Abstract:
A system for testing a device includes a processor that operates to execute instructions, where the instructions are used to test a device. The processor also operates to generate test signals associated with the test instructions. An interface apparatus is coupled to the processor and operates to communicate the test signals to the device. The interface apparatus includes connectors, where each connector operates to communicate at least one of the test signals.
Abstract:
The present invention is directed to a diagnostic compiler for use with a pipeline analog-to-digital converter (ADC) having code sequences corresponding to stages thereof. In one embodiment, the diagnostic compiler includes a transition locator configured to determine transition locations for the code sequences. The diagnostic compiler also includes a characteristics indicator coupled to the transition locator and configured to provide at least one characteristic of the ADC based on the transition locations.