阴极相互连接，并且第三二极管的阳极通过分压电阻器耦合到电路的接地端子。 检测电路包括比较器。 比较器配置有连接到参考电压的第一输入端和耦合到第三二极管的阳极的第二输入端，并且比较器的输出端耦合到警告装置。

公开(公告)号：US20130271168A1

公开(公告)日：2013-10-17

申请号：US13578438

申请日：2012-05-28

申请人： Yizhuang Zhuang ,  Jungmao Tsai ,  Shiue-shih Liao ,  Songxian Wen ,  Mingfeng Deng ,  JunJie Huang

发明人： Yizhuang Zhuang ,  Jungmao Tsai ,  Shiue-shih Liao ,  Songxian Wen ,  Mingfeng Deng ,  JunJie Huang

IPC分类号： G01R31/3187 ,  G01R31/26

CPC分类号： G09G3/006 ,  G02F2001/136254

摘要： A wiring structure of a wiring area on a liquid crystal displaying panel includes a number of wiring lines connected to one end of a corresponding data line and corresponding scan line on the wiring area, at least one signal testing point, a number of first testing lines connected between the wiring lines and the signal testing point, a number of second testing lines connected between the signal testing point and the other end of the corresponding data line and the corresponding scan line, and a switch controlling circuit connected to the second testing lines. After the testing lines are disconnected from the wiring lines in the previous process, the testing signal still can be transmitted through the other end of the corresponding data line or the scan line, to implement the image test of the liquid crystal displaying panel.

摘要翻译： 液晶显示面板上的布线区域的布线结构包括：多个布线，其连接到相应数据线的一端和布线区域上的对应扫描线，至少一个信号测试点，多个第一测试线 连接在接线和信号测试点之间，连接在信号测试点和相应数据线的另一端和相应的扫描线之间的多条第二测试线以及连接到第二测试线的开关控制电路。 在先前的处理中，测试线与布线断开之后，测试信号仍然可以通过相应的数据线或扫描线的另一端传输，以实现液晶显示面板的图像测试。

公开(公告)号：US08928833B2

公开(公告)日：2015-01-06

申请号：US13376657

申请日：2011-12-04

申请人： Mingfeng Deng ,  Jungmao Tsai ,  Songxian Wen ,  Yizhuang Zhuang ,  Hui Zhou ,  Jingming Wu

发明人： Mingfeng Deng ,  Jungmao Tsai ,  Songxian Wen ,  Yizhuang Zhuang ,  Hui Zhou ,  Jingming Wu

IPC分类号： G02F1/1333

CPC分类号： G02F1/133608 ,  G02B6/0088

摘要： The present invention discloses a backlight module and an LCD device, comprising: a backplane and an LGP; the edge(s) of the LGP is provided with lug boss(es), each lug boss is provided with a positioning hole, and the backplane is provided with rivet(s) for matching with the positioning hole; a buffer structure is arranged between the rivet and the wall of the positioning hole. In the present invention, because the edge(s) of the LGP is provided with lug boss(es), each lug boss is provided with a positioning hole, the arrangement of the positioning hole does not influence the light guide area of the LGP; meanwhile, because a layer of buffer structure is arranged between the positioning hole and the rivet, the rupture of the part with concentrated stress in the positioning hole during collision is avoided. In addition, when the LGP is expanded with heat, the buffer structure can also avoid the extrusion damage caused by direct extrusion between the LGP and the rivet; when the LGP is contracted with cold, the gap between the LGP and the rivet is increased so that shake is easily caused. The gap between the LGP and the rivet is automatically filled by a buffer part through the elastic regulation of the buffer part. Thus, the shake collision of the LGP is avoided.

摘要翻译： 本发明公开了一种背光模块和LCD装置，包括：背板和LGP; LGP的边缘设置有凸耳凸台，每个凸耳凸台设置有定位孔，并且背板设置有用于与定位孔匹配的铆钉; 在铆钉和定位孔的壁之间布置缓冲结构。 在本发明中，由于LGP的边缘设置有凸耳凸台，每个凸耳凸台设置有定位孔，定位孔的布置不影响LGP的导光面积; 同时，由于在定位孔和铆钉之间布置了一层缓冲结构，因此避免了碰撞时定位孔内集中应力部分的破裂。 此外，当LGP通过热膨胀时，缓冲结构也可以避免LGP和铆钉之间的直接挤压引起的挤压损伤; 当LGP收缩时，LGP和铆钉之间的间隙增加，容易引起晃动。 LGP和铆钉之间的间隙通过缓冲部分的弹性调节由缓冲部分自动填充。 因此，避免了LGP的晃动碰撞。

公开(公告)号：US20130273776A1

公开(公告)日：2013-10-17

申请号：US13576400

申请日：2012-04-18

申请人： Mingfeng Deng ,  Jungmao Tsai ,  Songxian Wen ,  Yizhuang Zhuang

发明人： Mingfeng Deng ,  Jungmao Tsai ,  Songxian Wen ,  Yizhuang Zhuang

IPC分类号： H01R27/00 ,  H01R13/66

CPC分类号： H01R13/6485 ,  H01R31/065

摘要： The present invention publishes a conversion adaptor used for LCD panel inspection. The conversion adaptor comprises in order: a first connector plug, an adaptor main body, and a second connector plug; wherein, the first connector plug is used to connect to the connector of a test signal source, and the second connector plug is used to connect to the connector of a connecting cable to an LCD device. The present invention also includes an LCD inspection system. By adding a conversion adaptor, the present invention prevents damage done to the test signal source caused by frequent plugging and unplugging of LVDS cables from its external connector.

摘要翻译： 本发明公开了一种用于LCD面板检查的转换适配器。 转换适配器包括：第一连接器插头，适配器主体和第二连接器插头; 其中，所述第一连接器插头用于连接到测试信号源的连接器，并且所述第二连接器插头用于连接到连接电缆到LCD装置的连接器。 本发明还包括LCD检查系统。 通过添加转换适配器，本发明防止由于其外部连接器频繁地插拔LVDS电缆引起的对测试信号源的损坏。

公开(公告)号：US20130027624A1

公开(公告)日：2013-01-31

申请号：US13375230

申请日：2011-09-29

申请人： Yizhuang Zhuang ,  Jungmao Tsai ,  Songxian Wen ,  Mingfeng Deng ,  Xiaoxin Zhang

发明人： Yizhuang Zhuang ,  Jungmao Tsai ,  Songxian Wen ,  Mingfeng Deng ,  Xiaoxin Zhang

IPC分类号： G02F1/1368 ,  H01L21/02 ,  H01L33/08

CPC分类号： H01L27/124 ,  G02F1/1309 ,  G02F1/1345

摘要： A TFT array substrate includes a pixel region and a wiring region disposed outside the pixel region. The wiring region has a wiring layer including scan or data wirings. A repair wiring layer including repair wiring is disposed insulatedly below or above the wiring layer. A scan or data wiring has a first intersection and a second intersection with a repair wiring section of the repair wiring. When the scan or data wiring is broken, a repair wiring section is cut off the repair wiring by a first cut-off point and a second cut-off point, and the broken scan or data wiring is electrically connected to the repair wiring section through soldering the first intersection and the second intersection. Thus, products that would otherwise be rejected in the manufacturing process of LCD panels can be repaired, which decreases the reject ratio, increases the yield and saves the production cost.

摘要翻译： TFT阵列基板包括像素区域和布置在像素区域外部的布线区域。 布线区域具有包括扫描或数据布线的布线层。 包括修复布线的修复布线层绝缘地布置在布线层的下方或上方。 扫描或数据布线具有与修理布线的修复布线部分的第一交叉点和第二交点。 当扫描或数据接线断裂时，修理接线部分通过第一切断点和第二切断点切断修理布线，并且断线扫描或数据布线通过 焊接第一个十字路口和第二个十字路口。 因此，可以修复在LCD面板的制造过程中被拒绝的产品，这样可以减少废品率，提高产量并节省生产成本。

公开(公告)号：US20140070835A1

公开(公告)日：2014-03-13

申请号：US13697360

申请日：2012-09-26

申请人： Songxian Wen ,  Jungmao Tsai ,  Shiue-shih Liao ,  Yizhuang Zhuang ,  Mingfeng Deng

发明人： Songxian Wen ,  Jungmao Tsai ,  Shiue-shih Liao ,  Yizhuang Zhuang ,  Mingfeng Deng

IPC分类号： G01R31/28 ,  H01L23/58

CPC分类号： G01R31/2851 ,  G02F1/136259 ,  G09G3/36 ,  G09G3/3648 ,  G09G2300/0426 ,  H01L23/58 ,  H01L2924/0002 ,  H01L2924/00

摘要： The present invention discloses a TFT-LCD array substrate comprising a display area comprising a plurality of data lines and a plurality of gate lines; a peripheral area located at a periphery of the display area and provided with a first test short bar provided with a plurality of data test lines for transmitting a test signal for the data lines in the display area, and a second test short bar provided with a gate test line for transmitting a test signal for the gate lines in the display area; and a connecting device comprising a first connection layer and a second connection and provided at a connection location between one of the data test lines in the first test short bar and one of the data lines in the display area, or provided at a connection location between the gate test line in the second test short bar and one of the gate lines in the display area. The present invention also provides a corresponding test method. The present invention can achieve testing the TFT-LCD array substrate twice.

摘要翻译： 本发明公开了一种TFT-LCD阵列基板，其包括包括多条数据线和多条栅极线的显示区域; 外围区域，位于显示区域的周围，并且设置有第一测试短条，第一测试短条设置有用于发送显示区域中的数据线的测试信号的多条数据测试线，以及设置有显示区域的第二测试短条 门测试线，用于发送用于显示区域中的栅极线的测试信号; 以及连接装置，包括第一连接层和第二连接，并且设置在第一测试短条中的数据测试线之一和显示区域中的一条数据线之间的连接位置处，或者设置在第二连接层之间的连接位置处 第二测试短条中的栅极测试线和显示区域中的一条栅极线。 本发明还提供了相应的测试方法。 本发明可以实现TFT-LCD阵列基板的两次测试。