公开(公告)号：US20220247934A1

公开(公告)日：2022-08-04

申请号：US17585222

申请日：2022-01-26

申请人： Protochips, Inc.

发明人： Franklin Stampley Walden, II ,  John Damiano, JR. ,  David P. Nackashi ,  Daniel Stephen Gardiner ,  Mark Uebel ,  Alan Philip Franks ,  Benjamin Jacobs ,  Joshua Brian Friend ,  Katherine Elizabeth Marusak ,  Nelson L. Marthe, JR. ,  Benjamin Bradshaw Larson

IPC分类号： H04N5/232 ,  G06T7/215 ,  G06T7/33

摘要： Methods and systems for calibrating a transmission electron microscope are disclosed. A fiducial mark on the sample holder is used to identify known reference points so that a current collection area and a through-hole on the sample holder can be located. A plurality of beam current and beam area measurements are taken, and calibration tables are extrapolated from the measurements for a full range of microscope parameters. The calibration tables are then used to determine electron dose of a sample during an experiment at a given configuration.

公开(公告)号：US20240267628A1

公开(公告)日：2024-08-08

申请号：US18437770

申请日：2024-02-09

申请人： Protochips, Inc.

发明人： Franklin Stampley Walden, II ,  John Damiano, JR. ,  David P. Nackashi ,  Daniel Stephen Gardiner ,  Mark Uebel ,  Alan Philip Franks ,  Benjamin Jacobs ,  Joshua Brian Friend ,  Katherine Elizabeth Marusak ,  Nelson L. Marthe, JR. ,  Benjamin Bradshaw Larson

IPC分类号： H04N23/695 ,  G06T7/215 ,  G06T7/33 ,  H01J37/20

CPC分类号： H04N23/695 ,  G06T7/215 ,  G06T7/337 ,  H01J37/20 ,  G06T2207/10061 ,  H01J2237/2594

摘要： Methods and systems for calibrating a transmission electron microscope are disclosed. A fiducial mark on the sample holder is used to identify known reference points so that a current collection area and a through-hole on the sample holder can be located. A plurality of beam current and beam area measurements are taken, and calibration tables are extrapolated from the measurements for a full range of microscope parameters. The calibration tables are then used to determine electron dose of a sample during an experiment at a given configuration.

公开(公告)号：US20220377244A1

公开(公告)日：2022-11-24

申请号：US17817248

申请日：2022-08-03

申请人： Protochips, Inc.

发明人： Franklin Stampley Walden, II ,  John Damiano, JR. ,  David P. Nackashi ,  Daniel Stephen Gardiner ,  Mark Uebel ,  Alan Philip Franks ,  Benjamin Jacobs ,  Joshua Brian Friend ,  Katherine Elizabeth Marusak ,  Nelson L. Marthe, JR. ,  Benjamin Bradshaw Larson

IPC分类号： H04N5/232 ,  G06T7/33 ,  G06T7/215

摘要： Methods and systems for calibrating a transmission electron microscope are disclosed. A fiducial mark on the sample holder is used to identify known reference points so that a current collection area and a through-hole on the sample holder can be located. A plurality of beam current and beam area measurements are taken, and calibration tables are extrapolated from the measurements for a full range of microscope parameters. The calibration tables are then used to determine electron dose of a sample during an experiment at a given configuration.