Optical device and apparatus using the optical device
    1.
    发明授权
    Optical device and apparatus using the optical device 失效
    使用光学装置的光学装置和装置

    公开(公告)号:US5311350A

    公开(公告)日:1994-05-10

    申请号:US822017

    申请日:1992-01-16

    CPC分类号: G02F1/19

    摘要: The present invention provides an optical device according to this invention comprising a light transmitting optical member of a high molecular material containing mobile ions, and a pair of electrodes formed on surfaces of the optical member, a required potential difference being provided between the electrodes so as to cause ion conduction in the optical member and to reversibly vary a refractive index of the optical member. According to this invention, a refractive index is reversibly varied due to ion conduction, whereby the modulation of a transmitted beam or a reflected beam by the optical device can be reversibly controlled.

    摘要翻译: 本发明提供了一种根据本发明的光学器件,其包括含有可移动离子的高分子材料的透光光学部件和形成在光学部件的表面上的一对电极,在电极之间设置所需的电位差,以便 以引起光学构件中的离子传导并且可逆地改变光学构件的折射率。 根据本发明,折射率由于离子传导而可逆地变化,从而可以可逆地控制通过光学装置的透射光束或反射光束的调制。

    Angle-of-optical-rotation variation measuring apparatus
    2.
    发明授权
    Angle-of-optical-rotation variation measuring apparatus 失效
    光转角变化测量装置

    公开(公告)号:US4762418A

    公开(公告)日:1988-08-09

    申请号:US70253

    申请日:1987-07-06

    IPC分类号: G01J4/00 G01J4/04 G01N21/21

    CPC分类号: G01J4/04

    摘要: An angle-of-optical-rotation variation measuring apparatus for measuring the highly speedy time-variation of an angle of optical rotation of an optical active substance. The angle-of-optical-rotation variation measuring apparatus comprises an exciting pulse generating source for producing and providing an exciting pulse to a specimen, a light source for providing a monochromatic linearly polarized light beam with the specimen, continuous analysis means for optically rotating the light beam passed through the specimen at successively different angles in the direction of a reference line predetermined to the apparatus and transmitting as an output light beam a part of the light beam which is optically rotated at a predetermined angle, and a streak tube for receiving the output light beam from the analysis means in a direction perpendicular to a time axis of the streak tube.

    摘要翻译: 一种用于测量光学活性物质的旋转角度的高度快速时间变化的光轴旋转变化测量装置。 光转角变化测量装置包括用于产生并向样本提供激发脉冲的激励脉冲发生源,用于向样本提供单色线性偏振光束的光源,用于将样品旋转的连续分析装置 光束沿着与设备预定的参考线的方向以连续不同的角度穿过样本,并且作为输出光束传输以预定角度光学旋转的光束的一部分,以及用于接收 在垂直于条纹管的时间轴的方向上从分析装置输出光束。

    E-O probe
    3.
    发明授权
    E-O probe 失效
    E-O探头

    公开(公告)号:US5500587A

    公开(公告)日:1996-03-19

    申请号:US118257

    申请日:1993-09-09

    CPC分类号: G01R1/071

    摘要: An E-O probe with improved spatial resolution has a light transmissive base part, an electro-optic material which is fixed to the base part and has an index of refraction which varies in response to an electrical field from a measured object, and a mirror which is fixed to the electro-optic material and reflects an incident beam penetrating the base part and the electro-optic material. The mirror is formed to be smaller than the incident beam in diameter. The electro-optic material is formed very thin.

    摘要翻译: 具有改善的空间分辨率的EO探针具有透光基部,电光材料,其固定到基部,并且具有响应于来自测量对象的电场而变化的折射率,以及反射镜 固定到电光材料并且反射穿过基部和电光材料的入射光束。 镜子形成为比入射光束的直径小。 电光材料形成得非常薄。

    Light pulse intensity regenerator, light tranforming repeater,
pre-amplifier for light signal, light intensity change measuring
apparatus, and stabilized light source
    4.
    发明授权
    Light pulse intensity regenerator, light tranforming repeater, pre-amplifier for light signal, light intensity change measuring apparatus, and stabilized light source 失效
    光脉冲再生器,光转发中继器,光信号前置放大器,光强度变化测量装置和稳定光源

    公开(公告)号:US5350913A

    公开(公告)日:1994-09-27

    申请号:US51688

    申请日:1993-04-23

    CPC分类号: H04B10/299

    摘要: Input light incident into fiber end is separated by a light separator. Light traveling straight through the light separator is guided through an optical fiber to a light amplifying and deflecting section, where only components with deflection angle in a predetermined range are amplified and deflected then to be extracted. The extracted components are output as output light through an optical fiber. The other part of light separated by the light separator is received by a photo detector. The light received by the photo detector is converted into an electric signal, and the electric signal is then input into the light amplifying and deflecting section. Using the electric signal generated from the photo detector, desired wave shaping may be effected by adjusting a light amplification factor of the light amplifying and deflecting section, a change speed of deflection angle, and/or a range of deflection angle selected.

    摘要翻译: 入射到光纤端的输入光由光分离器分离。 直线穿过光分离器的光被引导通过光纤到光放大和偏转部分,其中只有偏转角在预定范围内的分量被放大并偏转,然后被提取。 提取的分量通过光纤输出为输出光。 由光分离器分离的光的另一部分由光电检测器接收。 由光检测器接收的光被转换为电信号,然后将电信号输入到光放大和偏转部分。 使用从光电检测器产生的电信号,可以通过调节光放大和偏转部分的光放大系数,偏转角的变化速度和/或所选择的偏转角范围来实现期望的波形整形。

    Polarized light measuring apparatus and phase plate measuring apparatus
    5.
    发明授权
    Polarized light measuring apparatus and phase plate measuring apparatus 失效
    偏光测量装置和相板测量装置

    公开(公告)号:US5237388A

    公开(公告)日:1993-08-17

    申请号:US762457

    申请日:1991-09-19

    IPC分类号: G01J4/00 G01J4/04 G01M11/02

    CPC分类号: G01J4/04

    摘要: Young's interferometer consisting of a single slit and a double slit member, and an analyzer are arranged along the axis of light to be measured. Parallel slits of the double slit member are provided with respective polarizers whose paralyzing directions are at .+-.45.degree. to the longitudinal direction of the parallel slits. The polarizing direction of the analyzer is set in parallel with the parallel slits. The incident light passes through Young's interferometer and the analyzer to form an interference fringe, which is detected by an image detector unit. An image analyzer unit produces an intensity profile of the interference fringe and determines the polarization state of the incident light, for instance, by comparing the produced intensity profile with conceivable profiles stored in advance.

    摘要翻译: 由单个狭缝和双缝隙构件组成的杨氏干涉仪和分析器沿着待测量的光轴设置。 双缝构件的平行狭缝设置有各自的偏振器,其麻痹方向与平行狭缝的纵向方向成+/- 45度。 分析仪的偏振方向与平行狭缝平行设置。 入射光通过杨氏干涉仪和分析仪,形成一个由图像检测器单元检测的干涉条纹。 图像分析器单元产生干涉条纹的强度分布并且确定入射光的偏振状态,例如通过将产生的强度分布与预先存储的可想到的曲线进行比较。

    Electro-optic apparatus for measuring an electric field of a sample
    6.
    发明授权
    Electro-optic apparatus for measuring an electric field of a sample 失效
    用于测量样品电场的电光装置

    公开(公告)号:US5592101A

    公开(公告)日:1997-01-07

    申请号:US94974

    申请日:1993-07-22

    IPC分类号: G01R1/07 G01R31/308 G01R29/12

    CPC分类号: G01R1/071 G01R31/308

    摘要: An electric field measuring apparatus for causing an optical probe head having an electro-optic member with an electro-optic material to oppose a sample such as a semiconductor integrated circuit device and for optically measuring a voltage of an opposite portion of the sample. The electro-optic material consists of an LiTaO.sub.3 electro-optic crystal or the like, the polarization characteristics of which change depending on the electric-field strength of the sample. The electro-optic member is supported on a guide mechanism to be reciprocally movable within a predetermined stroke range in a direction of the sample. The guide mechanism is reciprocated in the direction of the sample to control the distance between the electro-optic material and the sample. In measurement, light is incident on the electro-optic material whose polarization characteristics change depending on the electric-field strength, and the light intensity of a predetermined polarized component of the light reflected by the electro-optic material is detected, thereby measuring the electric-field strength and voltage of the sample. When if the electro-optic member is brought into contact with the sample, the sample is not damaged due to the stroke set in the guide mechanism. The simple structure of the guide mechanism realizes improvement of operability. The electro-optic member can therefore safety approach the sample to increase the measurement sensitivity.

    摘要翻译: 一种电场测量装置,用于使具有电光材料的光学元件的光学探针头与诸如半导体集成电路器件的样品相对,并用于光学测量样品的相对部分的电压。 电光材料由LiTaO 3电光晶体等构成,其极化特性根据样品的电场强度而变化。 电光元件被支撑在引导机构上,以在样本的方向上在预定行程范围内往复移动。 引导机构在样品的方向上往复运动,以控制电光材料和样品之间的距离。 在测量中,光入射到电光材料上,其偏振特性根据电场强度而变化,并且检测由电光材料反射的光的预定偏振分量的光强度,由此测量电 场强和样品电压。 如果电光元件与样品接触,则由于引导机构中设置的行程,样品不会损坏。 引导机构的简单结构实现了可操作性的提高。 因此,电光元件可以安全地接近样品以提高测量灵敏度。

    System for measuring timing relationship between two signals
    7.
    发明授权
    System for measuring timing relationship between two signals 失效
    用于测量两个信号之间的时序关系的系统

    公开(公告)号:US5499190A

    公开(公告)日:1996-03-12

    申请号:US5091

    申请日:1993-01-15

    摘要: A system for measuring timing relationship between two signals for accurately measuring a timing relationship between signals includes an electro-optic measuring unit and a waveform storage and processing unit. The electro-optic measuring unit samples electrical signals from a device under measurement via a strobe light so as to measure the signal waveform. The electro-optic unit uses a laser diode as a light source. The waveform storage and processing unit stores the electrical signal waveforms measured by the electro-optic measuring unit in digital form. The waveform storage and processing unit also calculates a correlation between two stored electrical signal waveforms via a correlation calculation unit, and also detects a peak of the correlation to detect a timing relationship between the signals.

    摘要翻译: 用于测量用于精确测量信号之间的定时关系的两个信号之间的定时关系的系统包括电光测量单元和波形存储和处理单元。 电光测量单元通过闪光灯对来自被测器件的电信号进行采样,以测量信号波形。 电光单元使用激光二极管作为光源。 波形存储和处理单元以数字形式存储由电光测量单元测量的电信号波形。 波形存储和处理单元还经由相关计算单元计算两个存储的电信号波形之间的相关性,并且还检测相关的峰值以检测信号之间的定时关系。

    Voltage measuring apparatus having an electro-optic member
    8.
    发明授权
    Voltage measuring apparatus having an electro-optic member 失效
    具有电光元件的电压测量装置

    公开(公告)号:US5444365A

    公开(公告)日:1995-08-22

    申请号:US113239

    申请日:1993-08-30

    CPC分类号: G01R1/071 Y10S435/808

    摘要: A change in voltage can be sensitively detected at a local part of a measured object. A set of laser medium and E-O probe are disposed between a pair of mirrors, a first one and a second one, forming a laser resonator. A linearly polarized light is emitted from the laser medium. The polarized light enters the E-O probe, and returns after being reflected by the second mirror. When a voltage is given to the E-O probe from the measured object, depending on the voltage, a refractive index of the E-O probe is changed, the light emitted from the E-O probe is ovally polarized, and a resonance status of the laser resonator then varies. Therefore, the light intensity emitted through the partially penetrating first mirror to the outside of the laser resonator corresponds to the voltage at the measured object in the proximity of the E-O probe. Consequently, a voltage distribution on the measured object such as IC with fine structures can be two-dimensionally detected.

    摘要翻译: 可以在测量对象的局部部分敏感地检测电压变化。 一组激光介质和E-O探头设置在一对反射镜之间,第一和第二反射镜形成激光谐振器。 从激光介质发射线偏振光。 偏振光进入E-O探头,并在被第二个反射镜反射之后返回。 当从测量对象向EO探针施加电压时,根据电压,EO探针的折射率改变,从EO探针发射的光被卵巢极化,然后激光谐振器的共振状态变化 。 因此,通过部分穿透的第一反射镜发射到激光谐振器的外部的光强度对应于E-O探头附近的测量对象处的电压。 因此,可以二维地检测诸如具有精细结构的IC的测量对象上的电压分布。

    Voltage detection apparatus
    9.
    发明授权
    Voltage detection apparatus 失效
    电压检测装置

    公开(公告)号:US5583444A

    公开(公告)日:1996-12-10

    申请号:US618406

    申请日:1996-03-19

    摘要: This invention has as its object to provide a voltage measurement apparatus which has a compact probe unit, and which can perform a measurement in a non-contact manner. The voltage measurement apparatus includes detection means for detecting an electric field generated in a space by a voltage applied to the surface of a device to be measured, light-emitting means for modulating output light by superposing a detected signal obtained from the detection means on a bias current which is supplied to inductively radiate the output light, a constant current source for supplying the bias current to the light-emitting means, extraction means for extracting a signal component of the output light from the light-emitting means, and light-transmission means for guiding the output light from the light-emitting means to the extraction means, and measures the applied voltage to the surface of the device to be measured by bringing the detection means close to the device to be measured in a non-contact manner.

    摘要翻译: 本发明的目的是提供一种电压测量装置,其具有紧凑的探针单元,并且可以以非接触方式进行测量。 电压测量装置包括检测装置,用于通过施加到被测量装置的表面的电压来检测在空间中产生的电场;发光装置,用于通过将从检测装置获得的检测信号叠加在一个 提供用于感应放射输出光的偏置电流,用于向发光装置提供偏置电流的恒流源,用于从发光装置提取输出光的信号分量的提取装置,以及光传输 用于将来自发光装置的输出光引导到提取装置的装置,并且通过以非接触的方式使检测装置靠近被测量装置来测量施加到要测量装置的表面的电压。

    Method of positioning an electrooptic probe of an apparatus for the
measurement of voltage
    10.
    发明授权
    Method of positioning an electrooptic probe of an apparatus for the measurement of voltage 失效
    定位用于测量电压的装置的电光探针的方法

    公开(公告)号:US5552716A

    公开(公告)日:1996-09-03

    申请号:US213005

    申请日:1994-03-14

    CPC分类号: G01R31/308

    摘要: An method of positioning an E-O probe applied to an apparatus for the measurement of voltage. In the first step, the relative position of the E-O probe against the magnifying optical system in the first condition of being focused the magnifying optical system on the base of the E-O probe, and the focal point difference between the focal plane of the magnifying optical system in the second condition that the E-O probe is substantially out of the optical path for observation of the surface of the device and the focal plane in the first condition are stored. The relative position and the focal point difference are fixed in the apparatus for the measurement of voltage regardless of the device to be measured. Next, in the second step, the focus of the magnifying optical system is adjusted to the observation position of the surface of the device in the second condition, and then in the third step, the magnifying optical system, the E-O probe, and the probe stage are separated from the device by the focal point difference stored in the first step by the Z-axis stage, and in the fourth step, the E-O probe is moved to the relative position of the E-O probe stored in the first step relative to the magnifying optical system by the probe stage.

    摘要翻译: 将用于测量电压的设备的E-O探头定位的方法。 在第一步骤中,在将放大光学系统聚焦在EO探针的基座上的第一条件下,EO探针对放大光学系统的相对位置以及放大光学系统的焦平面之间的焦点差 在第二条件下,EO探针基本上不在用于观察装置的表面的光路中,并且在第一条件下存储焦平面。 无论要测量的装置如何,相对位置和焦点差都固定在用于测量电压的装置中。 接下来,在第二步骤中,放大光学系统的焦点在第二条件下被调整到装置的表面的观察位置,然后在第三步骤中,放大光学系统,EO探针和探针 通过Z轴级在第一步骤中存储的焦点差与装置分离阶段,并且在第四步骤中,将EO探针移动到相对于第一步骤中存储的EO探针的相对位置 通过探针台放大光学系统。