Apparatus for prediction of failure of a functional circuit

    公开(公告)号:US11378617B2

    公开(公告)日:2022-07-05

    申请号:US16176372

    申请日:2018-10-31

    Applicant: NXP B.V.

    Abstract: An apparatus comprising: a functional circuit comprising one or more circuit components configured to perform a function based on one or more first input signals; at least one failure-prediction circuit for use in predicting failure of the functional circuit, the failure-prediction circuit comprising a replica of the functional circuit in terms of constituent circuit components; wherein the failure-prediction circuit is configured to be more susceptible to failure than said functional circuit, wherein the apparatus is configured to provide a prediction of failure of the functional circuit based on a determination of failure of the failure-prediction circuit.

    APPARATUS FOR PREDICTION OF FAILURE OF A FUNCTIONAL CIRCUIT

    公开(公告)号:US20190187204A1

    公开(公告)日:2019-06-20

    申请号:US16176372

    申请日:2018-10-31

    Applicant: NXP B.V

    CPC classification number: G01R31/2884 G01R31/2856 G01R31/3004 G01R31/3016

    Abstract: An apparatus comprising: a functional circuit comprising one or more circuit components configured to perform a function based on one or more first input signals; at least one failure-prediction circuit for use in predicting failure of the functional circuit, the failure-prediction circuit comprising a replica of the functional circuit in terms of constituent circuit components; wherein the failure-prediction circuit is configured to be more susceptible to failure than said functional circuit, wherein the apparatus is configured to provide a prediction of failure of the functional circuit based on a determination of failure of the failure-prediction circuit.

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