摘要:
A first bar code that is reproduced by linearly polarized red light (first read light) parallel to a short-side direction and a second bar code that is reproduced by linearly polarized green light (second read light) parallel to a long-side direction are recorded on a birefringence label. A probe is a reading device that reads the first and second bar codes from the birefringence label and includes first and second light sources and an imaging unit. The first light source emits the first read light to the birefringence label. The second light source emits the second read light to the birefringence label at a time different from that of the first read light. The imaging unit captures the birefringence label through a polarizing plate having a transmission axis aligned with the short-side direction of the birefringence label, and acquires reproduced images of the first and second bar codes.
摘要:
The light beam measurement apparatus comprises a beam splitter that divides a light beam emitted from a light source unit into two luminous fluxes, a semi-transmitting/reflecting surface that reflects part of one of the divided luminous fluxes back in the opposite direction to the direction of incidence as a sample luminous flux, and reflection-type reference light producing means that converts part of the luminous flux transmitted through the semi-transmitting/reflecting surface into a wavefront-shaped reference luminous flux and outputs this reference luminous flux; this light beam measurement apparatus can carry out both wavefront measurement and light beam spot characteristic measurement on a light beam simultaneously.
摘要:
The light beam measurement apparatus comprises a beam splitter that divides a light beam emitted from a light source unit into two luminous fluxes, a semi-transmitting/reflecting surface that reflects part of one of the divided luminous fluxes back in the opposite direction to the direction of incidence as a sample luminous flux, and reflection-type reference light producing means that converts part of the luminous flux transmitted through the semi-transmitting/reflecting surface into a wavefront-shaped reference luminous flux and outputs this reference luminous flux; this light beam measurement apparatus can carry out both wavefront measurement and light beam spot characteristic measurement on a light beam simultaneously.