Low pin count test controller
    2.
    发明授权

    公开(公告)号:US10656203B1

    公开(公告)日:2020-05-19

    申请号:US16278420

    申请日:2019-02-18

    Abstract: Certain aspects of the present disclosure provide an apparatus for processor core testing. The apparatus generally includes a high-speed input-output (HSIO) interface, a general purpose input-output (GPIO) interface, a multiplexer having a first input coupled to the GPIO interface, a test controller coupled between the HSIO interface and a second input of the multiplexer, and one or more processor cores coupled to the output of the multiplexer.

    Time interleaved scan system
    3.
    发明授权

    公开(公告)号:US10996267B2

    公开(公告)日:2021-05-04

    申请号:US16255214

    申请日:2019-01-23

    Abstract: Certain aspects of the present disclosure provide a circuit for testing processor cores. For example, certain aspects provide a circuit having a deserializer having at least one input coupled to at least one input node of the circuit and having a first plurality of outputs, a plurality of processor cores having inputs coupled to the first plurality of outputs of the deserializer, and a serializer having inputs coupled to a second plurality of outputs of the plurality of processor cores.

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