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1.发明申请公开(公告)号：US20190195694A1
公开(公告)日：2019-06-27
申请号：US16122890
申请日：2018-09-06
Inventor： Shiang-Feng Tang , Shun-Lung Yen , Kun-Chi Lo , Wen-Jen Lin
Abstract: A temperature measurement correction method for a temperature detection device is provided. The temperature detection device includes a case and a focal plane array module disposed on an inner of the case. The temperature measurement correction method includes measuring an ambient temperature, a temperature of the case and a temperature of the focal plane array module, determining a plurality of radiometric regression coefficients according to the ambient temperature, the temperature of the case and the temperature of the focal plane array module, utilizing the temperature detection device to sense infrared energy radiated from an object to generate an electrical signal, and calculating an actual temperature value of the object according to the plurality of radiometric regression coefficients and the electrical signal.
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Patent Agency Ranking
公开(公告)号：US10591646B2
公开(公告)日：2020-03-17
申请号：US15847925
申请日：2017-12-20
Inventor： Shih-Hao Chan , Shiang-Feng Tang , Shao-Ze Tseng , Kun-Chi Lo , Sheng-Hui Chen , Wen-Jen Lin
Abstract: An infrared anti-reflection film structure, an anti-reflection film layer, including a material of zinc oxide, comprising a top anti-reflection film layer and a bottom anti-reflection film layer, wherein the top anti-reflection film layer is disposed on a top side of the base material and the bottom anti-reflection film layer is disposed on a bottom side of the base material; and the base material is manufactured by a floating zone crystal growth method. Through the silicon base material manufactured by the high purity crystal growth method, the silicon base material replaces germanium as the high refractive index material and base material. And coating the anti-reflection film layer on the surface of the silicon base material, so as to apply the infrared anti-reflection film structure to the thermal imaging technology.
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公开(公告)号：US11885690B2
公开(公告)日：2024-01-30
申请号：US17124523
申请日：2020-12-17
Inventor： Shiang-Feng Tang , Shun-Lung Yen , Kun-Chi Lo , Wen-Jen Lin
CPC classification number: G01J5/068 , G01J5/80 , G01J2005/0077
Abstract: A high-precision non-contact temperature measurement device includes: a thermal insulation box made of a thermal insulation material and having therein a receiving space; a dynamic constant-temperature feedback control module for controlling temperature of the receiving space; and a non-temperature-sensing thermal imager disposed in the receiving space. The device achieves system thermal insulation within a non-contact temperature measurement gauge, maintains the overall closed system dynamically at constant temperature, compensates for effects of internal chip self-heating effect and visual field background temperature variation, and finally calculates average temperature of surfaces of a target precisely with an imaging, non-contact temperature measurement gauge and a temperature calibration algorithm widely used in thermal-imaging non-contact temperature measurement.
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4.发明授权公开(公告)号：US11254043B2
公开(公告)日：2022-02-22
申请号：US16231592
申请日：2018-12-23
Inventor： Shiang-Feng Tang , Shun-Lung Yen , Kun-Chi Lo , Wen-Jen Lin
IPC: G01J5/00 , B29C51/46 , G01K13/00 , B29C51/30 , B29C51/18 , G01J5/56 , G01J5/06 , G01J5/24 , G01J5/52 , G01N21/27
Abstract: The present invention aims at providing a high-accuracy contactless measurement method for measuring the temperature of a metal thermoforming mold, which is capable of timely monitoring the metal temperature in multiple areas and also has threshold warning functionalities for delivering real-time notifications, in order to save the labor costs for long-term monitoring.
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公开(公告)号：US10969280B2
公开(公告)日：2021-04-06
申请号：US16122890
申请日：2018-09-06
Inventor： Shiang-Feng Tang , Shun-Lung Yen , Kun-Chi Lo , Wen-Jen Lin
Abstract: A temperature measurement correction method for a temperature detection device is provided. The temperature detection device includes a case and a focal plane array module disposed on an inner of the case. The temperature measurement correction method includes measuring an ambient temperature, a temperature of the case and a temperature of the focal plane array module, determining a plurality of radiometric regression coefficients according to the ambient temperature, the temperature of the case and the temperature of the focal plane array module, utilizing the temperature detection device to sense infrared energy radiated from an object to generate an electrical signal, and calculating an actual temperature value of the object according to the plurality of radiometric regression coefficients and the electrical signal.
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公开(公告)号：US20190187334A1
公开(公告)日：2019-06-20
申请号：US15847925
申请日：2017-12-20
Inventor： Shih-Hao Chan , Shiang-Feng Tang , Shao-Ze Tseng , Kun-Chi Lo , Sheng-Hui Chen , Wen-Jen Lin
IPC: G02B1/115
Abstract: An infrared anti-reflection film structure, an anti-reflection film layer, including a material of zinc oxide, comprising a top anti-reflection film layer and a bottom anti-reflection film layer, wherein the top anti-reflection film layer is disposed on a top side of the base material and the bottom anti-reflection film layer is disposed on a bottom side of the base material; and the base material is manufactured by a floating zone crystal growth method. Through the silicon base material manufactured by the high purity crystal growth method, the silicon base material replaces germanium as the high refractive index material and base material. And coating the anti-reflection film layer on the surface of the silicon base material, so as to apply the infrared anti-reflection film structure to the thermal imaging technology.
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