公开(公告)号：US20220365857A1

公开(公告)日：2022-11-17

申请号：US17320025

申请日：2021-05-13

Applicant: NVIDIA Corporation

Inventor： Sailendra Chadalavada ,  Anitha Kalva ,  Abilash Nerallapally ,  Milind Sonawane ,  Shantanu Sarangi ,  Ashok Aravamudhan ,  Sridharan Ramakrishnan ,  Sam Edirisooriya ,  Hari Krishnan

IPC: G06F11/263 ,  G06F11/27 ,  G06F11/273 ,  G06F11/14

Abstract: During functional/normal operation of an integrated circuit including multiple independent processing elements (such as processors), a selected independent processing element is taken offline (e.g., by stopping functional operation of the independent processing element), and the functionality of the selected independent processing element is then tested while the remaining independent processing elements continue functional operation (e.g., standard application-specific operations). This enables the selected processing element to be robustly tested without stopping the regular operation of the integrated circuit.