METHOD AND DEVICE FOR READING REPRODUCED IMAGE
    1.
    发明申请
    METHOD AND DEVICE FOR READING REPRODUCED IMAGE 审中-公开
    读取重现图像的方法和装置

    公开(公告)号:US20110042591A1

    公开(公告)日:2011-02-24

    申请号:US12861615

    申请日:2010-08-23

    IPC分类号: G06K7/12

    摘要: A first bar code that is reproduced by linearly polarized red light (first read light) parallel to a short-side direction and a second bar code that is reproduced by linearly polarized green light (second read light) parallel to a long-side direction are recorded on a birefringence label. A probe is a reading device that reads the first and second bar codes from the birefringence label and includes first and second light sources and an imaging unit. The first light source emits the first read light to the birefringence label. The second light source emits the second read light to the birefringence label at a time different from that of the first read light. The imaging unit captures the birefringence label through a polarizing plate having a transmission axis aligned with the short-side direction of the birefringence label, and acquires reproduced images of the first and second bar codes.

    摘要翻译: 通过平行于短边方向的线性偏振红光(第一读取光)再现的第一条码和通过与长边方向平行的线偏振绿光(第二读取光)再生的第二条形码是 记录在双折射标签上。 探针是从双折射标签读取第一和第二条形码并且包括第一和第二光源和成像单元的读取装置。 第一光源将第一读取光发射到双折射标签。 第二光源在与第一读取光不同的时间将第二读取光发射到双折射标签。 成像单元通过具有与双折射标签的短边方向对准的透射轴的偏振片捕获双折射标签,并获取第一和第二条形码的再现图像。

    Wavefront-measuring interferometer apparatus, and light beam measurement apparatus and method thereof
    2.
    发明授权
    Wavefront-measuring interferometer apparatus, and light beam measurement apparatus and method thereof 失效
    波前测量干涉仪装置及其光束测量装置及方法

    公开(公告)号:US07538890B2

    公开(公告)日:2009-05-26

    申请号:US11144709

    申请日:2005-06-06

    IPC分类号: G01B11/02

    CPC分类号: G01J9/02 G01J1/4257 G02B5/005

    摘要: The light beam measurement apparatus comprises a beam splitter that divides a light beam emitted from a light source unit into two luminous fluxes, a semi-transmitting/reflecting surface that reflects part of one of the divided luminous fluxes back in the opposite direction to the direction of incidence as a sample luminous flux, and reflection-type reference light producing means that converts part of the luminous flux transmitted through the semi-transmitting/reflecting surface into a wavefront-shaped reference luminous flux and outputs this reference luminous flux; this light beam measurement apparatus can carry out both wavefront measurement and light beam spot characteristic measurement on a light beam simultaneously.

    摘要翻译: 光束测量装置包括:分束器,其将从光源单元发射的光束分成两个光束;半透射/反射表面,其将一个分割光束的一部分反向与方向相反的方向 作为样品光通量的入射角,以及反射型参照光产生装置,其将通过半透射/反射表面透射的光束的一部分转换为波前参考光通量并输出该参考光通量; 该光束测量装置可以同时对光束进行波前测量和光束点特性测量。

    Wavefront-measuring interferometer apparatus, and light beam measurement apparatus and method thereof
    3.
    发明申请
    Wavefront-measuring interferometer apparatus, and light beam measurement apparatus and method thereof 失效
    波前测量干涉仪装置及其光束测量装置及方法

    公开(公告)号:US20050270543A1

    公开(公告)日:2005-12-08

    申请号:US11144709

    申请日:2005-06-06

    CPC分类号: G01J9/02 G01J1/4257 G02B5/005

    摘要: The light beam measurement apparatus comprises a beam splitter that divides a light beam emitted from a light source unit into two luminous fluxes, a semi-transmitting/reflecting surface that reflects part of one of the divided luminous fluxes back in the opposite direction to the direction of incidence as a sample luminous flux, and reflection-type reference light producing means that converts part of the luminous flux transmitted through the semi-transmitting/reflecting surface into a wavefront-shaped reference luminous flux and outputs this reference luminous flux; this light beam measurement apparatus can carry out both wavefront measurement and light beam spot characteristic measurement on a light beam simultaneously.

    摘要翻译: 光束测量装置包括:分束器,其将从光源单元发射的光束分成两个光束;半透射/反射表面,其将一个分割光束的一部分反向与方向相反的方向 作为样品光通量的入射角,以及反射型参照光产生装置,其将通过半透射/反射表面透射的光束的一部分转换为波前参考光通量并输出该参考光通量; 该光束测量装置可以同时对光束进行波前测量和光束点特性测量。