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公开(公告)号：US20250053594A1
公开(公告)日：2025-02-13
申请号：US18926390
申请日：2024-10-25
Applicant: Protochips, Inc.
Inventor： Franklin Stampley Walden, II , John Damiano, Jr. , David P. Nackashi , Daniel Stephen Gardiner , Mark Uebel , Alan Philip Franks , Joshua Friend , Katherine Elizabeth Marusak
IPC: G06F16/535 , G06F16/51 , G06F16/538 , G06F16/58 , G06T1/00 , G06T7/20 , G06T11/60
Abstract: Disclosed herein are methods and systems of metadata management for reviewing data from microscopy experimental sessions. Image data from an experimental session is stored in an archive at one or more filepath locations, either locally or on a network. Metadata associated with the image data is stored in a database with a reference to the filepath where the raw image is stored, such that the metadata is associated in the database with the image data. A user can perform post-experimental filtering, sorting, and searching of the underlying image data using the metadata, which allows the image data to be analyzed without duplication of the image data and without manual review of each individual image. The filtered data is presented in an interactive timeline format.
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公开(公告)号：US11514586B1
公开(公告)日：2022-11-29
申请号：US17817248
申请日：2022-08-03
Applicant: Protochips, Inc.
Inventor： Franklin Stampley Walden, II , John Damiano, Jr. , David P. Nackashi , Daniel Stephen Gardiner , Mark Uebel , Alan Philip Franks , Benjamin Jacobs , Joshua Brian Friend , Katherine Elizabeth Marusak , Nelson L Marthe, Jr. , Benjamin Bradshaw Larson
Abstract: Methods and systems for calibrating a transmission electron microscope are disclosed. A fiducial mark on the sample holder is used to identify known reference points so that a current collection area and a through-hole on the sample holder can be located. A plurality of beam current and beam area measurements are taken, and calibration tables are extrapolated from the measurements for a full range of microscope parameters. The calibration tables are then used to determine electron dose of a sample during an experiment at a given configuration.
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公开(公告)号：US10986279B1
公开(公告)日：2021-04-20
申请号：US16951297
申请日：2020-11-18
Applicant: Protochips, Inc.
Inventor： Franklin Stampley Walden, II , John Damiano, Jr. , David P. Nackashi , Daniel Stephen Gardiner , Mark Uebel , Alan Philip Franks , Benjamin Jacobs
Abstract: Control system configured for sample tracking in an electron microscope environment registers a movement associated with a region of interest located within an active area of a sample under observation with an electron microscope. The registered movement includes at least one directional constituent. The region of interest is positioned within a field of view of the electron microscope. The control system directs an adjustment of the electron microscope control component to one or more of dynamically center and dynamically focus the view through the electron microscope of the region of interest. The adjustment comprises one or more of a magnitude element and a direction element.
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4.发明授权公开(公告)号：US10256563B2
公开(公告)日：2019-04-09
申请号：US15830127
申请日：2017-12-04
Applicant: Protochips, Inc.
Inventor： John Damiano, Jr. , David P. Nackashi , Daniel Stephen Gardiner , Franklin Stampley Walden, II , William Bradford Carpenter
Abstract: An electrical connector for use in electron microscopy sample holders. The electrical connector provides electrical contacts to the sample support devices which are positioned in the sample holders for electrical, temperature and/or electrochemical control.
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公开(公告)号：US20180203423A1
公开(公告)日：2018-07-19
申请号：US15919575
申请日：2018-03-13
Applicant: PROTOCHIPS, INC.
Inventor： Daniel S. Gardiner , John Damiano, JR. , David P. Nackashi , William Bradford Carpenter , James Rivenbark , Mark Uebel , Michael Zapata, III , Rebecca Thomas , Franklin Stampley Walden, II
CPC classification number: G05B9/02 , G01M3/3272 , G05D7/0635 , H01J37/18 , H01J37/20 , H01J2237/006 , H01J2237/182 , H01J2237/2002 , H01J2237/2007 , H01J2237/2802
Abstract: System and method for safely controlling the containment of gas within a manifold system and the delivery of gas to a sample holder for an electron microscope for imaging and analysis.
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Patent Agency Ranking
6.发明申请公开(公告)号：US20180068827A1
公开(公告)日：2018-03-08
申请号：US15811911
申请日：2017-11-14
Applicant: Protochips, Inc.
Inventor： Daniel Stephen Gardiner , William Bradford Carpenter , John Damiano, JR. , Franklin Stampley Walden, II , David P. Nackashi
CPC classification number: H01J37/261 , G01K11/32 , G01L11/025 , G01L19/04 , H01J37/16 , H01J37/20 , H01J2237/2001 , H01J2237/2002 , H01J2237/2003 , H01J2237/206 , H01J2237/2801
Abstract: An apparatus and a method for measuring and monitoring the properties of a fluid, for example, pressure, temperature, and chemical properties, within a sample holder for an electron microscope. The apparatus includes at least one fiber optic sensor used for measuring temperature and/or pressure and/or pH positioned in proximity of the sample.
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7.发明授权Method for forming an electrical connection to an sample support in an electron microscope holder 有权在电子显微镜支架中与样品支架形成电连接的方法公开(公告)号：US09437393B2
公开(公告)日：2016-09-06
申请号：US14079223
申请日：2013-11-13
Applicant: PROTOCHIPS, INC.
Inventor： John Damiano, Jr. , David P. Nackashi , Daniel Stephen Gardiner , Franklin Stampley Walden, II , William Bradford Carpenter
CPC classification number: H01R13/24 , H01J37/20 , H01J37/26 , H01J2237/2003 , H01J2237/2007 , H01J2237/2008 , H01J2237/206 , H01R12/721 , H01R12/79
Abstract: An electrical connector for use in electron microscopy sample holders. The electrical connector provides electrical contacts to the sample support devices which are positioned in the sample holders for electrical, temperature and/or electrochemical control.
Abstract translation: 用于电子显微镜样品架的电连接器。 电连接器为位于样品保持器中的样品支撑装置提供电接触，用于电气，温度和/或电化学控制。
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8.发明授权公开(公告)号：US11869744B2
公开(公告)日：2024-01-09
申请号：US17570481
申请日：2022-01-07
Applicant: Protochips, Inc.
Inventor： Franklin Stampley Walden, II , John Damiano, Jr. , Daniel Stephen Gardiner , William Bradford Carpenter
CPC classification number: H01J37/20 , G01F1/34 , G05D7/0635 , H01J2237/006 , H01J2237/26
Abstract: A fluid metering system for gas independent pressure and flow control through an electron microscope sample holder includes: a pressure control system that supplies gas; an inlet line providing gas from the pressure control system to the sample holder; an outlet line receiving gas from the sample holder; and a variable leak valve that controls gas flow in the outlet line. The gas flows from an upstream tank of the pressure control system through the sample holder and variable leak valve to a downstream tank of the pressure control system due to the pressure difference of the two tanks as the variable leak valve meters flow in the outlet line. Flow rates are established by monitoring pressure changes at source and collection tanks of known volumes with gas independent pressure gauges. A method of directing the gas flow to a residual gas analyzer (RGA) is also presented.
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公开(公告)号：US11477388B2
公开(公告)日：2022-10-18
申请号：US17545651
申请日：2021-12-08
Applicant: Protochips, Inc.
Inventor： Franklin Stampley Walden, II , John Damiano, Jr. , David P. Nackashi , Daniel Stephen Gardiner , Mark Uebel , Alan Philip Franks , Benjamin Jacobs
Abstract: Control system configured for sample tracking in an electron microscope environment registers a movement associated with a region of interest located within an active area of a sample under observation with an electron microscope. The registered movement includes at least one directional constituent. The region of interest is positioned within a field of view of the electron microscope. The control system directs an adjustment of the electron microscope control component to one or more of dynamically center and dynamically focus the view through the electron microscope of the region of interest. The adjustment comprises one or more of a magnitude element and a direction element.
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公开(公告)号：US20210112203A1
公开(公告)日：2021-04-15
申请号：US16951297
申请日：2020-11-18
Applicant: Protochips, Inc.
Inventor： Franklin Stampley Walden, II , John Damiano, JR. , David P. Nackashi , Daniel Stephen Gardiner , Mark Uebel , Alan Philip Franks , Benjamin Jacobs
Abstract: Control system configured for sample tracking in an electron microscope environment registers a movement associated with a region of interest located within an active area of a sample under observation with an electron microscope. The registered movement includes at least one directional constituent. The region of interest is positioned within a field of view of the electron microscope. The control system directs an adjustment of the electron microscope control component to one or more of dynamically center and dynamically focus the view through the electron microscope of the region of interest. The adjustment comprises one or more of a magnitude element and a direction element.
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