公开(公告)号：US20190323982A1

公开(公告)日：2019-10-24

申请号：US16342268

申请日：2017-10-24

Applicant: NATIONAL INSTITUTE FOR MATERIALS SCIENCE ,  KYOCERA CORPORATION

Inventor： Genki YOSHIKAWA ,  Kota SHIBA ,  Gaku IMAMURA ,  Takanori YASUDA ,  Kyohei KOBAYASHI ,  Hisashi SAKAI

IPC: G01N27/22 ,  G01N33/00

Abstract: The invention provides: a gas sensor device that is capable of removing a component adsorbed on a gas sensor by relatively simple means and easily restoring a signal baseline of the gas sensor to a constant state; and a method for removing a gas component. The gas sensor device according to an embodiment of the invention includes a gas sensor and cleaning means that contains a liquid for cleaning the gas sensor. The gas sensor includes a sensor main body that is capable of detecting a characteristic parameter of a component present in a gas phase or a liquid phase, and a sensitive membrane that is coated on a surface of the sensor main body and is durable against the liquid.

公开(公告)号：US20210270781A1

公开(公告)日：2021-09-02

申请号：US17306730

申请日：2021-05-03

Applicant: KYOCERA CORPORATION

Inventor： Kyohei KOBAYASHI

IPC: G01N29/24 ,  H03H9/145 ,  G01N29/22 ,  G01N29/02

Abstract: A sensor apparatus includes: an element substrate; a detecting section disposed on an upper surface of the element substrate, the detecting section including a reaction section having an immobilization film to detect an analyte; a first IDT electrode configured to generate an acoustic wave which propagates toward the reaction section, and a second IDT electrode configured to receive the acoustic wave which has passed through the reaction section; and a protective film located on the upper surface of the element substrate so as to cover the first IDT electrode, the second IDT electrode, and at least part of the immobilization film, the protective film extending between and contacting with the immobilization film and at least one of the first IDT electrode and the second IDT electrode.

公开(公告)号：US20190120781A1

公开(公告)日：2019-04-25

申请号：US16089568

申请日：2017-03-29

Applicant: KYOCERA Corporation

Inventor： Kyohei KOBAYASHI ,  Ryo UENO ,  Shinichi ABE ,  Hisashi SAKAI ,  Masaru NAGATA ,  Takanori YASUDA

IPC: G01N27/12

Abstract: A stress sensor comprises: a diaphragm; an intermediate layer disposed on a surface of the diaphragm; a sensitive membrane disposed on the intermediate layer; and a piezoresistive element disposed in a region of the diaphragm in contact with an outer edge of the intermediate layer.

公开(公告)号：US20190227033A1

公开(公告)日：2019-07-25

申请号：US16256952

申请日：2019-01-24

Applicant: KYOCERA CORPORATION

Inventor： Kyohei KOBAYASHI ,  Yuji KISHIDA

IPC: G01N29/02 ,  G01N29/22 ,  G01N29/24

Abstract: A sensor apparatus according to an embodiment of the present invention includes an element substrate, an element electrode located on an upper surface of the element substrate, an insulating member covering at least a part of the element electrode, and a detection part that includes an immobilizing film located on the upper surface of the element substrate or an upper surface of the insulating member, and performs a detection of a detection object contained in a specimen. A surface roughness of the immobilizing film is smaller than a surface roughness of the element electrode. In a sensor apparatus of other embodiment of the present invention, an amount of oxygen in a surface layer part of the immobilizing film is smaller than an amount of oxygen in a surface layer part of the element electrode.

公开(公告)号：US20180348166A1

公开(公告)日：2018-12-06

申请号：US15771883

申请日：2017-02-28

Applicant: KYOCERA CORPORATION

Inventor： Kyohei KOBAYASHI

IPC: G01N29/02

CPC classification number: G01N29/02

Abstract: There are provided a sensor element and a sensor device having high measurement accuracy by improving temperature characteristics. A sensor element includes an element substrate, a detection portion located on an upper surface of the element substrate, and a protective film covering at least a first IDT electrode and a second IDT electrode. The element substrate is formed of quartz and has the following Euler angles, φ=0°, 97.2°≤θ≤128.9°, and 85°≤ψ≤95°. An expression 0

公开(公告)号：US20200319172A1

公开(公告)日：2020-10-08

申请号：US16904931

申请日：2020-06-18

Applicant: KYOCERA CORPORATION

Inventor： Kyohei KOBAYASHI

IPC: G01N33/543 ,  H03H9/145 ,  G01N29/22 ,  G01N29/24 ,  G01N29/02 ,  H01L41/047 ,  H01L41/113

Abstract: A sensor apparatus capable of measuring an analyte with excellent sensitivity is provided. A sensor apparatus includes an element substrate; a detecting section disposed on an upper surface of the element substrate, the detecting element including a reaction section having an immobilization film to detect an analyte, a first IDT electrode configured to generate an acoustic wave which propagates toward the reaction section, and a second IDT electrode configured to receive the acoustic wave which has passed through the reaction section; and a protective film which covers the first IDT electrode and the second IDT electrode. The element substrate is configured so that a region where the reaction section is located is at a lower level than a region where the first IDT electrode is located and a region where the second IDT electrode is located.

公开(公告)号：US20170261470A1

公开(公告)日：2017-09-14

申请号：US15305788

申请日：2015-10-30

Applicant: KYOCERA CORPORATION

Inventor： Kyohei KOBAYASHI

IPC: G01N29/02 ,  G01N29/24

CPC classification number: G01N29/02 ,  G01N29/022 ,  G01N29/222 ,  G01N29/24 ,  G01N29/2462 ,  G01N2291/0255 ,  G01N2291/0423

Abstract: A sensor apparatus includes an element substrate; a detecting section disposed on an upper surface of the element substrate, the detecting section including a reaction section having an immobilization film to detect an analyte, a first IDT electrode configured to generate an acoustic wave which propagates toward the reaction section, and a second IDT electrode configured to receive the acoustic wave which has passed through the reaction section; and a protective film which covers the first IDT electrode and the second IDT electrode. The upper surface of the element substrate includes a third region which is located between a first region where the first IDT electrode and the second IDT electrode are located and a second region where the reaction section is located. At least part of the third region is lower in level than the first region and the second region.

公开(公告)号：US20170199180A1

公开(公告)日：2017-07-13

申请号：US15305761

申请日：2015-09-30

Applicant: KYOCERA CORPORATION

Inventor： Kyohei KOBAYASHI

IPC: G01N33/543 ,  H01L41/047 ,  H03H9/145 ,  H01L41/113 ,  G01N29/02 ,  G01N29/24

Abstract: A sensor apparatus capable of measuring an analyte with excellent sensitivity is provided. A sensor apparatus includes an element substrate; a detecting section disposed on an upper surface of the element substrate, the detecting element including a reaction section having an immobilization film to detect an analyte, a first IDT electrode configured to generate an acoustic wave which propagates toward the reaction section, and a second IDT electrode configured to receive the acoustic wave which has passed through the reaction section; and a protective film which covers the first IDT electrode and the second IDT electrode. The element substrate is configured so that a region where the reaction section is located is at a lower level than a region where the first IDT electrode is located and a region where the second IDT electrode is located.

公开(公告)号：US20170016858A1

公开(公告)日：2017-01-19

申请号：US15116191

申请日：2015-01-27

Applicant: KYOCERA CORPORATION

Inventor： Kyohei KOBAYASHI ,  Yuji KISHIDA

IPC: G01N29/02

CPC classification number: G01N29/022 ,  B01L3/5027 ,  B01L2300/0645 ,  B01L2300/0663 ,  B01L2300/16 ,  G01N29/222 ,  G01N29/2468 ,  G01N2291/021 ,  G01N2291/022 ,  G01N2291/0255 ,  G01N2291/0256 ,  G01N2291/0257 ,  G01N2291/0423 ,  G01N2291/102

Abstract: A sensor apparatus according to an embodiment of the present invention includes an element substrate, an element electrode located on an upper surface of the element substrate, an insulating member covering at least a part of the element electrode, and a detection part that includes an immobilizing film located on the upper surface of the element substrate or an upper surface of the insulating member, and performs a detection of a detection object contained in a specimen. A surface roughness of the immobilizing film is smaller than a surface roughness of the element electrode. In a sensor apparatus of other embodiment of the present invention, an amount of oxygen in a surface layer part of the immobilizing film is smaller than an amount of oxygen in a surface layer part of the element electrode.

Abstract translation: 根据本发明的实施例的传感器装置包括元件基板，位于元件基板的上表面上的元件电极，覆盖元件电极的至少一部分的绝缘构件和检测部件，其包括固定 膜位于元件基板的上表面或绝缘构件的上表面，并且对检体中包含的检测对象进行检测。 固定膜的表面粗糙度小于元件电极的表面粗糙度。 在本发明的其他实施方式的传感器装置中，固定膜的表层部的氧量少于元件电极的表层部的氧量。