公开(公告)号：US20230390863A1

公开(公告)日：2023-12-07

申请号：US18234575

申请日：2023-08-16

Applicant: Panasonic Intellectual Property Management Co., Ltd.

Inventor： Kazuki FUJIWARA ,  Koji FUNAMI ,  Izuru NAKAI

IPC: B23K26/03 ,  B23K26/244 ,  G06N20/00

CPC classification number: B23K26/032 ,  B23K26/244 ,  G06N20/00

Abstract: A determination method for determining a processing state includes detecting, using an optical sensor, at least one of heat radiation light, visible light, and reflected light generated at a welded portion formed at a surface of a workpiece by emission of a laser beam on the workpiece, obtaining a signal indicating a change in at least one of heat radiation light, visible light, and reflected light in a time section corresponding to a welding time of each workpiece, calculating a feature quantity including a gradient of a straight line approximating a signal waveform of the signal in a predetermined section in the time section, determining, as the processing state, a shift including farness and closeness of a focal position of the laser beam in an emission direction of the laser beam by inputting the calculated feature quantity to a determination model that determines the processing state.

公开(公告)号：US20230384282A1

公开(公告)日：2023-11-30

申请号：US18233954

申请日：2023-08-15

Applicant: Panasonic Intellectual Property Management Co., Ltd.

Inventor： Kazuki FUJIWARA ,  Koji FUNAMI ,  Izuru NAKAI

IPC: G01N33/207 ,  G01N21/95

CPC classification number: G01N33/207 ,  G01N21/95

Abstract: A determination method for determining a processing state includes detecting, using an optical sensor, at least one of heat radiation light, visible light, and reflected light generated at a welded portion formed at a surface of a workpiece by emission of a laser beam on the workpiece, obtaining, from the optical sensor, a signal indicating a change in one of heat radiation, visible light, and reflected light in a time section corresponding to a welding time of each workpiece, determining, as the processing state, the position and number of molten shape abnormality in a welded region having a molten length and a molten width by inputting a feature quantity to a determination model that determines the processing state, the feature quantity including signal intensity of the signal, the molten shape abnormality occurring when a foreign substance exists at an overlapping surface of the workpiece, and outputting a determination result.

公开(公告)号：US20230390871A1

公开(公告)日：2023-12-07

申请号：US18236167

申请日：2023-08-21

Applicant: Panasonic Intellectual Property Management Co., Ltd.

Inventor： Izuru NAKAI ,  Kazuki FUJIWARA ,  Koji FUNAMI

IPC: B23K31/00 ,  B23K26/00

CPC classification number: B23K31/00 ,  B23K26/00

Abstract: An estimation model generation device is a device that generates an estimation model for estimating a processing state of laser processing. First thermal radiation, first visible light, first reflected light, and first laser light are observed from a workpiece during laser processing by a first device, and the device includes an information acquiring section that acquires first waveform data including a first waveform and a second waveform for at least two of the first thermal radiation, the first visible light, the first reflected light, and the first laser light, an estimation model generating section that performs machine learning by using teacher data having the first waveform data as an explanatory variable and the processing state as a target variable in association with each other to generate a first estimation model for estimating the processing state by the first device, and a storage that stores the first estimation model.