公开(公告)号：US20240132083A1

公开(公告)日：2024-04-25

申请号：US18048952

申请日：2022-10-23

Applicant: NVIDIA Corporation

Inventor： Anitha Kalva ,  Jae Wu ,  Shantanu Sarangi ,  Sailendra Chadalavada ,  Milind Sonawane ,  Chen Fang ,  Abilash Nerallapally

IPC: B60W50/02

CPC classification number: B60W50/0205 ,  B60W2050/0044

Abstract: Systems and methods are disclosed that relate to testing processing elements of an integrated processing system. A first system test may be performed on a first processing element of an integrated processing system. The first system test may be based at least on accessing a test node associated with the first processing element. The first system test may be accessed using a first local test controller. A second system test may be performed on a second processing element of the integrated processing system. The second system test may be based at least on accessing a second test node associated with the second processing element. The second system test may be accessed using a second local test controller.

公开(公告)号：US12291219B2

公开(公告)日：2025-05-06

申请号：US18048952

申请日：2022-10-24

Applicant: NVIDIA Corporation

Inventor： Anitha Kalva ,  Jae Wu ,  Shantanu Sarangi ,  Sailendra Chadalavada ,  Milind Sonawane ,  Chen Fang ,  Abilash Nerallapally

IPC: B60W50/02 ,  B60W50/00

Abstract: Systems and methods are disclosed that relate to testing processing elements of an integrated processing system. A first system test may be performed on a first processing element of an integrated processing system. The first system test may be based at least on accessing a test node associated with the first processing element. The first system test may be accessed using a first local test controller. A second system test may be performed on a second processing element of the integrated processing system. The second system test may be based at least on accessing a second test node associated with the second processing element. The second system test may be accessed using a second local test controller.

公开(公告)号：US20240227824A9

公开(公告)日：2024-07-11

申请号：US18048952

申请日：2022-10-24

Applicant: NVIDIA Corporation

Inventor： Anitha Kalva ,  Jae Wu ,  Shantanu Sarangi ,  Sailendra Chadalavada ,  Milind Sonawane ,  Chen Fang ,  Abilash Nerallapally

IPC: B60W50/02

CPC classification number: B60W50/0205 ,  B60W2050/0044

Abstract: Systems and methods are disclosed that relate to testing processing elements of an integrated processing system. A first system test may be performed on a first processing element of an integrated processing system. The first system test may be based at least on accessing a test node associated with the first processing element. The first system test may be accessed using a first local test controller. A second system test may be performed on a second processing element of the integrated processing system. The second system test may be based at least on accessing a second test node associated with the second processing element. The second system test may be accessed using a second local test controller.