LATCH ARRAY WITH MASK-WRITE FUNCTIONALITY
    1.
    发明公开

    公开(公告)号:US20230223054A1

    公开(公告)日:2023-07-13

    申请号:US17574431

    申请日:2022-01-12

    CPC classification number: G11C7/1009 G11C7/1087

    Abstract: An aspect of the disclosure relates to a latch array, including: a first set of master latches including a first set of clock inputs configured to receive a master clock, a first set of data inputs configured to receive a first set of data, and a first set of data outputs coupled to a set of bitlines, respectively; a second set of master latches including a second set of clock inputs configured to receive the master clock, a first set of write-bit inputs configured to receive a set of write-bit signals, and a set of write-bit outputs coupled to a set of write-bit lines, respectively; and an array of slave latches, wherein the slave latches in columns of the array include a second set of data inputs coupled to the set of bitlines, and a second set of write-bit inputs coupled to the set of write-bit lines, respectively.

    TRUE RANDOM NUMBER GENERATOR BASED ON PERIOD JITTER

    公开(公告)号:US20210405973A1

    公开(公告)日:2021-12-30

    申请号:US16913631

    申请日:2020-06-26

    Abstract: A true random number generator (TRNG) for generating a sequence of random numbers of bits is disclosed. The TRNG includes a TRNG cell configured to generate a sequence of bits logically alternating with a mean frequency and with substantially random period jitter; a period monitor configured to generate a first sequence of random bits based on a set of periods of the sequence of logically alternating bits; and a sampling circuit configured to sample the first sequence of random bits in response to a sampling clock to generate a second sequence of random bits.

    BACK END OF LINE (BEOL) PROCESS CORNER SENSING

    公开(公告)号:US20220270938A1

    公开(公告)日:2022-08-25

    申请号:US17180652

    申请日:2021-02-19

    Abstract: Aspects of the disclosure are directed to sensing integrated circuit (IC) Back End Of Line (BEOL) process corners. In one aspect, an apparatus for sensing IC BEOL process corners includes a ring oscillator including a plurality of ring oscillator stages configured to generate an output waveform with a frequency state; and a shield net circuit including a plurality of shield net stages corresponding to the plurality of ring oscillator stages, the shield net circuit having a toggle input. And, a method includes generating an output waveform with a frequency state using a ring oscillator that includes a plurality of ring oscillator stages; modifying a plurality of ring oscillator stage time delays through a coupling between a plurality of shield net stages and the plurality of ring oscillator stages; and selecting the frequency state using a toggle input of a shield net circuit which includes the plurality of shield net stages.

    TRUE SINGLE PHASE CLOCK (TSPC) BASED LATCH ARRAY

    公开(公告)号:US20220247391A1

    公开(公告)日:2022-08-04

    申请号:US17162647

    申请日:2021-01-29

    Abstract: A latch array including a row of master latches coupled to columns of slave latches. Each master latch includes an OR-AND-Inverter (OAI) gate cross-coupled with a NAND gate to receive and latch an input data, and each slave latch includes an AND-OR-Inverter (AOI) gate cross-coupled with a NOR gate to receive and latch the data from the master latch, and an inverter including an input coupled to the AOI gate and an output to produce an output data based on the input data. Alternatively, each master latch includes an AND-OR-Inverter (AOI) gate cross-coupled with a NOR gate to receive and latch an input data, and each slave latch includes an OR-AND-Inverter (OAI) gate cross-coupled with a NAND gate to receive and latch the data from the master latch, and an inverter including an input coupled to the OAI gate and an output to produce an output data.

    APPARATUS FOR DESIGN FOR TESTABILITY OF MULTIPORT REGISTER ARRAYS

    公开(公告)号:US20180019734A1

    公开(公告)日:2018-01-18

    申请号:US15207800

    申请日:2016-07-12

    Abstract: In an aspect of the disclosure, a method and an apparatus are provided. The apparatus is a register array including first and second flip-flop latch arrays. The first flip-flop latch array includes a first set of master latches, a first set of slave latches coupled to the first set of master latches, and a first address port. The second flip-flop latch array includes a second set of master latches, a second set of slave latches coupled to the second set of master latches, and a second address port. The register array includes an address counter, coupled to the first flip-flop latch array and the second flip-flop latch array. The address counter is shared by the first flip-flop latch array and the second flip-flop latch array and configured to address, in parallel in a test mode, the first flip-flop latch array through the first address port and the second flip-flop latch array through the second address port.

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