Abstract:
A microscope system includes: a main body portion having an optical system for forming an image from at least observation light from a specimen; an objective lens unit having an objective lens for taking in the observation light and having a base portion with an approximately belt shape for holding the objective lens on one end; and a unit attachment portion that is held by the main body portion and is configured to detachably attach the base portion at a position where at least an optical axis of the objective lens coincides with an optical path of the observation light.
Abstract:
A microscope system includes a microscope apparatus and a computing device. The microscope apparatus obtains image data of a surface to be observed of a sample in each of the plurality of states having different setting values of a correction collar. The computing device calculates an evaluation value of image data on the basis of each of the plural pieces of image data. A process in which the microscope apparatus obtains the plural pieces of image data is repeated in such a way that a distribution range and an average interval of the setting values are narrowed in each repetition, and that the setting value that corresponds to a maximum evaluation value is included within the distribution range. The computing device calculates the setting value for correcting a spherical aberration on the basis of the evaluation values and the setting values that correspond to the evaluation values.
Abstract:
A microscope system includes: an objective; a correction apparatus which corrects a spherical aberration; a controller which obtains a plurality of combinations of a relative position of the objective to a sample and an optimum value, which is a set value of the correction apparatus in a state in which a spherical aberration caused in accordance with the relative position has been corrected, calculates a function expressing the relationship between the relative position and the optimum value on the basis of the obtained plurality of combinations by interpolation, and calculates the optimum value according to an observation target surface of the sample, on the basis of the function and the relative position which is determined from the observation target surface; and a correction apparatus driving apparatus which drives the correction apparatus in accordance with the optimum value, which is calculated by the controller.
Abstract:
An experiment information management system includes a first experiment apparatus configured to generate first experiment result information and first log data; a recording apparatus configured to record the first experiment result information and the first log data generated in the first experiment apparatus; and an experiment note generation apparatus configured to generate an experiment note being a record of an experiment, according to at least the first experiment result information and the first log data recorded in the recording apparats.