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公开(公告)号:US09876977B2
公开(公告)日:2018-01-23
申请号:US15196042
申请日:2016-06-29
Inventor: Norihiko Sumitani , Hidenari Kanehara , Takayuki Nishitani
CPC classification number: H04N5/378 , H04N5/374 , H04N5/3742
Abstract: A solid-state imaging device includes a plurality of pixels arrayed in a matrix, a plurality of first latch circuits, a first read bit line, a plurality of first driver circuits, a first amplifier, a second latch circuit, a second driver circuit, and a column scanning circuit. Each of the plurality of first latch circuits holds first pixel data which is obtained from a pixel located on the corresponding unit column. Each of the plurality of first driver circuits outputs the first pixel data, which is held in a corresponding one of the first latch circuits, to the first read bit line. The first amplifier amplifies a voltage of the first read bit line to generate first data. The second latch circuit holds the first data. The column scanning circuit sequentially outputs a plurality of the first pixel data by sequentially selecting the plurality of first driver circuits and selecting the second driver circuit. The second driver circuit outputs the first data to a read bit line different from the first read bit line.
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公开(公告)号:US10931908B2
公开(公告)日:2021-02-23
申请号:US16491123
申请日:2018-02-27
Inventor: Yutaka Abe , Kazuko Nishimura , Hiroshi Fujinaka , Norihiko Sumitani , Yosuke Higashi
Abstract: A solid-state imaging device includes a first A/D converter circuit and a second A/D converter circuit per column. The first A/D converter circuit performs a first A/D conversion that (i) refines, using a first comparator, a range including a potential of an analog signal through a binary search, and (ii) generates, based on a result of the binary search, a first digital signal being a high-order portion of the digital signal. The second A/D converter circuit performs a second A/D conversion that generates a second digital signal being a low-order portion that is a remainder of the digital signal by measuring a time required for an output of the second comparator to be inverted, the second comparator comparing a quantitative relationship between the analog signal refined and a ramp signal.
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