INSPECTION SYSTEM AND INSPECTION METHOD
    1.
    发明公开

    公开(公告)号:US20240310304A1

    公开(公告)日:2024-09-19

    申请号:US18574578

    申请日:2022-07-06

    IPC分类号: G01N23/046

    摘要: An inspection system and method, the system includes: a ray source rotatable between at least two scanning positions around a rotation axis, a rotation angle of the ray source between two adjacent scanning positions being greater than an angle of adjacent target spots of the ray source relative to the rotation axis; a detector assembly; and a conveying device for carrying an object. The ray source and the detector assembly are movable in a traveling direction relative to the conveying device so that the object enters an inspection region. When the ray source is at one of the scanning positions, the ray source and the detector assembly move in the traveling direction and the ray source emits X-rays; and when the ray source and the detector assembly move a predetermined distance in the traveling direction, the ray source rotates around the rotation axis to another one of the scanning positions.

    INSPECTION SYSTEM AND INSPECTION METHOD
    2.
    发明公开

    公开(公告)号:US20240142658A1

    公开(公告)日:2024-05-02

    申请号:US18574633

    申请日:2022-07-06

    IPC分类号: G01V5/226 G01N23/046

    CPC分类号: G01V5/226 G01N23/046

    摘要: An inspection system, including: at least one ray source rotatable between at least two scanning positions around a rotation axis, and a rotation angle of at least one ray source between two adjacent scanning positions is greater than an angle of adjacent target spots of each ray source relative to the rotation axis; a detector assembly, and a conveying device configured to carry an object to be inspected. At least one ray source and the detector assembly are movable in a traveling direction relative to the conveying device, so that the object to be inspected may enter an inspection region. When at least one ray source is located at one scanning positions, at least one ray source and the detector assembly move in the traveling direction relative to the conveying device and at least one ray source emits X-rays; after moving a predetermined distance, at least one ray source rotates around the rotation axis to another scanning position.

    RAY SCANNING APPARATUS
    4.
    发明公开

    公开(公告)号:US20240248048A1

    公开(公告)日:2024-07-25

    申请号:US18575794

    申请日:2022-07-07

    IPC分类号: G01N23/046

    摘要: A ray scanning apparatus, including: a conveying device; a ray source assembly including a plurality of ray source modules arranged around the scanning area in a non-enclosed structure opened on one side of the scanning area; and a detector assembly including a plurality of detector sets arranged around the scanning area in a non-enclosed structure opened on one side of the scanning area, where the opening of the non-enclosed structure of the ray source assembly is opposite to the opening of the non-enclosed structure of the detector assembly, the plurality of detector sets are fixed in a same plane perpendicular to the conveying direction of the object under inspection, and the plurality of ray source modules of the ray source assembly are arranged in a plurality of different planes perpendicular to the conveying direction of the object under inspection.

    INSPECTION SYSTEM AND METHOD
    6.
    发明公开

    公开(公告)号:US20240345005A1

    公开(公告)日:2024-10-17

    申请号:US18575673

    申请日:2022-07-06

    摘要: An inspection system and method, the inspection system includes: a carrying device, at least one ray source, where each ray source includes a separate housing to define a vacuum space and a plurality of target spots enclosed within the housing; and a detector assembly. The at least one ray source and the detector assembly are lifted or lowered along a central axis of the carrying device relative to the carrying device. When viewed along the central axis, the ray source is translatable between scanning positions relative to the carrying device. When the ray source is at one of the scanning positions, the ray source and the detector assembly are lifted or lowered along the central axis, and the ray source emits X-rays; and when the ray source and the detector assembly are lifted or lowered a predetermined distance, the ray source translates to another one of the scanning positions.

    INSPECTION SYSTEM AND METHOD
    7.
    发明公开

    公开(公告)号:US20240310305A1

    公开(公告)日:2024-09-19

    申请号:US18575577

    申请日:2022-07-06

    摘要: An inspection system and method, and the system includes: a ray source; a detector assembly; and a conveying device for carrying an aviation pallet cargo. The ray source and the detector assembly are movable in a traveling direction parallel to the central axis relative to the conveying device so that the aviation pallet cargo enters an inspection region, the ray source is translatable between a plurality of scanning positions, and a translation distance of the ray source between two adjacent scanning positions is greater than a spacing between adjacent target spots of the ray source. When the ray source is located at one of the scanning positions, the ray source and the detector assembly move in the traveling direction and the ray source emits X-rays; and when the ray source and the detector assembly move a predetermined distance in the traveling direction, the ray source translates to another one of the plurality of scanning positions.

    INSPECTION SYSTEM AND INSPECTION METHOD
    9.
    发明公开

    公开(公告)号:US20240219325A1

    公开(公告)日:2024-07-04

    申请号:US18574653

    申请日:2022-07-06

    摘要: Provided are an inspection system and an inspection method, the inspection system includes: a carrying device (300); at least one ray source (100) each includes a separate housing (110) to define a vacuum space and target spots enclosed within the housing (110), and a detector assembly (200). The at least one ray source (100) is rotatable between a plurality of scanning positions around a rotation axis relative to the carrying device (300). The at least one ray source (100) and the detector assembly (200) may be lifted or lowered along the rotation axis relative to the carrying device (300). When the at least one ray source (100) is located at one of scanning positions relative to the carrying device (300), the at least one ray source (100) and the detector assembly (200) are lifted or lowered along the rotation axis relative to the carrying device (300) and the at least one ray source (100) emits X-rays. After the at least one ray source (100) and the detector assembly (200) are lifted or lowered a predetermined distance relative to the carrying device (300), the at least one ray source (100) rotates around the rotation axis relative to the carrying device (300) to another one of scanning positions.

    CONVEYING DEVICE AND INSPECTION SYSTEM
    10.
    发明公开

    公开(公告)号:US20240092584A1

    公开(公告)日:2024-03-21

    申请号:US18255072

    申请日:2021-11-22

    IPC分类号: B65G13/10 B65G13/12

    摘要: A conveying device (100) and an inspection system (1000) are provided. The conveying device includes: a first support frame (1); a first conveying mechanism (2) and a second conveying mechanism (3) which are installed on the first support frame; and a switching mechanism (4) configured to selectively lift the first conveying mechanism or the second conveying mechanism in a vertical direction, such that the first conveying mechanism or the second conveying mechanism carries goods (401) and conveys the goods in a first horizontal direction or a second horizontal direction different from the first horizontal direction. The conveying device may achieve a positioning and a smooth continuous conveying of goods, and achieve a smooth conveying and a calibrated positioning of the goods in different postures.