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公开(公告)号：US11514586B1
公开(公告)日：2022-11-29
申请号：US17817248
申请日：2022-08-03
申请人： Protochips, Inc.
发明人： Franklin Stampley Walden, II , John Damiano, Jr. , David P. Nackashi , Daniel Stephen Gardiner , Mark Uebel , Alan Philip Franks , Benjamin Jacobs , Joshua Brian Friend , Katherine Elizabeth Marusak , Nelson L Marthe, Jr. , Benjamin Bradshaw Larson
摘要： Methods and systems for calibrating a transmission electron microscope are disclosed. A fiducial mark on the sample holder is used to identify known reference points so that a current collection area and a through-hole on the sample holder can be located. A plurality of beam current and beam area measurements are taken, and calibration tables are extrapolated from the measurements for a full range of microscope parameters. The calibration tables are then used to determine electron dose of a sample during an experiment at a given configuration.
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公开(公告)号：US11902665B2
公开(公告)日：2024-02-13
申请号：US17585222
申请日：2022-01-26
申请人： Protochips, Inc.
发明人： Franklin Stampley Walden, II , John Damiano, Jr. , David P. Nackashi , Daniel Stephen Gardiner , Mark Uebel , Alan Philip Franks , Benjamin Jacobs , Joshua Brian Friend , Katherine Elizabeth Marusak , Nelson L Marthe, Jr. , Benjamin Bradshaw Larson
IPC分类号： G01B11/16 , H04N23/695 , G06T7/33 , G06T7/215 , H01J37/20
CPC分类号： H04N23/695 , G06T7/215 , G06T7/337 , H01J37/20 , G06T2207/10061 , H01J2237/2594
摘要： Methods and systems for calibrating a transmission electron microscope are disclosed. A fiducial mark on the sample holder is used to identify known reference points so that a current collection area and a through-hole on the sample holder can be located. A plurality of beam current and beam area measurements are taken, and calibration tables are extrapolated from the measurements for a full range of microscope parameters. The calibration tables are then used to determine electron dose of a sample during an experiment at a given configuration.
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公开(公告)号：US20220247934A1
公开(公告)日：2022-08-04
申请号：US17585222
申请日：2022-01-26
申请人： Protochips, Inc.
发明人： Franklin Stampley Walden, II , John Damiano, JR. , David P. Nackashi , Daniel Stephen Gardiner , Mark Uebel , Alan Philip Franks , Benjamin Jacobs , Joshua Brian Friend , Katherine Elizabeth Marusak , Nelson L. Marthe, JR. , Benjamin Bradshaw Larson
摘要： Methods and systems for calibrating a transmission electron microscope are disclosed. A fiducial mark on the sample holder is used to identify known reference points so that a current collection area and a through-hole on the sample holder can be located. A plurality of beam current and beam area measurements are taken, and calibration tables are extrapolated from the measurements for a full range of microscope parameters. The calibration tables are then used to determine electron dose of a sample during an experiment at a given configuration.
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公开(公告)号：US20240267628A1
公开(公告)日：2024-08-08
申请号：US18437770
申请日：2024-02-09
申请人： Protochips, Inc.
发明人： Franklin Stampley Walden, II , John Damiano, JR. , David P. Nackashi , Daniel Stephen Gardiner , Mark Uebel , Alan Philip Franks , Benjamin Jacobs , Joshua Brian Friend , Katherine Elizabeth Marusak , Nelson L. Marthe, JR. , Benjamin Bradshaw Larson
IPC分类号： H04N23/695 , G06T7/215 , G06T7/33 , H01J37/20
CPC分类号： H04N23/695 , G06T7/215 , G06T7/337 , H01J37/20 , G06T2207/10061 , H01J2237/2594
摘要： Methods and systems for calibrating a transmission electron microscope are disclosed. A fiducial mark on the sample holder is used to identify known reference points so that a current collection area and a through-hole on the sample holder can be located. A plurality of beam current and beam area measurements are taken, and calibration tables are extrapolated from the measurements for a full range of microscope parameters. The calibration tables are then used to determine electron dose of a sample during an experiment at a given configuration.
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公开(公告)号：US20220377244A1
公开(公告)日：2022-11-24
申请号：US17817248
申请日：2022-08-03
申请人： Protochips, Inc.
发明人： Franklin Stampley Walden, II , John Damiano, JR. , David P. Nackashi , Daniel Stephen Gardiner , Mark Uebel , Alan Philip Franks , Benjamin Jacobs , Joshua Brian Friend , Katherine Elizabeth Marusak , Nelson L. Marthe, JR. , Benjamin Bradshaw Larson
摘要： Methods and systems for calibrating a transmission electron microscope are disclosed. A fiducial mark on the sample holder is used to identify known reference points so that a current collection area and a through-hole on the sample holder can be located. A plurality of beam current and beam area measurements are taken, and calibration tables are extrapolated from the measurements for a full range of microscope parameters. The calibration tables are then used to determine electron dose of a sample during an experiment at a given configuration.
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