Measurement, calibration and compensation system and method for machine tool

    公开(公告)号:US10189133B2

    公开(公告)日:2019-01-29

    申请号:US15388496

    申请日:2016-12-22

    Abstract: A measurement, calibration and compensation system for machine tool includes a first positioning base; two first speckle image sensors for sensing speckle positions of an object holding unit at a first XY plane and a first XZ plane of the first positioning base before and after the machine tool is started for machining; a second positioning base; two second speckle image sensors for sensing speckle positions of a cutter holding unit at a second XY plane and a second YZ plane of the second positioning base before and after the machine tool is started for machining. Thus, the thermal expansion at all axes of the machine tool can be measured in a simplified and low-cost way, and the absolute positioning coordinates of all axes of the machine tool can be calibrated in real time to avoid reduced positioning accuracy due to the thermal expansion of the multi-axis machine tool.

    Device and method of quick subpixel absolute positioning

    公开(公告)号:US09671218B2

    公开(公告)日:2017-06-06

    申请号:US14578597

    申请日:2014-12-22

    CPC classification number: G01B11/002 G01B9/02094

    Abstract: A quick subpixel absolute positioning device and method are introduced. The method includes the steps of (A) capturing a real-time speckle pattern of a target surface; (B) providing a coarse-precision speckle coordinate pattern and a plurality of fine-precision speckle coordinate patterns, wherein the coarse-precision speckle coordinate pattern and the fine-precision speckle coordinate patterns include a coordinate value; (C) comparing the real-time speckle coordinate pattern with the coarse-precision speckle coordinate pattern by an algorithm and then comparing the real-time speckle coordinate pattern with the fine-precision speckle coordinate patterns to obtain a coordinate value, wherein each said coarse-precision speckle coordinate pattern corresponds to a set of fine-precision speckle coordinate patterns, and the fine-precision speckle coordinate patterns are obtained when the coarse-precision speckle coordinate pattern is captured again and then captured repeatedly according to a fixed fine-precision displacement distance. Accordingly, the subpixel positioning is attained by quick comparison and manifests high precision.

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