Structured illuminating microscopy apparatus

    公开(公告)号:US10261304B2

    公开(公告)日:2019-04-16

    申请号:US14597495

    申请日:2015-01-15

    申请人: NIKON CORPORATION

    摘要: An acquiring unit of a structured illuminating microscopy apparatus acquires at least two modulated images having the same wave number vector and the different phases; and a calculating unit of the structured illuminating microscopy apparatus, in a spatial frequency spectrum of each of at least the two modulated images acquired by the acquiring unit, separates a 0th-order modulating component and ±first-order modulating components of observational light fluxes superimposed on arbitrary two observation points based on at least four observation values regarding the two observation points which are mutually displaced by an amount of the wave number vector.

    Structured illuminating microscopy apparatus

    公开(公告)号:US11187883B2

    公开(公告)日:2021-11-30

    申请号:US16290149

    申请日:2019-03-01

    申请人: NIKON CORPORATION

    IPC分类号: G02B27/58 G02B21/06 G02B21/36

    摘要: An acquiring unit of a structured illuminating microscopy apparatus acquires at least two modulated images having the same wave number vector and the different phases; and a calculating unit of the structured illuminating microscopy apparatus, in a spatial frequency spectrum of each of at least the two modulated images acquired by the acquiring unit, separates a 0th-order modulating component and ±first-order modulating components of observational light fluxes superimposed on arbitrary two observation points based on at least four observation values regarding the two observation points which are mutually displaced by an amount of the wave number vector.

    Microscope system
    4.
    发明授权

    公开(公告)号:US10451860B2

    公开(公告)日:2019-10-22

    申请号:US15296442

    申请日:2016-10-18

    申请人: NIKON CORPORATION

    发明人: Hiroshi Ohki

    摘要: A microscope system as an optical microscope system for observing a specimen includes: an imaging optical system that forms an image of transmitted light or reflected light from the specimen; an illumination light source that illuminates illumination light on the specimen; an illumination optical system that has a first spatial light modulation element, which changes intensity distribution of the illumination light at a conjugate position of a pupil of the imaging optical system, and illuminates light, which is originated from the illumination light source, on the specimen; an image sensor that detects light through the imaging optical system; and a calculation section that calculates the intensity distribution of the illumination light appropriate for observation of the specimen on the basis of the intensity distribution of the illumination light formed by the first spatial light modulation element and output data detected by the image sensor.