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1.发明公开公开(公告)号：US20240280514A1
公开(公告)日：2024-08-22
申请号：US18648564
申请日：2024-04-29
IPC分类号： G01N23/10 , G01N23/04 , G01N23/046 , G01N23/083 , G01N23/087 , G01V5/22 , G06T11/00
CPC分类号： G01N23/10 , G01N23/04 , G01N23/046 , G01N23/083 , G01N23/087 , G01V5/22 , G06T11/001 , G01N2223/04 , G01N2223/306 , G01N2223/3307 , G01N2223/401 , G01N2223/403 , G01N2223/408 , G01N2223/639
摘要： In an approach to X-ray inspection image display systems, a colorized X-ray inspection image is received comprising a monochrome X-ray inspection image that is colorized in accordance with an X-ray inspection system false colorization scheme. The colorized X-ray inspection image is filtered by performing pixel shading on the colorized X-ray inspection image to generate a custom colorized X-ray inspection image having a custom false colorization scheme that is different from the X-ray inspection system false colorization scheme.
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公开(公告)号：US12019035B2
公开(公告)日：2024-06-25
申请号：US17378037
申请日：2021-07-16
发明人： Simon Archambault
IPC分类号： G01N23/18 , G01N23/04 , G01N23/083 , G01N23/10 , G06T5/00
CPC分类号： G01N23/18 , G01N23/04 , G01N23/083 , G01N23/10 , G06T5/00 , G01N2223/04 , G01N2223/3308 , G01N2223/401 , G01N2223/643 , G01N2223/652 , G06T2207/10116
摘要： A method for detecting the maximum potential presence of a material in an object. The method includes obtaining raw x-ray image data comprising a plurality of pixels for the object from an X-ray scanning device, wherein each pixel of the plurality of pixels has associated therewith an attenuation value and an effective atomic number (Zeff) for the pixel. The method further includes converting, for each pixel having a Zeff value greater than a threshold effective atomic number (Zeff-threshold), the Zeff at the pixel to the Zeff-threshold while applying a correction factor to the attenuation value for the pixel to bring the attenuation value into correspondence with the conversion of the Zeff value for the pixel and determining a maximum potential amount of the material present at each pixel based on the corrected attenuation value at the pixel. This renders material more apparent in visual display.
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公开(公告)号：US20240151658A1
公开(公告)日：2024-05-09
申请号：US18281389
申请日：2022-03-08
发明人： Hyun Woo LEE , Je Hwan JEON
IPC分类号： G01N23/04 , G01N23/083 , G01N23/10 , G06N3/04
CPC分类号： G01N23/04 , G01N23/083 , G01N23/10 , G06N3/04
摘要： The present invention relates to a system and a method for detecting a dangerous substance by using artificial intelligence. The present invention is characterized in that a dangerous substance can be rapidly detected from substances being inspected at airports, ports, military bases, event venues, stadiums, exhibition halls, concert halls, government office buildings, or venues where VIP protection is sought, by learning the X-ray color of each dangerous substance through deep learning, using the property that a color indicated by a constituent atom of a substance being inspected with the highest atomic number in the periodic table is displayed when the substance being inspected is irradiated with X-rays from an X-ray instrument.
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公开(公告)号：US11933934B2
公开(公告)日：2024-03-19
申请号：US17420678
申请日：2020-01-03
发明人： Xuping Fan , Quanwei Song , Yu Hu , Shangmin Sun
CPC分类号： G01V5/0016 , G01N23/04 , G01N23/10 , G01N2223/301 , G01N2223/308 , G01N2223/639
摘要： The present disclosure relates to a security inspection device and a transfer method, and the security inspection device includes an arm frame, provided with detectors, and configured to form an inspection channel; a first compartment, internally provided with a radiation source and connected with the arm frame, a protection wall, connected with the first compartment or the arm frame, and configured to perform radiation protection for an object to be protected, and a tire assembly, configured to enable the security inspection device to move relative to the ground, and the arm frame, the first compartment, the protection wall and the tire assembly are set to be transported together in a connected state.
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公开(公告)号：US20240085349A1
公开(公告)日：2024-03-14
申请号：US18259772
申请日：2021-12-15
发明人： Zhiqiang CHEN , Lei LIU , Shangmin SUN , Chunguang ZONG , Yu HU , Yuan MA , Zheng JI
CPC分类号： G01N23/04 , G01N23/10 , G01V5/0016
摘要： The present disclosure provides a radiation inspection system, including a container respectively provided with an entrance and an exit on opposite side walls thereof; and a radiation scanning imaging device disposed in the container and having an inspection channel. The radiation scanning imaging device includes a ray source, the ray source includes ray generators, and ray generators are configured to emit ray beams at different angles, so that the radiation scanning imaging device performs radiation scanning inspection on an object to be inspected passing through the inspection channel from the entrance to the exit.
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公开(公告)号：US11885752B2
公开(公告)日：2024-01-30
申请号：US17363950
申请日：2021-06-30
发明人： Emmanuel St-Aubin , Philippe Desjeans-Gauthier , Ola El Bakry , Simon Archambault , William Awad
IPC分类号： G01N23/00 , G01N23/04 , G01N23/087 , G01N23/10 , G01V5/00
CPC分类号： G01N23/04 , G01N23/087 , G01N23/10 , G01V5/0041 , G01N2223/04 , G01N2223/1016 , G01N2223/206 , G01N2223/3035 , G01N2223/3307 , G01N2223/3308 , G01N2223/41 , G01N2223/424 , G01N2223/5015 , G01N2223/639 , G01N2223/643
摘要： A method of determining at least one x-ray scanning system geometric property includes the steps of positioning a calibration device inside a scanning chamber of the scanning device, the chamber being intersected by at least one fan beam of x-rays during a scanning operation, measuring a distance between the calibration device and at least one inner wall of the chamber, scanning the calibration device to produce an image of the calibration device, identifying pixels representing the a geometric feature of the calibration device in the image, determining a position and orientation of the pixels representing the geometric feature in the image and, determining a scanning system property based on the position and orientation of the pixels representing the geometric feature in the image. The position and orientation of the feature in the scanning chamber and the x-ray scanning system property may be determined simultaneously.
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公开(公告)号：US11860112B2
公开(公告)日：2024-01-02
申请号：US17692359
申请日：2022-03-11
申请人： NEC Corporation
发明人： Naoya Nakayama , Masanori Sekido , Shinichi Morimoto , Masayuki Ariyoshi , Tatsuya Sumiya , Toshiyuki Nomura , Toshinori Takemura
CPC分类号： G01N23/10 , G01N23/04 , G01N23/18 , G01V5/0016 , G01N2223/03 , G01N2223/052 , G01N2223/101
摘要： To shorten a waiting time for a belongings inspection, the present invention provides an inspection system 10 including: an electromagnetic wave transmission/reception unit 11 that irradiates an electromagnetic wave having a wavelength of equal to or more than 30 micrometers and equal to or less than one meter, and receives a reflection wave; a detection unit 12 that performs detection processing of detecting an abnormal state, based on a signal of the reflection wave; a decision unit 13 that decides, for an inspection target person from which the abnormal state is detected, whether to perform a secondary inspection at a place or perform a secondary inspection later; and a registration unit 16 that registers, in association with a result of the detection processing, identification information about the inspection target person decided that a secondary inspection is performed later.
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公开(公告)号：US20230360249A1
公开(公告)日：2023-11-09
申请号：US18143417
申请日：2023-05-04
申请人： Vidisco Ltd.
发明人： Alon Fleider , Ohad Milo
IPC分类号： G06T7/70 , G06T7/30 , G01N23/10 , G01N23/083
CPC分类号： G06T7/70 , G06T7/30 , G01N23/10 , G01N23/083 , G06T2207/10028 , G06T2207/10116 , G06T2207/30004
摘要： Systems and methods for three-dimensional (3D) localization of an object, including: a processor, a camera, in communication with the processor, and an X-Ray system, coupled to the camera such that a focal point of the camera is aligned with the source of the X-Ray system, where the X-Ray system is directed towards the object, and wherein the processor is configured to determine 3D localization of the object based on a combination of images received from the camera and from the X-Ray system.
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9.发明公开公开(公告)号：US20230288560A1
公开(公告)日：2023-09-14
申请号：US17692452
申请日：2022-03-11
申请人： NEC Corporation
发明人： Tatsuya Sumiya , Shingo Yamanouchi , Masayuki Ariyoshi , Shinichi Morimoto , Masanori Sekido , Kazumine Ogura
摘要： To shorten a waiting time for a belongings inspection, the present invention provides an inspection system 10 including an acquisition unit 11 that acquires material information including at least either one of a piece of personal unique information unique to each of inspection target persons, and a piece of environment information indicating a state value of an environment that changes at each inspection timing, and a determination unit 12 that determines a content of an inspection for the each inspection target person and/or at the each inspection timing, based on the material information.
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10.发明申请公开(公告)号：US20190212279A1
公开(公告)日：2019-07-11
申请号：US16229697
申请日：2018-12-21
申请人： VOTI INC.
发明人： EMMANUEL ST-AUBIN , PHILIPPE DESJEANS-GAUTHIER , OLA EL BAKRY , SIMON ARCHAMBAULT , WILLIAM AWAD
IPC分类号： G01N23/10 , G01N23/04 , G01N23/083
CPC分类号： G06T7/194 , G01N23/04 , G01N23/083 , G01N23/087 , G01N23/10 , G01N23/20 , G01N2223/206 , G01N2223/423 , G01N2223/601 , G01N2223/639 , G01V5/0041 , G01V5/005 , G01V5/0083 , G06T7/0004 , G06T7/60 , G06T7/70 , G06T11/005 , G06T2207/10116 , G06T2211/408 , G06T2211/424 , H04N5/3205
摘要： There is provided a method for assigning an attribute to x-ray attenuation including scanning in an x-ray scanning device first and second reference materials each having known atomic composition, dimensions and orientation in the scanning device. The device emits x-rays which pass through the first reference material with first reference material path lengths and the second reference material with second reference material path lengths. The x-rays are detected by detectors to provide a plurality of dual-energy attenuation images having dual-energy x-ray attenuation information. The dual-energy x-ray attenuation information in the dual-energy attenuation images is associated with the first and second reference material path lengths. Then, each of the first and second reference material path lengths are expressed collectively as a function of the associated attenuation information to define attenuation surfaces upon which may be imposed dual-energy attenuation values to determine corresponding first and second reference material equivalent path lengths.
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